IN2014DN10388A - - Google Patents
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- Publication number
- IN2014DN10388A IN2014DN10388A IN10388DEN2014A IN2014DN10388A IN 2014DN10388 A IN2014DN10388 A IN 2014DN10388A IN 10388DEN2014 A IN10388DEN2014 A IN 10388DEN2014A IN 2014DN10388 A IN2014DN10388 A IN 2014DN10388A
- Authority
- IN
- India
- Prior art keywords
- sample
- spectral data
- ray
- raman
- analyzer
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/485,194 US8982338B2 (en) | 2012-05-31 | 2012-05-31 | Sample analysis |
| PCT/US2013/040266 WO2013180922A1 (en) | 2012-05-31 | 2013-05-09 | Sample analysis using combined x-ray fluorescence and raman spectroscopy |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN2014DN10388A true IN2014DN10388A (enrdf_load_stackoverflow) | 2015-08-14 |
Family
ID=48626586
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN10388DEN2014 IN2014DN10388A (enrdf_load_stackoverflow) | 2012-05-31 | 2013-05-09 |
Country Status (8)
Families Citing this family (52)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US9952165B2 (en) * | 2012-04-19 | 2018-04-24 | University Of Leicester | Methods and apparatus for X-ray diffraction |
| JP6081260B2 (ja) * | 2013-03-28 | 2017-02-15 | 株式会社日立ハイテクサイエンス | 蛍光ｘ線分析装置 |
| US9535018B2 (en) * | 2013-07-08 | 2017-01-03 | Kla-Tencor Corporation | Combined x-ray and optical metrology |
| US9513167B2 (en) * | 2013-12-23 | 2016-12-06 | Thermo Scientific Portable Analytical Instruments Inc. | Adaptation of field use spectroscopy equipment |
| CN104865279A (zh) * | 2014-02-26 | 2015-08-26 | 清华大学 | 一种用于海关监管物项的快速检查设备和方法 |
| CN106796187A (zh) * | 2014-07-30 | 2017-05-31 | 摩擦透视公司 | 具有转移辅助模块的x射线荧光装置 |
| US9683953B2 (en) | 2014-08-20 | 2017-06-20 | Moxtek, Inc. | XRF analyzer communication |
| US9839108B2 (en) | 2014-08-20 | 2017-12-05 | Moxtek, Inc. | XRF analyzer activation switch |
| US9689816B2 (en) | 2014-08-20 | 2017-06-27 | Moxtek, Inc. | XRF analyzer activation switch |
| EP3186620A4 (en) * | 2014-12-22 | 2018-01-31 | Moxtek, Inc. | Xrf analyzer activation switch |
| US11964304B2 (en) | 2015-07-16 | 2024-04-23 | Sortera Technologies, Inc. | Sorting between metal alloys |
| US10722922B2 (en) | 2015-07-16 | 2020-07-28 | UHV Technologies, Inc. | Sorting cast and wrought aluminum |
| US11969764B2 (en) | 2016-07-18 | 2024-04-30 | Sortera Technologies, Inc. | Sorting of plastics |
| US11278937B2 (en) | 2015-07-16 | 2022-03-22 | Sortera Alloys, Inc. | Multiple stage sorting |
| US12194506B2 (en) | 2015-07-16 | 2025-01-14 | Sortera Technologies, Inc. | Sorting of contaminants |
| US12017255B2 (en) | 2015-07-16 | 2024-06-25 | Sortera Technologies, Inc. | Sorting based on chemical composition |
| US12109593B2 (en) | 2015-07-16 | 2024-10-08 | Sortera Technologies, Inc. | Classification and sorting with single-board computers |
| US12208421B2 (en) | 2015-07-16 | 2025-01-28 | Sortera Technologies, Inc. | Metal separation in a scrap yard |
