IN2014CN03496A - - Google Patents
Info
- Publication number
- IN2014CN03496A IN2014CN03496A IN3496CHN2014A IN2014CN03496A IN 2014CN03496 A IN2014CN03496 A IN 2014CN03496A IN 3496CHN2014 A IN3496CHN2014 A IN 3496CHN2014A IN 2014CN03496 A IN2014CN03496 A IN 2014CN03496A
- Authority
- IN
- India
- Prior art keywords
- field lines
- charges
- direct conversion
- electric field
- drifting
- Prior art date
Links
- 230000005684 electric field Effects 0.000 abstract 3
- 238000006243 chemical reaction Methods 0.000 abstract 2
- 230000005855 radiation Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
- G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14665—Imagers using a photoconductor layer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Measurement Of Radiation (AREA)
- Light Receiving Elements (AREA)
- Solid State Image Pick-Up Elements (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161557480P | 2011-11-09 | 2011-11-09 | |
| PCT/IB2012/056231 WO2013068944A1 (en) | 2011-11-09 | 2012-11-07 | Radiation-sensitive detector device with charge-rejecting segment gaps |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN2014CN03496A true IN2014CN03496A (zh) | 2015-10-16 |
Family
ID=47297342
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN3496CHN2014 IN2014CN03496A (zh) | 2011-11-09 | 2012-11-07 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9069088B2 (zh) |
| EP (1) | EP2748638B1 (zh) |
| JP (1) | JP6251683B2 (zh) |
| CN (1) | CN103917897B (zh) |
| BR (1) | BR112014010873A8 (zh) |
| IN (1) | IN2014CN03496A (zh) |
| RU (1) | RU2605523C2 (zh) |
| WO (1) | WO2013068944A1 (zh) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102013202630B4 (de) * | 2013-02-19 | 2017-07-06 | Siemens Healthcare Gmbh | Strahlungsdetektor und medizinisches Diagnosesystem |
| US10497737B2 (en) * | 2013-05-30 | 2019-12-03 | Caeleste Cvba | Enhanced dynamic range imaging |
| DE102014204042A1 (de) * | 2014-03-05 | 2015-09-10 | Siemens Aktiengesellschaft | Verfahren zur Ansteuerung eines Röntgendetektors und zugehörige Steuereinheit |
| WO2016066850A1 (en) * | 2014-10-31 | 2016-05-06 | Koninklijke Philips N.V. | Sensor device and imaging system for detecting radiation signals |
| WO2016087423A1 (en) * | 2014-12-05 | 2016-06-09 | Koninklijke Philips N.V. | X-ray detector device for inclined angle x-ray radiation |
| JP6505228B2 (ja) * | 2014-12-17 | 2019-04-24 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 電離放射線を検出する検出器、撮像装置、非一時的コンピュータ可読媒体、及び方法 |
| US10641911B2 (en) | 2015-12-02 | 2020-05-05 | Shenzhen Xpectvision Technology Co., Ltd. | Packaging methods of semiconductor X-ray detectors |
| DE102016221481B4 (de) * | 2016-11-02 | 2021-09-16 | Siemens Healthcare Gmbh | Strahlungsdetektor mit einer Zwischenschicht |
| US10156645B2 (en) * | 2016-12-23 | 2018-12-18 | General Electric Company | Systems and methods for sub-pixel location determination at sidewalls and corners of detectors |
| EP3404447B1 (de) * | 2017-05-17 | 2019-08-14 | Siemens Healthcare GmbH | Röntgendetektor aufweisend eine lichtquelle am trägerelement |
| WO2020235124A1 (ja) * | 2019-05-17 | 2020-11-26 | Ｊｘ金属株式会社 | 半導体ウエハ、放射線検出素子、放射線検出器、及び化合物半導体単結晶基板の製造方法 |
| JP7250919B2 (ja) * | 2019-05-17 | 2023-04-03 | Ｊｘ金属株式会社 | 半導体ウエハ、放射線検出素子、放射線検出器、及び化合物半導体単結晶基板の製造方法 |
| JP7423423B2 (ja) * | 2020-05-28 | 2024-01-29 | 株式会社日立製作所 | 半導体検出器およびその製造方法 |
