IN2014CN02540A - - Google Patents
Info
- Publication number
- IN2014CN02540A IN2014CN02540A IN2540CHN2014A IN2014CN02540A IN 2014CN02540 A IN2014CN02540 A IN 2014CN02540A IN 2540CHN2014 A IN2540CHN2014 A IN 2540CHN2014A IN 2014CN02540 A IN2014CN02540 A IN 2014CN02540A
- Authority
- IN
- India
- Prior art keywords
- heights
- test pulses
- signal indicative
- generate
- pulses
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/26—Measuring, controlling or protecting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/17—Circuit arrangements not adapted to a particular type of detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
- G01T7/005—Details of radiation-measuring instruments calibration techniques
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161548749P | 2011-10-19 | 2011-10-19 | |
| PCT/IB2012/055554 WO2013057645A2 (en) | 2011-10-19 | 2012-10-12 | Photon counting detector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN2014CN02540A true IN2014CN02540A (zh) | 2015-08-07 |
Family
ID=47428774
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN2540CHN2014 IN2014CN02540A (zh) | 2011-10-19 | 2012-10-12 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9301378B2 (zh) |
| EP (2) | EP2745143B1 (zh) |
| JP (1) | JP2014530704A (zh) |
| CN (1) | CN103890610B (zh) |
| IN (1) | IN2014CN02540A (zh) |
| RU (1) | RU2594602C2 (zh) |
| WO (1) | WO2013057645A2 (zh) |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5593338B2 (ja) * | 2012-01-30 | 2014-09-24 | 富士フイルム株式会社 | 放射線照射開始判定装置、放射線画像撮影装置、放射線画像撮影制御装置、放射線照射開始判定方法、及び放射線照射開始判定プログラム |
| RU2014127855A (ru) * | 2012-12-12 | 2017-01-18 | Конинклейке Филипс Н.В. | Адаптивная постоянная компенсация тока для детекторов счета фотонов |
| CN104812305B (zh) * | 2012-12-27 | 2018-03-30 | 东芝医疗系统株式会社 | X射线ct装置以及控制方法 |
| JP6289223B2 (ja) * | 2013-04-04 | 2018-03-07 | キヤノンメディカルシステムズ株式会社 | Ｘ線コンピュータ断層撮影装置 |
| EP2871496B1 (en) * | 2013-11-12 | 2020-01-01 | Samsung Electronics Co., Ltd | Radiation detector and computed tomography apparatus using the same |
| EP3074791B1 (en) * | 2013-11-27 | 2019-06-19 | Koninklijke Philips N.V. | Detection device for detecting photons and method therefor |
| KR101635980B1 (ko) * | 2013-12-30 | 2016-07-05 | 삼성전자주식회사 | 방사선 디텍터 및 그에 따른 컴퓨터 단층 촬영 장치 |
| CN106687825B (zh) * | 2014-09-02 | 2020-06-23 | 皇家飞利浦有限公司 | 谱ct探测器中的基于窗口的谱测量 |
| US10159450B2 (en) * | 2014-10-01 | 2018-12-25 | Toshiba Medical Systems Corporation | X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector |
| WO2016076767A1 (en) * | 2014-11-10 | 2016-05-19 | Prismatic Sensors Ab | X-ray imaging based on image data from a photon-counting multi bin x-ray detector |
| WO2016087423A1 (en) * | 2014-12-05 | 2016-06-09 | Koninklijke Philips N.V. | X-ray detector device for inclined angle x-ray radiation |
| KR101725099B1 (ko) * | 2014-12-05 | 2017-04-26 | 삼성전자주식회사 | 컴퓨터 단층 촬영장치 및 그 제어방법 |
| JP6277331B1 (ja) * | 2014-12-11 | 2018-02-07 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | Ｘ線検出器、イメージング装置及び較正方法 |
| CN107003421B (zh) | 2014-12-16 | 2020-02-07 | 皇家飞利浦有限公司 | 用于光子探测器的基线偏移确定 |
| US10098595B2 (en) * | 2015-08-06 | 2018-10-16 | Texas Instruments Incorporated | Low power photon counting system |
| US10725188B2 (en) * | 2015-10-20 | 2020-07-28 | Koninklijke Philips N.V. | Polarization correction for direct conversion x-ray detectors |
| JP6633201B2 (ja) * | 2015-11-12 | 2020-01-22 | プリズマティック、センサーズ、アクチボラグＰｒｉｓｍａｔｉｃ Ｓｅｎｓｏｒｓ Ａｂ | 時間オフセット深度セグメントを有するエッジオン検出器を用いた高分解能コンピュータ断層撮影 |
| EP3507620B1 (en) * | 2016-08-31 | 2022-06-08 | Prismatic Sensors AB | Method and system for estimating the relative gain and offset of a converter |
| US10067240B1 (en) * | 2017-03-06 | 2018-09-04 | Prismatic Sensors Ab | X-ray detector system based on photon counting |
| CN106989835B (zh) * | 2017-04-12 | 2023-07-11 | 东北大学 | 基于压缩感知的光子计数x射线能谱探测装置及成像系统 |
| JP2019010426A (ja) * | 2017-06-30 | 2019-01-24 | ゼネラル・エレクトリック・カンパニイ | 放射線断層撮影装置およびプログラム |
| US10151845B1 (en) | 2017-08-02 | 2018-12-11 | Texas Instruments Incorporated | Configurable analog-to-digital converter and processing for photon counting |