| US12290842B2 (en) | 2015-07-16 | 2025-05-06 | Sortera Technologies, Inc. | Sorting of dark colored and black plastics |
| PL3322544T3 (pl) | 2015-07-16 | 2022-08-29 | Sortera Technologies, Inc. | Układ sortujący materiały |
| US12280404B2 (en) | 2015-07-16 | 2025-04-22 | Sortera Technologies, Inc. | Sorting based on chemical composition |
| US12103045B2 (en) | 2015-07-16 | 2024-10-01 | Sortera Technologies, Inc. | Removing airbag modules from automotive scrap |
| US10625304B2 (en) | 2017-04-26 | 2020-04-21 | UHV Technologies, Inc. | Recycling coins from scrap |
| US10823687B2 (en) | 2015-08-03 | 2020-11-03 | UHV Technologies, Inc. | Metal analysis during pharmaceutical manufacturing |
| US9933375B2 (en) * | 2015-09-25 | 2018-04-03 | Olympus Scientific Solutions Americas, Inc. | XRF/XRD system with dynamic management of multiple data processing units |
| JP6500753B2 (ja) * | 2015-11-09 | 2019-04-17 | 住友金属鉱山株式会社 | 全自動鉱物分析装置と顕微レーザーラマン分光装置とを用いた、鉱石中に存在する鉱物粒子の同定方法 |
| CN105390078B (zh) * | 2015-11-24 | 2019-02-12 | 国术科技(北京)有限公司 | 一种矿石鉴别展教系统及方法 |
| JP6638537B2 (ja) * | 2016-04-21 | 2020-01-29 | 株式会社島津製作所 | 試料解析システム |
| CN106770166A (zh) * | 2016-12-23 | 2017-05-31 | 同方威视技术股份有限公司 | 安全检查装置和方法 |
| US10255788B2 (en) * | 2017-01-20 | 2019-04-09 | Pronk Technologies, Inc. | Electrical safety analyzer |
| US10801963B2 (en) | 2018-08-22 | 2020-10-13 | Paul Bartholomew | Raman spectroscopy for minerals identification |
| WO2018200866A1 (en) | 2017-04-26 | 2018-11-01 | UHV Technologies, Inc. | Material sorting using a vision system |
| WO2018207678A1 (ja) * | 2017-05-11 | 2018-11-15 | 株式会社堀場製作所 | 無人航空機 |
| US11592407B2 (en) * | 2018-05-18 | 2023-02-28 | Enersoft Inc. | Systems, devices, and methods for x-ray fluorescence analysis of geological samples |
| CN112534241A (zh) * | 2018-06-01 | 2021-03-19 | 奥布Xyz股份有限公司 | 检测介质中的分析物 |
| WO2020034002A1 (en) * | 2018-08-17 | 2020-02-20 | Microtrace Pty Limited | Apparatus for the measurement of mineral slurries |
| US10663345B2 (en) | 2018-08-22 | 2020-05-26 | Paul Bartholomew | Raman spectroscopy for minerals identification |
| GB201815207D0 (en) | 2018-09-18 | 2018-10-31 | Univ Nottingham | Raman spectroscopy method and apparatus |
| IT201900004671A1 (it) * | 2019-03-28 | 2020-09-28 | De Tec Tor S R L | Apparato per controllo qualità in linee di produzione, corrispondente procedimento e prodotto informatico |
| EP3997440A4 (en) * | 2019-07-08 | 2023-07-26 | Thermo Scientific Portable Analytical Instruments Inc. | DEVICES AND METHODS FOR DETECTING ELEMENTS IN A SAMPLE |
| JP2022545405A (ja) * | 2019-08-16 | 2022-10-27 | バーソロミュー、ポール | 鉱物同定のためのラマン分光法 |
| WO2021046334A1 (en) * | 2019-09-06 | 2021-03-11 | Alltrista Plastics Llc | Rapid measurement systems and methods for plastic articles |
| DE102020132736B4 (de) | 2019-12-11 | 2023-04-20 | Dmt Gmbh & Co. Kg | Mobiles Analysesystem von heterogenen Gesteins- und/oder Bodenproben |
