IT1273339B - Sistema di marcatura di circuiti stampati - Google Patents

Sistema di marcatura di circuiti stampati

Info

Publication number
IT1273339B
IT1273339B ITMI940342A ITMI940342A IT1273339B IT 1273339 B IT1273339 B IT 1273339B IT MI940342 A ITMI940342 A IT MI940342A IT MI940342 A ITMI940342 A IT MI940342A IT 1273339 B IT1273339 B IT 1273339B
Authority
IT
Italy
Prior art keywords
marking system
printed circuits
adapter
printed circuit
needle bed
Prior art date
Application number
ITMI940342A
Other languages
English (en)
Inventor
Gian Paolo Antonello
Graziano Bagioni
Original Assignee
Circuit Line Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Circuit Line Spa filed Critical Circuit Line Spa
Priority to ITMI940342A priority Critical patent/IT1273339B/it
Publication of ITMI940342A0 publication Critical patent/ITMI940342A0/it
Priority to DE69508127T priority patent/DE69508127T2/de
Priority to ES95101144T priority patent/ES2130457T3/es
Priority to EP95101144A priority patent/EP0669797B1/en
Priority to CA002141650A priority patent/CA2141650C/en
Priority to US08/385,823 priority patent/US5523698A/en
Publication of ITMI940342A1 publication Critical patent/ITMI940342A1/it
Application granted granted Critical
Publication of IT1273339B publication Critical patent/IT1273339B/it

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/082Integration of non-optical monitoring devices, i.e. using non-optical inspection means, e.g. electrical means, mechanical means or X-rays

Landscapes

  • Engineering & Computer Science (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Inductance-Capacitance Distribution Constants And Capacitance-Resistance Oscillators (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

Un sistema di marcatura di circuiti stampati (4), applicabile a macchine (1) per il test elettrico di circuiti stampati, in cui il circuito da testare viene posizionato nell'area di test della macchina, dove è prevista una griglia a passo costante, o letto d'aghi, con interposizione tra tale letto d'aghi e il circuito stampato (4) di un adattatore (6), il sistema di marcatura comprendendo almeno un elemento di marcatura (20) disposto nell'adattatore (6) e comportando un tampone (21) che viene spostato linearmente mediante un attuatore elettrico (27, 26, 25), su comando fornito dalla stessa macchina testatrice, attraverso una coppia di punti del letto d'aghi.
ITMI940342A 1994-02-24 1994-02-24 Sistema di marcatura di circuiti stampati IT1273339B (it)

Priority Applications (6)

Application Number Priority Date Filing Date Title
ITMI940342A IT1273339B (it) 1994-02-24 1994-02-24 Sistema di marcatura di circuiti stampati
DE69508127T DE69508127T2 (de) 1994-02-24 1995-01-27 Markierungssystem für Leiterplatten
ES95101144T ES2130457T3 (es) 1994-02-24 1995-01-27 Sistema de marcado para tableros de circuito impreso.
EP95101144A EP0669797B1 (en) 1994-02-24 1995-01-27 Marking system for printed circuit boards
CA002141650A CA2141650C (en) 1994-02-24 1995-02-01 Marking system for printed circuit boards
US08/385,823 US5523698A (en) 1994-02-24 1995-02-09 System for making tested printed circuit boards in circuit board testing machines

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITMI940342A IT1273339B (it) 1994-02-24 1994-02-24 Sistema di marcatura di circuiti stampati

Publications (3)

Publication Number Publication Date
ITMI940342A0 ITMI940342A0 (it) 1994-02-24
ITMI940342A1 ITMI940342A1 (it) 1995-08-24
IT1273339B true IT1273339B (it) 1997-07-08

Family

ID=11367981

Family Applications (1)

Application Number Title Priority Date Filing Date
ITMI940342A IT1273339B (it) 1994-02-24 1994-02-24 Sistema di marcatura di circuiti stampati

Country Status (6)

Country Link
US (1) US5523698A (it)
EP (1) EP0669797B1 (it)
CA (1) CA2141650C (it)
DE (1) DE69508127T2 (it)
ES (1) ES2130457T3 (it)
IT (1) IT1273339B (it)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5818248A (en) * 1996-07-29 1998-10-06 Delaware Capital Formation, Inc Loaded board test fixture with integral translator fixture for testing closely spaced test sites
KR100214644B1 (ko) * 1996-12-31 1999-08-02 구자홍 프로세서의 메모리 다중 액세스 회로
IT1290345B1 (it) * 1997-02-18 1998-10-22 Circuit Line Spa Metodo e dispositivo per la correzione dell'errore di allineamento fra aghi di test e punti di test nella fase di test elettrico di
IT1291643B1 (it) * 1997-04-22 1999-01-19 Circuit Line Spa Metodo di regolazione automatica per l'eliminazione dell'errore di centraggio in fase di test elettrico di circuiti stampati
DE202019106179U1 (de) * 2019-11-06 2020-10-02 Ingun Prüfmittelbau Gmbh Markierungsvorrichtung zum Markieren von mit einer Prüfvorrichtung geprüften Schaltungskarten
DE102019129972A1 (de) * 2019-11-06 2021-05-06 Ingun Prüfmittelbau Gmbh Markierungsvorrichtung zum Markieren von mit einer Prüfvorrichtung geprüften Schaltungskarten
DE202020101872U1 (de) * 2020-04-06 2021-01-26 Ingun Prüfmittelbau Gmbh Markierungsvorrichtung zum Markieren von mit einer Prüfvorrichtung geprüften Schaltungskarten
DE202020101881U1 (de) * 2020-04-06 2021-01-27 Ingun Prüfmittelbau Gmbh Markiereinheit mit Kontakt-Überwurfmutter

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3185927A (en) * 1961-01-31 1965-05-25 Kulicke & Soffa Mfg Co Probe instrument for inspecting semiconductor wafers including means for marking defective zones
DE2637877C3 (de) * 1976-08-23 1979-09-27 Siemens Ag, 1000 Berlin Und 8000 Muenchen Anordnung zum Prüfen der Funktionsfähigkeit einer elektrischen Baugruppe
JPS5749844A (en) * 1980-09-10 1982-03-24 Hitachi Ltd Inspecting device for defect of circuit pattern on printed circuit board
JPS57170551U (it) * 1981-04-22 1982-10-27
DE3123031A1 (de) * 1981-06-10 1983-01-05 Siemens AG, 1000 Berlin und 8000 München Verfahren zur kennzeichnung von halbleiterchips und kennzeichenbarer halbleiterchip
US5416428A (en) * 1993-02-09 1995-05-16 Everett Charles Technologies, Inc. Marker probe

Also Published As

Publication number Publication date
ES2130457T3 (es) 1999-07-01
DE69508127T2 (de) 1999-11-04
CA2141650A1 (en) 1995-08-25
EP0669797B1 (en) 1999-03-10
DE69508127D1 (de) 1999-04-15
ITMI940342A1 (it) 1995-08-24
ITMI940342A0 (it) 1994-02-24
US5523698A (en) 1996-06-04
CA2141650C (en) 2002-12-24
EP0669797A1 (en) 1995-08-30

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Legal Events

Date Code Title Description
0001 Granted
TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19970227