IN2014CN02540A - - Google Patents
Info
- Publication number
- IN2014CN02540A IN2014CN02540A IN2540CHN2014A IN2014CN02540A IN 2014CN02540 A IN2014CN02540 A IN 2014CN02540A IN 2540CHN2014 A IN2540CHN2014 A IN 2540CHN2014A IN 2014CN02540 A IN2014CN02540 A IN 2014CN02540A
- Authority
- IN
- India
- Prior art keywords
- heights
- test pulses
- signal indicative
- generate
- pulses
- Prior art date
Links
- 230000005855 radiation Effects 0.000 abstract 4
- 238000003384 imaging method Methods 0.000 abstract 2
- 238000006243 chemical reaction Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/26—Measuring, controlling or protecting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/17—Circuit arrangements not adapted to a particular type of detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
- G01T7/005—Details of radiation-measuring instruments calibration techniques
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Toxicology (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161548749P | 2011-10-19 | 2011-10-19 | |
| PCT/IB2012/055554 WO2013057645A2 (en) | 2011-10-19 | 2012-10-12 | Photon counting detector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN2014CN02540A true IN2014CN02540A (enrdf_load_stackoverflow) | 2015-08-07 |
Family
ID=47428774
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN2540CHN2014 IN2014CN02540A (enrdf_load_stackoverflow) | 2011-10-19 | 2012-10-12 |
Country Status (7)
Families Citing this family (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5593338B2 (ja) * | 2012-01-30 | 2014-09-24 | 富士フイルム株式会社 | 放射線照射開始判定装置、放射線画像撮影装置、放射線画像撮影制御装置、放射線照射開始判定方法、及び放射線照射開始判定プログラム |
| JP6145517B2 (ja) * | 2012-12-12 | 2017-06-14 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 光子計数検出器のための適応的な持続性電流補償を行うイメージングシステム及び適応的な持続性電流補償方法 |
| WO2014104306A1 (ja) * | 2012-12-27 | 2014-07-03 | 株式会社東芝 | Ｘ線ｃｔ装置及び制御方法 |
| WO2014163187A1 (ja) * | 2013-04-04 | 2014-10-09 | 株式会社 東芝 | Ｘ線コンピュータ断層撮影装置 |
| EP2871496B1 (en) * | 2013-11-12 | 2020-01-01 | Samsung Electronics Co., Ltd | Radiation detector and computed tomography apparatus using the same |
| WO2015078753A1 (en) | 2013-11-27 | 2015-06-04 | Koninklijke Philips N.V. | Detection device for detecting photons and method therefore |
| KR101635980B1 (ko) * | 2013-12-30 | 2016-07-05 | 삼성전자주식회사 | 방사선 디텍터 및 그에 따른 컴퓨터 단층 촬영 장치 |
| US10788594B2 (en) * | 2014-09-02 | 2020-09-29 | Koninklijke Philips N.V. | Window-based spectrum measurement in a spectral CT detector |
| US10159450B2 (en) * | 2014-10-01 | 2018-12-25 | Toshiba Medical Systems Corporation | X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector |
| EP3218876B1 (en) * | 2014-11-10 | 2020-04-08 | Prismatic Sensors AB | X-ray imaging based on image data from a photon-counting multi bin x-ray detector |
| KR101725099B1 (ko) * | 2014-12-05 | 2017-04-26 | 삼성전자주식회사 | 컴퓨터 단층 촬영장치 및 그 제어방법 |
| WO2016087423A1 (en) * | 2014-12-05 | 2016-06-09 | Koninklijke Philips N.V. | X-ray detector device for inclined angle x-ray radiation |
| JP6277331B1 (ja) * | 2014-12-11 | 2018-02-07 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | Ｘ線検出器、イメージング装置及び較正方法 |
| CN107003421B (zh) | 2014-12-16 | 2020-02-07 | 皇家飞利浦有限公司 | 用于光子探测器的基线偏移确定 |
| US10098595B2 (en) * | 2015-08-06 | 2018-10-16 | Texas Instruments Incorporated | Low power photon counting system |
| US10725188B2 (en) * | 2015-10-20 | 2020-07-28 | Koninklijke Philips N.V. | Polarization correction for direct conversion x-ray detectors |
| EP3374803B1 (en) * | 2015-11-12 | 2020-04-01 | Prismatic Sensors AB | High-resolution computed tomography using edge-on detectors with temporally offset depth-segments |
| CN109844568B (zh) * | 2016-08-31 | 2023-05-16 | 棱镜传感器公司 | 用于估计转换器的相对增益和偏移的方法和系统 |
| US10067240B1 (en) * | 2017-03-06 | 2018-09-04 | Prismatic Sensors Ab | X-ray detector system based on photon counting |
| CN106989835B (zh) * | 2017-04-12 | 2023-07-11 | 东北大学 | 基于压缩感知的光子计数x射线能谱探测装置及成像系统 |
| JP2019010426A (ja) * | 2017-06-30 | 2019-01-24 | ゼネラル・エレクトリック・カンパニイ | 放射線断層撮影装置およびプログラム |
| US10151845B1 (en) | 2017-08-02 | 2018-12-11 | Texas Instruments Incorporated | Configurable analog-to-digital converter and processing for photon counting |
