IT8467301A1 - Sistema di controllo per l'inserimento forzato di ioni. - Google Patents

Sistema di controllo per l'inserimento forzato di ioni.

Info

Publication number
IT8467301A1
IT8467301A1 IT1984A67301A IT6730184A IT8467301A1 IT 8467301 A1 IT8467301 A1 IT 8467301A1 IT 1984A67301 A IT1984A67301 A IT 1984A67301A IT 6730184 A IT6730184 A IT 6730184A IT 8467301 A1 IT8467301 A1 IT 8467301A1
Authority
IT
Italy
Prior art keywords
ions
control system
forced insertion
forced
control
Prior art date
Application number
IT1984A67301A
Other languages
English (en)
Other versions
IT1180011B (it
IT8467301A0 (it
Original Assignee
Veeco/Ai Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Veeco/Ai Inc filed Critical Veeco/Ai Inc
Publication of IT8467301A0 publication Critical patent/IT8467301A0/it
Publication of IT8467301A1 publication Critical patent/IT8467301A1/it
Application granted granted Critical
Publication of IT1180011B publication Critical patent/IT1180011B/it

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30—Electron or ion beam tubes for processing objects
    • H01J2237/317—Processing objects on a microscale
    • H01J2237/31701—Ion implantation
    • H01J2237/31703—Dosimetry

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Saccharide Compounds (AREA)
IT67301/84A 1983-03-29 1984-03-28 Sistema di controllo per l'inserimento forzato di ioni IT1180011B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/480,095 US4517465A (en) 1983-03-29 1983-03-29 Ion implantation control system

Publications (3)

Publication Number Publication Date
IT8467301A0 IT8467301A0 (it) 1984-03-28
IT8467301A1 true IT8467301A1 (it) 1985-09-28
IT1180011B IT1180011B (it) 1987-09-23

Family

ID=23906659

Family Applications (1)

Application Number Title Priority Date Filing Date
IT67301/84A IT1180011B (it) 1983-03-29 1984-03-28 Sistema di controllo per l'inserimento forzato di ioni

Country Status (5)

Country Link
US (1) US4517465A (it)
EP (1) EP0140928A4 (it)
AU (1) AU553379B2 (it)
IT (1) IT1180011B (it)
WO (1) WO1984003943A1 (it)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60143630A (ja) * 1983-12-29 1985-07-29 Fujitsu Ltd イオン注入方法
US4628209A (en) * 1985-06-07 1986-12-09 Eaton Corporation Particle implantation apparatus and method
US4743767A (en) * 1985-09-09 1988-05-10 Applied Materials, Inc. Systems and methods for ion implantation
US4724222A (en) * 1986-04-28 1988-02-09 American Telephone And Telegraph Company, At&T Bell Laboratories Wafer chuck comprising a curved reference surface
US4751393A (en) * 1986-05-16 1988-06-14 Varian Associates, Inc. Dose measurement and uniformity monitoring system for ion implantation
US4736107A (en) * 1986-09-24 1988-04-05 Eaton Corporation Ion beam implanter scan control system
US4775796A (en) * 1987-01-06 1988-10-04 Purser Kenneth H Treating workpieces with beams
US4804852A (en) * 1987-01-29 1989-02-14 Eaton Corporation Treating work pieces with electro-magnetically scanned ion beams
US4849641A (en) * 1987-06-22 1989-07-18 Berkowitz Edward H Real time non-destructive dose monitor
US4816693A (en) * 1987-08-21 1989-03-28 National Electrostatics Corp. Apparatus and method for uniform ion dose control
DE3734442A1 (de) * 1987-10-12 1989-04-27 Kernforschungsanlage Juelich Verfahren und vorrichtung zur bestrahlung grosser flaechen mit ionen
US4885472A (en) * 1988-03-14 1989-12-05 The Perkin-Elmer Corporation Silicon grid as a reference and calibration standard in a particle beam lithography system
US4929840A (en) * 1989-02-28 1990-05-29 Eaton Corporation Wafer rotation control for an ion implanter
US5572038A (en) * 1993-05-07 1996-11-05 Varian Associates, Inc. Charge monitor for high potential pulse current dose measurement apparatus and method
US5525807A (en) * 1995-06-02 1996-06-11 Eaton Corporation Ion implantation device
JP3003088B2 (ja) * 1994-06-10 2000-01-24 住友イートンノバ株式会社 イオン注入装置
US5751003A (en) * 1996-02-16 1998-05-12 Eaton Corporation Loadlock assembly for an ion implantation system
US5828070A (en) * 1996-02-16 1998-10-27 Eaton Corporation System and method for cooling workpieces processed by an ion implantation system
US5811823A (en) * 1996-02-16 1998-09-22 Eaton Corporation Control mechanisms for dosimetry control in ion implantation systems
US5760405A (en) * 1996-02-16 1998-06-02 Eaton Corporation Plasma chamber for controlling ion dosage in ion implantation
US5793050A (en) * 1996-02-16 1998-08-11 Eaton Corporation Ion implantation system for implanting workpieces
US5895923A (en) * 1996-02-16 1999-04-20 Eaton Corporation Ion beam shield for implantation systems
GB2337360A (en) * 1998-05-13 1999-11-17 Tadamoto Tamai Ion implanter
GB2382717B (en) * 1998-07-21 2003-09-03 Applied Materials Inc Ion Implantation Beam Monitor
US6677599B2 (en) * 2000-03-27 2004-01-13 Applied Materials, Inc. System and method for uniformly implanting a wafer with an ion beam
US6583421B2 (en) 2001-10-11 2003-06-24 Diamond Semiconductor Group, Llc Charge measuring device with wide dynamic range
KR101236563B1 (ko) * 2005-06-03 2013-02-22 액셀리스 테크놀로지스, 인크. 하전된 빔 덤프 및 입자 어트랙터

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1280013A (en) * 1969-09-05 1972-07-05 Atomic Energy Authority Uk Improvements in or relating to apparatus bombarding a target with ions
US3778626A (en) * 1972-07-28 1973-12-11 Western Electric Co Mechanical scan system for ion implantation
US4021675A (en) * 1973-02-20 1977-05-03 Hughes Aircraft Company System for controlling ion implantation dosage in electronic materials
US4011449A (en) * 1975-11-05 1977-03-08 Ibm Corporation Apparatus for measuring the beam current of charged particle beam
US4234797A (en) * 1979-05-23 1980-11-18 Nova Associates, Inc. Treating workpieces with beams
JPS5953659B2 (ja) * 1980-04-11 1984-12-26 株式会社日立製作所 真空室中回転体の往復動機構
JPS5880252A (ja) * 1981-11-05 1983-05-14 Nisshin Haiboruteeji Kk イオン注入装置

Also Published As

Publication number Publication date
US4517465A (en) 1985-05-14
IT1180011B (it) 1987-09-23
AU553379B2 (en) 1986-07-10
AU2732684A (en) 1984-10-25
WO1984003943A1 (en) 1984-10-11
EP0140928A1 (en) 1985-05-15
IT8467301A0 (it) 1984-03-28
EP0140928A4 (en) 1985-07-30

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