| US10024979B1 (en) | 2017-11-01 | 2018-07-17 | Texas Instruments Incorporated | Photon counting with coincidence detection |
| CN108897030B (zh) * | 2018-05-09 | 2020-12-25 | 中国科学院近代物理研究所 | 信号的定时提取装置及方法 |
| CN108903961A (zh) * | 2018-07-19 | 2018-11-30 | 深圳市倍康美医疗电子商务有限公司 | 一种cbct成像方法、存储介质及系统 |
| US11219114B2 (en) * | 2018-10-03 | 2022-01-04 | Konica Minolta, Inc. | Radiation generation control device, radiation generation control system, and radiography system |
| US10890674B2 (en) | 2019-01-15 | 2021-01-12 | Texas Instruments Incorporated | Dynamic noise shaping in a photon counting system |
| CN110412644A (zh) * | 2019-08-14 | 2019-11-05 | 苏州瑞迈斯医疗科技有限公司 | 光子计数方法和装置 |
| CN110456404B (zh) * | 2019-08-14 | 2023-07-28 | 苏州瑞迈斯科技有限公司 | 辐射探测装置和成像系统 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5943388A (en) * | 1996-07-30 | 1999-08-24 | Nova R & D, Inc. | Radiation detector and non-destructive inspection |
| US5804833A (en) | 1996-10-10 | 1998-09-08 | Advanced Scientific Concepts, Inc. | Advanced semiconductor emitter technology photocathodes |
| JP2004325183A (ja) * | 2003-04-23 | 2004-11-18 | M & C:Kk | 放射線検出方法、放射線検出器、及び、この検出器を搭載した放射線撮像システム |
| US7599465B2 (en) * | 2004-11-19 | 2009-10-06 | General Electric Company | Detection of thrombi in CT using energy discrimination |
| CN101080653B (zh) * | 2004-12-17 | 2012-02-29 | 皇家飞利浦电子股份有限公司 | 一种x射线照相成像设备、方法及x射线断层摄影扫描器 |
| EP1943545A2 (en) * | 2005-10-28 | 2008-07-16 | Koninklijke Philips Electronics N.V. | Method and apparatus for spectral computed tomography |
| JP5340524B2 (ja) * | 2006-03-23 | 2013-11-13 | 浜松ホトニクス株式会社 | 放射線検出器及び放射線検出方法 |
| US8044681B2 (en) * | 2007-10-08 | 2011-10-25 | General Electric Company | Apparatus and method for channel-specific configuration in a readout ASIC |
| JP2011521212A (ja) * | 2008-04-30 | 2011-07-21 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 計数検出器 |
| WO2009141760A2 (en) | 2008-05-19 | 2009-11-26 | Koninklijke Philips Electronics N.V. | A photon detector with converter unit |
| EP2296550B1 (en) * | 2008-07-07 | 2018-03-28 | Koninklijke Philips N.V. | K-edge imaging |
| US20100316184A1 (en) * | 2008-10-17 | 2010-12-16 | Jan Iwanczyk | Silicon photomultiplier detector for computed tomography |
| US8198577B2 (en) | 2009-02-25 | 2012-06-12 | Caeleste Cvba | High dynamic range analog X-ray photon counting |
| US8384038B2 (en) | 2009-06-24 | 2013-02-26 | General Electric Company | Readout electronics for photon counting and energy discriminating detectors |
| JP2011085479A (ja) * | 2009-10-15 | 2011-04-28 | Tele Systems:Kk | 光子計数型放射線検出器のキャリブレーション装置及びそのキャリブレーション方法 |
| RU2538950C2 (ru) * | 2009-12-21 | 2015-01-10 | Конинклейке Филипс Электроникс Н.В. | Узел детектора излучения со схемой тестирования |
| US8080780B2 (en) * | 2009-12-29 | 2011-12-20 | Kabushiki Kaisha Toshiba | Apparatus and associated methodology for improving timing resolution in gamma ray detection |
-
2012
- 2012-10-12 RU RU2014119870/28A patent/RU2594602C2/ru not_active IP Right Cessation
- 2012-10-12 CN CN201280051041.2A patent/CN103890610B/zh active Active
- 2012-10-12 JP JP2014536375A patent/JP2014530704A/ja not_active Ceased
- 2012-10-12 US US14/350,370 patent/US9301378B2/en active Active
- 2012-10-12 IN IN2540CHN2014 patent/IN2014CN02540A/en unknown
- 2012-10-12 EP EP12805762.7A patent/EP2745143B1/en active Active
- 2012-10-12 EP EP17187549.5A patent/EP3290959B1/en active Active
- 2012-10-12 WO PCT/IB2012/055554 patent/WO2013057645A2/en active Application Filing
Also Published As
| Publication number | Publication date |
|---|---|
| RU2594602C2 (ru) | 2016-08-20 |
| WO2013057645A2 (en) | 2013-04-25 |
| EP3290959B1 (en) | 2020-05-27 |
| US9301378B2 (en) | 2016-03-29 |
| WO2013057645A3 (en) | 2014-03-06 |
| EP3290959A1 (en) | 2018-03-07 |
| RU2014119870A (ru) | 2015-11-27 |
| EP2745143A2 (en) | 2014-06-25 |
| CN103890610A (zh) | 2014-06-25 |
| US20140254749A1 (en) | 2014-09-11 |
| CN103890610B (zh) | 2017-08-29 |
| EP2745143B1 (en) | 2019-04-03 |
| JP2014530704A (ja) | 2014-11-20 |
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