| US10024979B1 (en) | 2017-11-01 | 2018-07-17 | Texas Instruments Incorporated | Photon counting with coincidence detection |
| CN108897030B (zh) * | 2018-05-09 | 2020-12-25 | 中国科学院近代物理研究所 | 信号的定时提取装置及方法 |
| CN108903961A (zh) * | 2018-07-19 | 2018-11-30 | 深圳市倍康美医疗电子商务有限公司 | 一种cbct成像方法、存储介质及系统 |
| US11219114B2 (en) * | 2018-10-03 | 2022-01-04 | Konica Minolta, Inc. | Radiation generation control device, radiation generation control system, and radiography system |
| US10890674B2 (en) | 2019-01-15 | 2021-01-12 | Texas Instruments Incorporated | Dynamic noise shaping in a photon counting system |
| CN110456404B (zh) * | 2019-08-14 | 2023-07-28 | 苏州瑞迈斯科技有限公司 | 辐射探测装置和成像系统 |
| CN110412644A (zh) * | 2019-08-14 | 2019-11-05 | 苏州瑞迈斯医疗科技有限公司 | 光子计数方法和装置 |
| CN116710811A (zh) | 2020-12-09 | 2023-09-05 | ams国际有限公司 | 光子计数系统中用于基线提取的电路系统 |
| EP4495636A1 (en) * | 2023-07-21 | 2025-01-22 | Koninklijke Philips N.V. | Photon counting detector flicker noise correction |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5943388A (en) * | 1996-07-30 | 1999-08-24 | Nova R & D, Inc. | Radiation detector and non-destructive inspection |
| US5804833A (en) | 1996-10-10 | 1998-09-08 | Advanced Scientific Concepts, Inc. | Advanced semiconductor emitter technology photocathodes |
| JP2004325183A (ja) * | 2003-04-23 | 2004-11-18 | M & C:Kk | 放射線検出方法、放射線検出器、及び、この検出器を搭載した放射線撮像システム |
| US7599465B2 (en) * | 2004-11-19 | 2009-10-06 | General Electric Company | Detection of thrombi in CT using energy discrimination |
| US7873144B2 (en) * | 2004-12-17 | 2011-01-18 | Koninklijke Philips Electronics N.V. | Pulsed x-ray for continuous detector correction |
| CN101297221B (zh) * | 2005-10-28 | 2012-01-11 | 皇家飞利浦电子股份有限公司 | 用于谱计算机断层摄影的方法和设备 |
| JP5340524B2 (ja) * | 2006-03-23 | 2013-11-13 | 浜松ホトニクス株式会社 | 放射線検出器及び放射線検出方法 |
| US8044681B2 (en) * | 2007-10-08 | 2011-10-25 | General Electric Company | Apparatus and method for channel-specific configuration in a readout ASIC |
| CN102016637A (zh) * | 2008-04-30 | 2011-04-13 | 皇家飞利浦电子股份有限公司 | 计数探测器 |
| WO2009141760A2 (en) | 2008-05-19 | 2009-11-26 | Koninklijke Philips Electronics N.V. | A photon detector with converter unit |
| JP5461547B2 (ja) * | 2008-07-07 | 2014-04-02 | コーニンクレッカ フィリップス エヌ ヴェ | Ｋ端イメージング |
| US20100316184A1 (en) * | 2008-10-17 | 2010-12-16 | Jan Iwanczyk | Silicon photomultiplier detector for computed tomography |
| US8198577B2 (en) | 2009-02-25 | 2012-06-12 | Caeleste Cvba | High dynamic range analog X-ray photon counting |
| US8384038B2 (en) | 2009-06-24 | 2013-02-26 | General Electric Company | Readout electronics for photon counting and energy discriminating detectors |
| JP2011085479A (ja) * | 2009-10-15 | 2011-04-28 | Tele Systems:Kk | 光子計数型放射線検出器のキャリブレーション装置及びそのキャリブレーション方法 |
| WO2011077302A2 (en) * | 2009-12-21 | 2011-06-30 | Koninklijke Philips Electronics N.V. | Radiation detector assembly with test circuitry |
| US8080780B2 (en) * | 2009-12-29 | 2011-12-20 | Kabushiki Kaisha Toshiba | Apparatus and associated methodology for improving timing resolution in gamma ray detection |
-
2012
- 2012-10-12 RU RU2014119870/28A patent/RU2594602C2/ru not_active IP Right Cessation
- 2012-10-12 JP JP2014536375A patent/JP2014530704A/ja not_active Ceased
- 2012-10-12 EP EP17187549.5A patent/EP3290959B1/en active Active
- 2012-10-12 EP EP12805762.7A patent/EP2745143B1/en active Active
- 2012-10-12 CN CN201280051041.2A patent/CN103890610B/zh active Active
- 2012-10-12 IN IN2540CHN2014 patent/IN2014CN02540A/en unknown
- 2012-10-12 US US14/350,370 patent/US9301378B2/en active Active
- 2012-10-12 WO PCT/IB2012/055554 patent/WO2013057645A2/en active Application Filing
Also Published As
| Publication number | Publication date |
|---|---|
| CN103890610A (zh) | 2014-06-25 |
| EP2745143A2 (en) | 2014-06-25 |
| WO2013057645A2 (en) | 2013-04-25 |
| US20140254749A1 (en) | 2014-09-11 |
| EP3290959B1 (en) | 2020-05-27 |
| RU2014119870A (ru) | 2015-11-27 |
| US9301378B2 (en) | 2016-03-29 |
| WO2013057645A3 (en) | 2014-03-06 |
| CN103890610B (zh) | 2017-08-29 |
| EP3290959A1 (en) | 2018-03-07 |
| EP2745143B1 (en) | 2019-04-03 |
| JP2014530704A (ja) | 2014-11-20 |
| RU2594602C2 (ru) | 2016-08-20 |
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