IT1064176B - PERFECTED ELLISOMETER - Google Patents

PERFECTED ELLISOMETER

Info

Publication number
IT1064176B
IT1064176B IT2145776A IT2145776A IT1064176B IT 1064176 B IT1064176 B IT 1064176B IT 2145776 A IT2145776 A IT 2145776A IT 2145776 A IT2145776 A IT 2145776A IT 1064176 B IT1064176 B IT 1064176B
Authority
IT
Italy
Prior art keywords
ellisometer
perfected
perfected ellisometer
Prior art date
Application number
IT2145776A
Other languages
Italian (it)
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/572,476 external-priority patent/US4053232A/en
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of IT1064176B publication Critical patent/IT1064176B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0641—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization
    • G01B11/065—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization using one or more discrete wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/211—Ellipsometry

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
IT2145776A 1975-04-28 1976-03-23 PERFECTED ELLISOMETER IT1064176B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/572,476 US4053232A (en) 1973-06-25 1975-04-28 Rotating-compensator ellipsometer

Publications (1)

Publication Number Publication Date
IT1064176B true IT1064176B (en) 1985-02-18

Family

ID=24287979

Family Applications (1)

Application Number Title Priority Date Filing Date
IT2145776A IT1064176B (en) 1975-04-28 1976-03-23 PERFECTED ELLISOMETER

Country Status (8)

Country Link
JP (1) JPS6042901B2 (en)
BE (1) BE839043A (en)
CA (1) CA1048806A (en)
DE (1) DE2616141A1 (en)
FR (1) FR2309860A1 (en)
GB (1) GB1493087A (en)
IT (1) IT1064176B (en)
NL (1) NL7603931A (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4526471A (en) * 1982-06-17 1985-07-02 Bykov Anatoly P Method for sensing spatial coordinate of article point and apparatus therefor
JPS5930004A (en) * 1982-08-09 1984-02-17 インタ−ナシヨナル　ビジネス　マシ−ンズ　コ−ポレ−シヨン Measuring device for film thickness
JPS59182324A (en) * 1983-03-31 1984-10-17 Horiba Ltd Polarimeter
GB2153071A (en) * 1984-01-16 1985-08-14 Barringer Research Ltd Method and apparatus for detecting hydrocarbons on the surface of water
JPH0820358B2 (en) * 1986-03-03 1996-03-04 オリンパス光学工業株式会社 Device for measuring the refractive index of a substrate for an optical recording medium
DE3708148A1 (en) * 1987-03-11 1987-10-15 Michael Linder Method and device for ellipsometric measurement
JPS6428509A (en) * 1987-07-23 1989-01-31 Nippon Kokan Kk Apparatus for measuring thickness of film
DE29802464U1 (en) * 1997-03-25 1998-06-04 Schmekel, Björn, 95463 Bindlach Refractive index measuring device
KR101991217B1 (en) * 2011-07-07 2019-06-19 케이엘에이-텐코 코포레이션 Multi-analyzer angle spectroscopic ellipsometry

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1422426A (en) * 1973-06-22 1976-01-28 Penny Turbines Ltd Noel Compressor rotor

Also Published As

Publication number Publication date
BE839043A (en) 1976-06-16
GB1493087A (en) 1977-11-23
JPS51131655A (en) 1976-11-16
JPS6042901B2 (en) 1985-09-25
DE2616141A1 (en) 1976-11-11
FR2309860A1 (en) 1976-11-26
FR2309860B1 (en) 1979-04-20
CA1048806A (en) 1979-02-20
NL7603931A (en) 1976-11-01

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