IT221408Z2 - Adattatore per testare circuiti stampati - Google Patents

Adattatore per testare circuiti stampati

Info

Publication number
IT221408Z2
IT221408Z2 IT6324590U IT6324590U IT221408Z2 IT 221408 Z2 IT221408 Z2 IT 221408Z2 IT 6324590 U IT6324590 U IT 6324590U IT 6324590 U IT6324590 U IT 6324590U IT 221408 Z2 IT221408 Z2 IT 221408Z2
Authority
IT
Italy
Prior art keywords
adapter
printed circuits
testing printed
testing
circuits
Prior art date
Application number
IT6324590U
Other languages
English (en)
Other versions
IT9063245U1 (it
IT9063245V0 (it
Inventor
Graziano Bagioni
Original Assignee
Circuit Line Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Circuit Line Spa filed Critical Circuit Line Spa
Priority to IT6324590U priority Critical patent/IT221408Z2/it
Publication of IT9063245V0 publication Critical patent/IT9063245V0/it
Priority to DE9107013U priority patent/DE9107013U1/de
Priority to FR9106927A priority patent/FR2663125A1/fr
Publication of IT9063245U1 publication Critical patent/IT9063245U1/it
Application granted granted Critical
Publication of IT221408Z2 publication Critical patent/IT221408Z2/it

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Mounting Of Printed Circuit Boards And The Like (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
IT6324590U 1990-06-11 1990-06-11 Adattatore per testare circuiti stampati IT221408Z2 (it)

Priority Applications (3)

Application Number Priority Date Filing Date Title
IT6324590U IT221408Z2 (it) 1990-06-11 1990-06-11 Adattatore per testare circuiti stampati
DE9107013U DE9107013U1 (de) 1990-06-11 1991-06-07 Adapter zum Prüfen gedruckter Schaltungen
FR9106927A FR2663125A1 (fr) 1990-06-11 1991-06-07 Organe d'adaptation pour tester des circuits imprimes.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT6324590U IT221408Z2 (it) 1990-06-11 1990-06-11 Adattatore per testare circuiti stampati

Publications (3)

Publication Number Publication Date
IT9063245V0 IT9063245V0 (it) 1990-06-11
IT9063245U1 IT9063245U1 (it) 1991-12-11
IT221408Z2 true IT221408Z2 (it) 1994-03-16

Family

ID=11294104

Family Applications (1)

Application Number Title Priority Date Filing Date
IT6324590U IT221408Z2 (it) 1990-06-11 1990-06-11 Adattatore per testare circuiti stampati

Country Status (3)

Country Link
DE (1) DE9107013U1 (it)
FR (1) FR2663125A1 (it)
IT (1) IT221408Z2 (it)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE29616272U1 (de) * 1996-09-18 1998-01-29 atg test systems GmbH, 97877 Wertheim Adapter zum Prüfen von elektrischen Leiterplatten

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2163559B (en) * 1984-08-09 1988-05-25 Multiprobe Limited Testing electrical components
DE3630548A1 (de) * 1986-09-08 1988-03-10 Mania Gmbh Vorrichtung zum elektronischen pruefen von leiterplatten mit kontaktpunkten im 1/20 zoll-raster
EP0351174B1 (en) * 1988-07-13 1995-05-17 Hewlett-Packard Company Board alignment system

Also Published As

Publication number Publication date
DE9107013U1 (de) 1991-08-08
IT9063245U1 (it) 1991-12-11
IT9063245V0 (it) 1990-06-11
FR2663125A1 (fr) 1991-12-13

Similar Documents

Publication Publication Date Title
KR920701830A (ko) Ic 시험장치
IT8321168A0 (it) Apparato per il collaudo ci circuiti integrati.
DE69209169D1 (de) Verbindungstechnik für integrierte Schaltung
DE69226937D1 (de) Prüfverfahren für Leiterplatten
ITTO920622A1 (it) Procedimento di misura per circuiti integrati.
DE69206848D1 (de) Verbindungsanordnung für Prüfeinrichtung
DE69227348T2 (de) DIVIDIERSCHALTUNG FüR GLEITKOMMAZAHLEN
KR880700946A (ko) 전자부품 또는 회로 사이에서 정보를 전달하기 위한 장치
IT1221754B (it) Armadietto per circuiti stampati
DE69211741D1 (de) Prüfsignalausgangsschaltung für LSI
IT8422489A0 (it) Dispositivo per intercollegare circuiti stampati.
EP0510910A3 (en) Apparatus for testing printed circuits
DE69127149D1 (de) Schaltungsprüf-Verfahren
SE9100906L (sv) Elektrodsystem foer spaenningsmaetning
FR2633055B2 (fr) Perfectionnements aux testeurs de circuits
EP0508061A3 (en) Circuit arrangement for testing integrated circuits
IT221408Z2 (it) Adattatore per testare circuiti stampati
KR920021906U (ko) 회로기판 회로 검사 지그
IT8422270A0 (it) Comparatore lineare per circuiti interfonici integrabile ad alta sensibilita'.
IT9085563A0 (it) Connettore per circuiti stampati
KR920010235U (ko) 롬 테스트회로
IT1241204B (it) Metodo per fabbricare piastrine per circuiti stampati
KR930015330U (ko) 아이씨 테스트 회로
IT8984975A0 (it) Macchina per il test elettrico di circuiti stampati.
KR920012950U (ko) 디바이스 테스트 회로

Legal Events

Date Code Title Description
0001 Granted