IT1317248B1 - Dispositivo di test e calibrazione della frequenza di oscillazione diun oscillatore integrato. - Google Patents

Dispositivo di test e calibrazione della frequenza di oscillazione diun oscillatore integrato.

Info

Publication number
IT1317248B1
IT1317248B1 IT2000MI000832A ITMI20000832A IT1317248B1 IT 1317248 B1 IT1317248 B1 IT 1317248B1 IT 2000MI000832 A IT2000MI000832 A IT 2000MI000832A IT MI20000832 A ITMI20000832 A IT MI20000832A IT 1317248 B1 IT1317248 B1 IT 1317248B1
Authority
IT
Italy
Prior art keywords
oscillation
calibration
frequency
test device
integrated oscillator
Prior art date
Application number
IT2000MI000832A
Other languages
English (en)
Inventor
Alessandro Rocchi
Marco Bisio
Sandre Guido De
Giovanni Guaitini
Marco Pasotti
Pier Luigi Rolandi
Original Assignee
St Microelectronics Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by St Microelectronics Srl filed Critical St Microelectronics Srl
Priority to IT2000MI000832A priority Critical patent/IT1317248B1/it
Publication of ITMI20000832A0 publication Critical patent/ITMI20000832A0/it
Priority to US09/833,754 priority patent/US6622106B2/en
Publication of ITMI20000832A1 publication Critical patent/ITMI20000832A1/it
Application granted granted Critical
Publication of IT1317248B1 publication Critical patent/IT1317248B1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G01R31/2824—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits testing of oscillators or resonators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
IT2000MI000832A 2000-04-13 2000-04-13 Dispositivo di test e calibrazione della frequenza di oscillazione diun oscillatore integrato. IT1317248B1 (it)

Priority Applications (2)

Application Number Priority Date Filing Date Title
IT2000MI000832A IT1317248B1 (it) 2000-04-13 2000-04-13 Dispositivo di test e calibrazione della frequenza di oscillazione diun oscillatore integrato.
US09/833,754 US6622106B2 (en) 2000-04-13 2001-04-11 Device for testing and calibrating the oscillation frequency of an integrated oscillator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT2000MI000832A IT1317248B1 (it) 2000-04-13 2000-04-13 Dispositivo di test e calibrazione della frequenza di oscillazione diun oscillatore integrato.

Publications (3)

Publication Number Publication Date
ITMI20000832A0 ITMI20000832A0 (it) 2000-04-13
ITMI20000832A1 ITMI20000832A1 (it) 2001-10-13
IT1317248B1 true IT1317248B1 (it) 2003-05-27

Family

ID=11444859

Family Applications (1)

Application Number Title Priority Date Filing Date
IT2000MI000832A IT1317248B1 (it) 2000-04-13 2000-04-13 Dispositivo di test e calibrazione della frequenza di oscillazione diun oscillatore integrato.

Country Status (2)

Country Link
US (1) US6622106B2 (it)
IT (1) IT1317248B1 (it)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6898543B2 (en) * 2002-07-23 2005-05-24 Adc Dsl Systems, Inc. In-system testing of an oscillator
JP2006520135A (ja) * 2003-02-07 2006-08-31 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ データ線を介してクロック発生器ユニットのクロック周波数を較正するシステムおよび方法
US6897148B2 (en) * 2003-04-09 2005-05-24 Tru-Si Technologies, Inc. Electroplating and electroless plating of conductive materials into openings, and structures obtained thereby
JP2006039830A (ja) * 2004-07-26 2006-02-09 Renesas Technology Corp 半導体集積回路
US20060271321A1 (en) * 2005-05-24 2006-11-30 Visteon Global Technologies, Inc. Initiating calibration mode of electronic control module
DE102005041048B4 (de) * 2005-08-30 2007-09-06 Texas Instruments Deutschland Gmbh Integrierter Schaltungsbaustein
US20070226567A1 (en) * 2006-03-23 2007-09-27 Gorman Kevin W High speed bist utilizing clock multiplication
TW200741723A (en) * 2006-04-21 2007-11-01 Holtek Semiconductor Inc Method for calibrating parameter of integrated circuit
US7434121B2 (en) * 2006-05-30 2008-10-07 Infineon Technologies Flash Gmbh & Co. Kg Integrated memory device and method for its testing and manufacture
US8386829B2 (en) * 2009-06-17 2013-02-26 Macronix International Co., Ltd. Automatic internal trimming calibration method to compensate process variation
CN113000416A (zh) * 2021-02-05 2021-06-22 上海华虹宏力半导体制造有限公司 一种振荡器电路模块的测试筛选方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5726607A (en) * 1992-06-15 1998-03-10 Adc Telecommunications, Inc. Phase locked loop using a counter and a microcontroller to produce VCXO control signals
US5410510A (en) * 1993-10-04 1995-04-25 Texas Instruments Inc. Process of making and a DRAM standby charge pump with oscillator having fuse selectable frequencies
US5382922A (en) * 1993-12-23 1995-01-17 International Business Machines Corporation Calibration systems and methods for setting PLL gain characteristics and center frequency
JPH0898284A (ja) * 1994-07-25 1996-04-12 Nippondenso Co Ltd データ受信装置，送信装置および通信装置
US6064947A (en) * 1997-08-27 2000-05-16 Texas Instruments Incorporated Time base generator internal voltage-controlled oscillator calibration system and method
US6204694B1 (en) * 1999-05-21 2001-03-20 Logicvision, Inc. Programmable clock signal generation circuits and methods for generating accurate, high frequency, clock signals

Also Published As

Publication number Publication date
ITMI20000832A0 (it) 2000-04-13
ITMI20000832A1 (it) 2001-10-13
US6622106B2 (en) 2003-09-16
US20010044702A1 (en) 2001-11-22

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