IT1396750B1 - "procedimento e sistema per verificare l'affidabilita' di dispositivi elettronici" - Google Patents

"procedimento e sistema per verificare l'affidabilita' di dispositivi elettronici"

Info

Publication number
IT1396750B1
IT1396750B1 ITTO2008A000994A ITTO20080994A IT1396750B1 IT 1396750 B1 IT1396750 B1 IT 1396750B1 IT TO2008A000994 A ITTO2008A000994 A IT TO2008A000994A IT TO20080994 A ITTO20080994 A IT TO20080994A IT 1396750 B1 IT1396750 B1 IT 1396750B1
Authority
IT
Italy
Prior art keywords
verify
reliability
procedure
electronic devices
electronic
Prior art date
Application number
ITTO2008A000994A
Other languages
English (en)
Inventor
Raffaele Ricci
Original Assignee
St Microelectronics Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by St Microelectronics Srl filed Critical St Microelectronics Srl
Priority to ITTO2008A000994A priority Critical patent/IT1396750B1/it
Priority to US13/142,528 priority patent/US9018965B2/en
Priority to PCT/IB2009/055359 priority patent/WO2010076687A1/en
Publication of ITTO20080994A1 publication Critical patent/ITTO20080994A1/it
Application granted granted Critical
Publication of IT1396750B1 publication Critical patent/IT1396750B1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • Hardware Redundancy (AREA)
  • Radar Systems Or Details Thereof (AREA)
ITTO2008A000994A 2008-12-29 2008-12-29 "procedimento e sistema per verificare l'affidabilita' di dispositivi elettronici" IT1396750B1 (it)

Priority Applications (3)

Application Number Priority Date Filing Date Title
ITTO2008A000994A IT1396750B1 (it) 2008-12-29 2008-12-29 "procedimento e sistema per verificare l'affidabilita' di dispositivi elettronici"
US13/142,528 US9018965B2 (en) 2008-12-29 2009-11-26 Method and system to verify the reliability of electronic devices
PCT/IB2009/055359 WO2010076687A1 (en) 2008-12-29 2009-11-26 Method and system to verify the reliability of electronic devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITTO2008A000994A IT1396750B1 (it) 2008-12-29 2008-12-29 "procedimento e sistema per verificare l'affidabilita' di dispositivi elettronici"

Publications (2)

Publication Number Publication Date
ITTO20080994A1 ITTO20080994A1 (it) 2010-06-30
IT1396750B1 true IT1396750B1 (it) 2012-12-14

Family

ID=40999820

Family Applications (1)

Application Number Title Priority Date Filing Date
ITTO2008A000994A IT1396750B1 (it) 2008-12-29 2008-12-29 "procedimento e sistema per verificare l'affidabilita' di dispositivi elettronici"

Country Status (3)

Country Link
US (1) US9018965B2 (it)
IT (1) IT1396750B1 (it)
WO (1) WO2010076687A1 (it)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10191109B2 (en) 2011-11-08 2019-01-29 Pragma Design, Inc. Embedded transient scanning systems, transient scanning data visualization systems, and/or related methods
US9297852B2 (en) 2011-11-08 2016-03-29 Pragma Design, Inc. Embedded transient scanning system apparatus and methodology
CN112895987B (zh) * 2021-04-16 2022-06-03 重庆中车长客轨道车辆有限公司 一种融合供电系统
US20220386513A1 (en) * 2021-05-28 2022-12-01 Nvidia Corporation Intelligent testing system using datacenter cooling systems

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5132612A (en) * 1991-03-14 1992-07-21 The United States Of America As Represented By The Secretary Of The Air Force Apparatus for electrostatic discharge (ESD) stress/testing
US6057698A (en) * 1996-11-12 2000-05-02 Samsung Electronics Co., Ltd. Test system for variable selection of IC devices for testing
US6807507B2 (en) * 2001-11-27 2004-10-19 Vasudevan Seshadhri Kumar Electrical over stress (EOS) monitor
JP2004226159A (ja) * 2003-01-21 2004-08-12 Renesas Technology Corp バーンインテスト用アダプタおよびバーンインテスト装置
JP3701954B2 (ja) * 2003-07-08 2005-10-05 松下電器産業株式会社 半導体集積回路、その静電気耐圧試験方法及び装置
US7375543B2 (en) * 2005-07-21 2008-05-20 Lsi Corporation Electrostatic discharge testing

Also Published As

Publication number Publication date
US9018965B2 (en) 2015-04-28
WO2010076687A1 (en) 2010-07-08
US20110267081A1 (en) 2011-11-03
ITTO20080994A1 (it) 2010-06-30

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