IT1171846B - Metodo e dispositivo per la prova di funzionamento di calcolatori - Google Patents

Metodo e dispositivo per la prova di funzionamento di calcolatori

Info

Publication number
IT1171846B
IT1171846B IT8348644A IT4864483A IT1171846B IT 1171846 B IT1171846 B IT 1171846B IT 8348644 A IT8348644 A IT 8348644A IT 4864483 A IT4864483 A IT 4864483A IT 1171846 B IT1171846 B IT 1171846B
Authority
IT
Italy
Prior art keywords
calculators
test
Prior art date
Application number
IT8348644A
Other languages
English (en)
Other versions
IT8348644A0 (it
Inventor
Alfred Schmidt
Wolfram Pottig
Original Assignee
Maschf Augsburg Nuernberg Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Maschf Augsburg Nuernberg Ag filed Critical Maschf Augsburg Nuernberg Ag
Publication of IT8348644A0 publication Critical patent/IT8348644A0/it
Application granted granted Critical
Publication of IT1171846B publication Critical patent/IT1171846B/it

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318385—Random or pseudo-random test pattern
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
IT8348644A 1982-07-09 1983-07-07 Metodo e dispositivo per la prova di funzionamento di calcolatori IT1171846B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3225712A DE3225712C2 (de) 1982-07-09 1982-07-09 Verfahren und Vorrichtung zur Funktionsprüfung von digitalen Rechnern

Publications (2)

Publication Number Publication Date
IT8348644A0 IT8348644A0 (it) 1983-07-07
IT1171846B true IT1171846B (it) 1987-06-10

Family

ID=6168037

Family Applications (1)

Application Number Title Priority Date Filing Date
IT8348644A IT1171846B (it) 1982-07-09 1983-07-07 Metodo e dispositivo per la prova di funzionamento di calcolatori

Country Status (4)

Country Link
US (1) US4627057A (it)
JP (1) JPH0644244B2 (it)
DE (1) DE3225712C2 (it)
IT (1) IT1171846B (it)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4649537A (en) * 1984-10-22 1987-03-10 Westinghouse Electric Corp. Random pattern lock and key fault detection scheme for microprocessor systems
DE3502387A1 (de) * 1985-01-25 1986-07-31 Klöckner-Moeller Elektrizitäts GmbH, 5300 Bonn Verfahren zur ueberwachung von mikroprozessorsystemen und speicherprogrammierbaren steuerungen
DK190785A (da) * 1985-04-29 1986-10-30 Nordiske Kabel Traad Fremgangsmaade til overvaagning af en databehandlingsenhed, samt anlaegtil udoevelse af fremgangsmaaden
JPH0795291B2 (ja) * 1986-01-13 1995-10-11 沖電気工業株式会社 ウオツチドツグタイマ
JPH0752071B2 (ja) * 1989-01-19 1995-06-05 新技術事業団 真空熱処理炉
US6816872B1 (en) 1990-04-26 2004-11-09 Timespring Software Corporation Apparatus and method for reconstructing a file from a difference signature and an original file
US5910958A (en) * 1991-08-14 1999-06-08 Vlsi Technology, Inc. Automatic generation of test vectors for sequential circuits
JPH0662434U (ja) * 1991-10-30 1994-09-02 京三電子株式会社 マットスイッチ
DE4219433A1 (de) * 1992-06-13 1993-12-16 Man Technologie Gmbh Verfahren zur Steuerung eines rechnerunterstützten Prozeßsteuerungssystems
DE19511842A1 (de) * 1995-03-31 1996-10-02 Teves Gmbh Alfred Verfahren und Schaltungsanordnung zur Überwachung einer Datenverarbeitungsschaltung
US7412640B2 (en) * 2003-08-28 2008-08-12 International Business Machines Corporation Self-synchronizing pseudorandom bit sequence checker
KR100587233B1 (ko) * 2004-06-14 2006-06-08 삼성전자주식회사 반도체 메모리소자의 번인테스트 방법
DE102010026694A1 (de) * 2010-07-06 2012-01-12 Siemens Aktiengesellschaft Verfahren zur Überwachung eines Schalters, insbesondere eines Leistungsschalters für Niederspannungen

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3582633A (en) * 1968-02-20 1971-06-01 Lockheed Aircraft Corp Method and apparatus for fault detection in a logic circuit
US3924181A (en) * 1973-10-16 1975-12-02 Hughes Aircraft Co Test circuitry employing a cyclic code generator
US3931506A (en) * 1974-12-30 1976-01-06 Zehntel, Inc. Programmable tester
JPS5290243A (en) * 1976-01-23 1977-07-29 Mitsubishi Electric Corp Trouble diagnosing unit of digital processing unit
JPS5354438A (en) * 1976-10-28 1978-05-17 Toshiba Corp On-line power control system
US4108359A (en) * 1977-03-30 1978-08-22 The United States Of America As Represented By The Secretary Of The Army Apparatus for verifying the execution of a sequence of coded instructions
JPS5420636A (en) * 1977-07-15 1979-02-16 Mitsubishi Electric Corp Computer
JPS5537780A (en) * 1978-09-08 1980-03-15 Matsushita Electric Ind Co Ltd Floor heater unit
DE2841073A1 (de) * 1978-09-21 1980-04-03 Ruhrtal Gmbh Schaltungsanordnung zur verarbeitung von elektrisch dargestellten informationen
IT1117593B (it) * 1979-01-24 1986-02-17 Cselt Centro Studi Lab Telecom Sistema di aotodiagnosi per una apparecchiatura di controllo gestita da elaboratore
US4251885A (en) * 1979-03-09 1981-02-17 International Business Machines Corporation Checking programmed controller operation
JPS6032217B2 (ja) * 1979-04-02 1985-07-26 日産自動車株式会社 制御用コンピュ−タのフェィルセ−フ装置
FR2474226B1 (fr) * 1980-01-22 1985-10-11 Thomson Csf Dispositif de test pour enregistreur numerique multipiste
GB2070300B (en) * 1980-02-27 1984-01-25 Racal Automation Ltd Electrical testing apparatus and methods
US4468768A (en) * 1981-10-26 1984-08-28 Owens-Corning Fiberglas Corporation Self-testing computer monitor

Also Published As

Publication number Publication date
DE3225712A1 (de) 1984-01-12
JPH0644244B2 (ja) 1994-06-08
DE3225712C2 (de) 1985-04-11
JPS5924353A (ja) 1984-02-08
US4627057A (en) 1986-12-02
IT8348644A0 (it) 1983-07-07

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TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19941031