KR920012960U - 크로스토크(crosstalk) 측정회로 - Google Patents

크로스토크(crosstalk) 측정회로

Info

Publication number
KR920012960U
KR920012960U KR2019900021890U KR900021890U KR920012960U KR 920012960 U KR920012960 U KR 920012960U KR 2019900021890 U KR2019900021890 U KR 2019900021890U KR 900021890 U KR900021890 U KR 900021890U KR 920012960 U KR920012960 U KR 920012960U
Authority
KR
South Korea
Prior art keywords
measurement circuit
crosstalk measurement
crosstalk
circuit
measurement
Prior art date
Application number
KR2019900021890U
Other languages
English (en)
Other versions
KR930008062Y1 (ko
Inventor
박영기
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019900021890U priority Critical patent/KR930008062Y1/ko
Priority to JP1991107788U priority patent/JPH0733706Y2/ja
Publication of KR920012960U publication Critical patent/KR920012960U/ko
Application granted granted Critical
Publication of KR930008062Y1 publication Critical patent/KR930008062Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/31855—Interconnection testing, e.g. crosstalk, shortcircuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing And Processing Devices For Dough (AREA)
  • Baking, Grill, Roasting (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019900021890U 1990-12-29 1990-12-29 크로스토크(crosstalk) 측정회로 KR930008062Y1 (ko)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR2019900021890U KR930008062Y1 (ko) 1990-12-29 1990-12-29 크로스토크(crosstalk) 측정회로
JP1991107788U JPH0733706Y2 (ja) 1990-12-29 1991-12-27 製パン機の練り棒着脱装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019900021890U KR930008062Y1 (ko) 1990-12-29 1990-12-29 크로스토크(crosstalk) 측정회로

Publications (2)

Publication Number Publication Date
KR920012960U true KR920012960U (ko) 1992-07-25
KR930008062Y1 KR930008062Y1 (ko) 1993-12-08

Family

ID=19308560

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900021890U KR930008062Y1 (ko) 1990-12-29 1990-12-29 크로스토크(crosstalk) 측정회로

Country Status (2)

Country Link
JP (1) JPH0733706Y2 (ko)
KR (1) KR930008062Y1 (ko)

Also Published As

Publication number Publication date
KR930008062Y1 (ko) 1993-12-08
JPH0733706Y2 (ja) 1995-08-02
JPH0595430U (ja) 1993-12-27

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