| JP7445118B2 (ja) * | 2019-12-27 | 2024-03-07 | 日本製鉄株式会社 | 鉄鉱石中のゲーサイト吸着リンの同定方法 |
| CN111751394B (zh) * | 2020-04-17 | 2021-08-27 | 山东大学 | 基于图像与xrf矿物反演的岩性识别方法及系统 |
| JP7659738B2 (ja) | 2020-11-02 | 2025-04-10 | 大日本印刷株式会社 | 検査方法及び検査システム |
| EP4019951A1 (en) * | 2020-12-24 | 2022-06-29 | Inel S.A.S | Apparatuses and methods for combined simultaneous analyses of materials |
| JP7653281B2 (ja) * | 2021-03-30 | 2025-03-28 | 株式会社堀場テクノサービス | 定量分析方法、定量分析システム、及び、定量分析システム用プログラム |
| CN113310965B (zh) * | 2021-06-04 | 2022-07-15 | 钢研纳克检测技术股份有限公司 | 一种跨境货品多参量无损原位检测仪 |
| CN113791098B (zh) * | 2021-11-16 | 2024-03-26 | 四川大学 | 一种多特征表面分析装置 |
| CN114486971A (zh) * | 2022-01-25 | 2022-05-13 | 深圳市埃芯半导体科技有限公司 | 多源设计的x射线分析系统和方法 |
| CN118518675B (zh) * | 2024-06-28 | 2024-11-15 | 深圳市朝日电子材料有限公司 | 铅锡条质量检测方法、装置、设备及存储介质 |
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| JP2001013095A (ja) * | 1999-06-30 | 2001-01-19 | Horiba Ltd | 試料の無機物分析装置ならびに試料の無機物および／または有機物分析装置 |
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| JP2009258030A (ja) * | 2008-04-21 | 2009-11-05 | Jeol Ltd | ラマンスペクトル取得法 |
| JP5248249B2 (ja) * | 2008-09-17 | 2013-07-31 | 東京エレクトロン株式会社 | 粒子径測定装置、粒子径測定方法及びコンピュータプログラム |
| JP5162431B2 (ja) * | 2008-12-10 | 2013-03-13 | 富士フイルム株式会社 | 光立体構造像装置 |
| US8891086B2 (en) | 2009-06-15 | 2014-11-18 | Thermo Scientific Portable Analytical Instruments Inc. | Optical scanning systems and methods for measuring a sealed container with a layer for reducing diffusive scattering |
| US20110079734A1 (en) | 2009-10-02 | 2011-04-07 | Lee Grodzins | Elemental Analysis Based on Complementary Techniques |
| JP5170582B2 (ja) * | 2010-04-05 | 2013-03-27 | 横河電機株式会社 | 顕微鏡用分光分析装置 |
| JP5092104B2 (ja) * | 2010-08-30 | 2012-12-05 | ナノフォトン株式会社 | 分光測定装置、及び分光測定方法 |
-
2012
- 2012-05-31 US US13/485,194 patent/US8982338B2/en active Active
-
2013
- 2013-05-09 CN CN201380028486.3A patent/CN104335032B/zh active Active
- 2013-05-09 JP JP2015515018A patent/JP6378173B2/ja active Active
- 2013-05-09 AU AU2013267828A patent/AU2013267828C1/en active Active
- 2013-05-09 WO PCT/US2013/040266 patent/WO2013180922A1/en active Application Filing
- 2013-05-09 EP EP13729118.3A patent/EP2856125B1/en active Active
- 2013-05-09 CA CA2874319A patent/CA2874319C/en active Active
- 2013-05-09 IN IN10388DEN2014 patent/IN2014DN10388A/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| US8982338B2 (en) | 2015-03-17 |
| AU2013267828B2 (en) | 2016-04-21 |
| AU2013267828C1 (en) | 2016-08-25 |
| JP2015519571A (ja) | 2015-07-09 |
| JP6378173B2 (ja) | 2018-08-22 |
| WO2013180922A1 (en) | 2013-12-05 |
| CA2874319C (en) | 2019-02-26 |
| WO2013180922A9 (en) | 2015-04-02 |
| US20130321793A1 (en) | 2013-12-05 |
| CN104335032A (zh) | 2015-02-04 |
| AU2013267828A1 (en) | 2014-12-11 |
| EP2856125B1 (en) | 2020-07-01 |
| CA2874319A1 (en) | 2013-12-05 |
| CN104335032B (zh) | 2017-07-04 |
| EP2856125A1 (en) | 2015-04-08 |
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