| US11835666B1 (en) * | 2020-07-31 | 2023-12-05 | Redlen Technologies, Inc. | Photon counting computed tomography detector with improved count rate stability and method of operating same |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0679162U (ja) * | 1993-04-22 | 1994-11-04 | ジーイー横河メディカルシステム株式会社 | 半導体ｘ線検出器 |
| US5677539A (en) * | 1995-10-13 | 1997-10-14 | Digirad | Semiconductor radiation detector with enhanced charge collection |
| US6175120B1 (en) | 1998-05-08 | 2001-01-16 | The Regents Of The University Of Michigan | High-resolution ionization detector and array of such detectors |
| US6034373A (en) * | 1997-12-11 | 2000-03-07 | Imrad Imaging Systems Ltd. | Semiconductor radiation detector with reduced surface effects |
| JP4091334B2 (ja) * | 2001-05-11 | 2008-05-28 | 富士フイルム株式会社 | 画像記録方法および装置並びに画像記録媒体 |
| JP3900992B2 (ja) | 2002-04-02 | 2007-04-04 | 株式会社日立製作所 | 放射線検出器及び放射線検査装置 |
| CN1230693C (zh) * | 2002-11-26 | 2005-12-07 | 张亚美 | 小面积像素电极直接平板x－线探测器 |
| EP1801616A3 (en) * | 2003-07-12 | 2007-07-04 | Radiation Watch Ltd | Ionising radiation detector |
| WO2005114705A2 (en) * | 2004-05-21 | 2005-12-01 | Whitehouse Craig M | Rf surfaces and rf ion guides |
| EP1779141A2 (en) * | 2004-08-13 | 2007-05-02 | Koninklijke Philips Electronics N.V. | Solid state radiation detector packaging technique |
| US7453068B2 (en) | 2005-07-06 | 2008-11-18 | Ge Medical Systems Israel, Ltd. | Method and apparatus of detecting ionizing radiation |
| WO2008054862A2 (en) * | 2006-04-21 | 2008-05-08 | Ii-Vi Incorporated | Radiation detector with co-planar grid structure |
| EP2084558B1 (en) * | 2006-11-17 | 2013-10-23 | Koninklijke Philips N.V. | Radiation detector with multiple electrodes on a sensitive layer |
| CN101563628A (zh) * | 2006-12-22 | 2009-10-21 | 皇家飞利浦电子股份有限公司 | 能量分辨探测系统和成像系统 |
| US7955992B2 (en) | 2008-08-08 | 2011-06-07 | Redlen Technologies, Inc. | Method of passivating and encapsulating CdTe and CZT segmented detectors |
| WO2010073189A1 (en) * | 2008-12-22 | 2010-07-01 | Koninklijke Philips Electronics N.V. | Radiation detector with improved charge collection and minimized leakage currents |
| JP2012114166A (ja) * | 2010-11-22 | 2012-06-14 | Canon Inc | 検出装置及び放射線検出システム |
-
2012
- 2012-11-07 US US14/354,695 patent/US9069088B2/en active Active
- 2012-11-07 EP EP12797988.8A patent/EP2748638B1/en active Active
- 2012-11-07 JP JP2014540610A patent/JP6251683B2/ja active Active
- 2012-11-07 IN IN3496CHN2014 patent/IN2014CN03496A/en unknown
- 2012-11-07 RU RU2014123326/28A patent/RU2605523C2/ru active
- 2012-11-07 BR BR112014010873A patent/BR112014010873A8/pt not_active IP Right Cessation
- 2012-11-07 WO PCT/IB2012/056231 patent/WO2013068944A1/en active Application Filing
- 2012-11-07 CN CN201280055158.8A patent/CN103917897B/zh active Active
Also Published As
| Publication number | Publication date |
|---|---|
| WO2013068944A1 (en) | 2013-05-16 |
| EP2748638A1 (en) | 2014-07-02 |
| BR112014010873A8 (pt) | 2017-06-20 |
| EP2748638B1 (en) | 2019-09-18 |
| CN103917897A (zh) | 2014-07-09 |
| US9069088B2 (en) | 2015-06-30 |
| JP2015504513A (ja) | 2015-02-12 |
| RU2014123326A (ru) | 2015-12-20 |
| US20140284489A1 (en) | 2014-09-25 |
| CN103917897B (zh) | 2016-08-17 |
| BR112014010873A2 (pt) | 2017-06-13 |
| JP6251683B2 (ja) | 2017-12-20 |
| RU2605523C2 (ru) | 2016-12-20 |
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