IT201700034664A1 - Rilevatore di radiazione a scintillamento, relativo involucro per rilevatore e processo di fabbricazione - Google Patents

Rilevatore di radiazione a scintillamento, relativo involucro per rilevatore e processo di fabbricazione

Info

Publication number
IT201700034664A1
IT201700034664A1 IT102017000034664A IT201700034664A IT201700034664A1 IT 201700034664 A1 IT201700034664 A1 IT 201700034664A1 IT 102017000034664 A IT102017000034664 A IT 102017000034664A IT 201700034664 A IT201700034664 A IT 201700034664A IT 201700034664 A1 IT201700034664 A1 IT 201700034664A1
Authority
IT
Italy
Prior art keywords
detector
sparkling
enclosure
manufacturing process
radiation detector
Prior art date
Application number
IT102017000034664A
Other languages
English (en)
Inventor
Paolo Crema
Alessandro Freguglia
Piero Giorgio Fallica
Original Assignee
St Microelectronics Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by St Microelectronics Srl filed Critical St Microelectronics Srl
Priority to IT102017000034664A priority Critical patent/IT201700034664A1/it
Priority to US15/939,096 priority patent/US10408952B2/en
Publication of IT201700034664A1 publication Critical patent/IT201700034664A1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2002—Optical details, e.g. reflecting or diffusing layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20188—Auxiliary details, e.g. casings or cooling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0232—Optical elements or arrangements associated with the device
    • H01L31/02322—Optical elements or arrangements associated with the device comprising luminescent members, e.g. fluorescent sheets upon the device
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/085—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors the device being sensitive to very short wavelength, e.g. X-ray, Gamma-rays
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
    • H01L31/107—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier working in avalanche mode, e.g. avalanche photodiodes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Radiation (AREA)
IT102017000034664A 2017-03-29 2017-03-29 Rilevatore di radiazione a scintillamento, relativo involucro per rilevatore e processo di fabbricazione IT201700034664A1 (it)

Priority Applications (2)

Application Number Priority Date Filing Date Title
IT102017000034664A IT201700034664A1 (it) 2017-03-29 2017-03-29 Rilevatore di radiazione a scintillamento, relativo involucro per rilevatore e processo di fabbricazione
US15/939,096 US10408952B2 (en) 2017-03-29 2018-03-28 Radiation scintillator detector, detector package and manufacturing process thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT102017000034664A IT201700034664A1 (it) 2017-03-29 2017-03-29 Rilevatore di radiazione a scintillamento, relativo involucro per rilevatore e processo di fabbricazione

Publications (1)

Publication Number Publication Date
IT201700034664A1 true IT201700034664A1 (it) 2018-09-29

Family

ID=59521569

Family Applications (1)

Application Number Title Priority Date Filing Date
IT102017000034664A IT201700034664A1 (it) 2017-03-29 2017-03-29 Rilevatore di radiazione a scintillamento, relativo involucro per rilevatore e processo di fabbricazione

Country Status (2)

Country Link
US (1) US10408952B2 (it)
IT (1) IT201700034664A1 (it)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7000570B2 (ja) 2017-10-24 2022-01-20 サン－ゴバン セラミックス アンド プラスティクス，インコーポレイティド ハウジング内に分析器を有する放射線検出装置及びその使用方法
US11307311B2 (en) 2018-10-23 2022-04-19 Thermo Fisher Scientific Messtechnik Gmbh Gamma ray and neutron dosimeter
CN113167916A (zh) * 2018-11-30 2021-07-23 圣戈本陶瓷及塑料股份有限公司 具有反射器的辐射探测装置
IT201900010638A1 (it) * 2019-07-02 2021-01-02 St Microelectronics Srl Rilevatore di radiazione a scintillatore e dosimetro corrispondente
DE102022133800A1 (de) * 2022-12-19 2024-06-20 Endress+Hauser SE+Co. KG Radiometrischer Detektor

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5179284A (en) * 1991-08-21 1993-01-12 General Electric Company Solid state radiation imager having a reflective and protective coating
WO2008107808A2 (en) * 2007-03-05 2008-09-12 Koninklijke Philips Electronics, N.V. Improved light detection in a pixelated pet detector
US20100314531A1 (en) * 2009-06-10 2010-12-16 Saint-Gobain Ceramics & Plastics, Inc. Scintillator and detector assembly

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008095257A1 (en) 2007-02-09 2008-08-14 University Of Wollongong Dual radiation detector
FR2948379B1 (fr) * 2009-07-21 2011-08-19 Saint Gobain Cristaux Et Detecteurs Scintillateur en halogenure de terre rare revetu d'un absorbeur ou reflecteur de lumiere
US9995841B2 (en) * 2016-06-21 2018-06-12 Schlumberger Technology Corporation Compact scintillation detector
US10024985B1 (en) 2017-05-02 2018-07-17 David Edward Newman Gamma ray detector with two-dimensional directionality

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5179284A (en) * 1991-08-21 1993-01-12 General Electric Company Solid state radiation imager having a reflective and protective coating
WO2008107808A2 (en) * 2007-03-05 2008-09-12 Koninklijke Philips Electronics, N.V. Improved light detection in a pixelated pet detector
US20100314531A1 (en) * 2009-06-10 2010-12-16 Saint-Gobain Ceramics & Plastics, Inc. Scintillator and detector assembly

Also Published As

Publication number Publication date
US10408952B2 (en) 2019-09-10
US20180284299A1 (en) 2018-10-04

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