GB2501661A - X-ray inspection system and method - Google Patents

X-ray inspection system and method Download PDF

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Publication number
GB2501661A
GB2501661A GB1315125.3A GB201315125A GB2501661A GB 2501661 A GB2501661 A GB 2501661A GB 201315125 A GB201315125 A GB 201315125A GB 2501661 A GB2501661 A GB 2501661A
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GB
United Kingdom
Prior art keywords
under inspection
ray
object under
rays
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB1315125.3A
Other versions
GB2501661B (en
GB201315125D0 (en
Inventor
Edward James Morton
Francis Baldwin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rapiscan Systems Inc
Original Assignee
Rapiscan Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rapiscan Systems Inc filed Critical Rapiscan Systems Inc
Priority to GB1703232.7A priority Critical patent/GB2544687B/en
Publication of GB201315125D0 publication Critical patent/GB201315125D0/en
Publication of GB2501661A publication Critical patent/GB2501661A/en
Application granted granted Critical
Publication of GB2501661B publication Critical patent/GB2501661B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/423—Imaging multispectral imaging-multiple energy imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/501—Detectors array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/505—Detectors scintillation

Abstract

The present specification discloses an X-ray system for processing X-ray data to determine an identity of an object under inspection. The X-ray system includes an X-ray source for transmitting X-rays, where the X-rays have a range of energies, through the object, a detector array for detecting the transmitted X-rays, where each detector outputs a signal proportional to an amount of energy deposited at the detector by a detected X-ray, and at least one processor that reconstructs an image from the signal, where each pixel within the image represents an associated mass attenuation coefficient of the object under inspection at a specific point in space and for a specific energy level, fits each of pixel to a function to determine the mass attenuation coefficient of the object under inspection at the point in space; and uses the function to determine the identity of the object under inspection.
GB1315125.3A 2011-02-22 2011-02-22 X-ray inspection system and method Active GB2501661B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB1703232.7A GB2544687B (en) 2011-02-22 2011-02-22 X-ray inspection system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2011/025777 WO2012115629A1 (en) 2011-02-22 2011-02-22 X-ray inspection system and method

Publications (3)

Publication Number Publication Date
GB201315125D0 GB201315125D0 (en) 2013-10-09
GB2501661A true GB2501661A (en) 2013-10-30
GB2501661B GB2501661B (en) 2017-04-12

Family

ID=46721149

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1315125.3A Active GB2501661B (en) 2011-02-22 2011-02-22 X-ray inspection system and method

Country Status (3)

Country Link
EP (1) EP2678668A4 (en)
GB (1) GB2501661B (en)
WO (1) WO2012115629A1 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0525593D0 (en) 2005-12-16 2006-01-25 Cxr Ltd X-ray tomography inspection systems
US9113839B2 (en) 2003-04-25 2015-08-25 Rapiscon Systems, Inc. X-ray inspection system and method
US8243876B2 (en) 2003-04-25 2012-08-14 Rapiscan Systems, Inc. X-ray scanners
US8837669B2 (en) 2003-04-25 2014-09-16 Rapiscan Systems, Inc. X-ray scanning system
US7949101B2 (en) 2005-12-16 2011-05-24 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
US8451974B2 (en) 2003-04-25 2013-05-28 Rapiscan Systems, Inc. X-ray tomographic inspection system for the identification of specific target items
US8223919B2 (en) 2003-04-25 2012-07-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items
DE102012017872A1 (en) * 2012-09-06 2014-05-15 Technische Universität Dresden Method and device for the X-ray imaging of objects
DE102018133525A1 (en) * 2018-12-21 2020-06-25 Smiths Heimann Gmbh Dual energy detector and method for improving images generated therewith
CN117109494B (en) * 2023-10-23 2024-01-23 北京华力兴科技发展有限责任公司 Intelligent calibration method for X-ray thickness gauge

Citations (11)

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Publication number Priority date Publication date Assignee Title
US5838758A (en) * 1990-08-10 1998-11-17 Vivid Technologies Device and method for inspection of baggage and other objects
US20040017224A1 (en) * 2002-03-05 2004-01-29 Nova R & D, Inc. Integrated circuit and sensor for imaging
US20050111619A1 (en) * 2002-02-06 2005-05-26 L-3 Communications Security And Detection Systems Corporation Delaware Method and apparatus for target transmitting information about a target object between a prescanner and a CT scanner
US7224763B2 (en) * 2004-07-27 2007-05-29 Analogic Corporation Method of and system for X-ray spectral correction in multi-energy computed tomography
US20070242802A1 (en) * 2004-03-29 2007-10-18 Ehud Dafni Apparatus And Method Of Improved Angiographic Imaging
US7372934B2 (en) * 2005-12-22 2008-05-13 General Electric Company Method for performing image reconstruction using hybrid computed tomography detectors
US20090265386A1 (en) * 2007-08-30 2009-10-22 Itt Manufacturing Enterprises, Inc. Library Generation for Detection and Identification of Shielded Radioisotopes
US7636638B2 (en) * 2007-11-27 2009-12-22 Canberra Industries, Inc. Hybrid radiation detection system
US20100020934A1 (en) * 2005-12-16 2010-01-28 Edward James Morton X-Ray Scanners and X-Ray Sources Therefor
US7835495B2 (en) * 2008-10-31 2010-11-16 Morpho Detection, Inc. System and method for X-ray diffraction imaging
US20100329532A1 (en) * 2007-12-27 2010-12-30 Omron Corporation X-ray inspecting apparatus and x-ray inspecting method

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US5841832A (en) * 1991-02-13 1998-11-24 Lunar Corporation Dual-energy x-ray detector providing spatial and temporal interpolation
US6018562A (en) 1995-11-13 2000-01-25 The United States Of America As Represented By The Secretary Of The Army Apparatus and method for automatic recognition of concealed objects using multiple energy computed tomography
GB9914705D0 (en) * 1999-06-23 1999-08-25 Stereo Scan Systems Limited Castellated linear array scintillator system
WO2003052397A1 (en) * 2001-12-19 2003-06-26 Agresearch Limited A phantom
US7103137B2 (en) * 2002-07-24 2006-09-05 Varian Medical Systems Technology, Inc. Radiation scanning of objects for contraband
GB0309374D0 (en) 2003-04-25 2003-06-04 Cxr Ltd X-ray sources
GB0716045D0 (en) 2007-08-17 2007-09-26 Durham Scient Crystals Ltd Method and apparatus for inspection of materials
GB0807473D0 (en) * 2008-04-24 2008-12-03 Durham Scient Crystals Ltd Method and Apparatus for Inspection of Materials
US8111803B2 (en) * 2009-04-29 2012-02-07 General Electric Company Method for energy sensitive computed tomography using checkerboard filtering
EP2443441B8 (en) * 2009-06-15 2017-11-22 Optosecurity Inc. Method and apparatus for assessing the threat status of luggage

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5838758A (en) * 1990-08-10 1998-11-17 Vivid Technologies Device and method for inspection of baggage and other objects
US20050111619A1 (en) * 2002-02-06 2005-05-26 L-3 Communications Security And Detection Systems Corporation Delaware Method and apparatus for target transmitting information about a target object between a prescanner and a CT scanner
US20040017224A1 (en) * 2002-03-05 2004-01-29 Nova R & D, Inc. Integrated circuit and sensor for imaging
US20070242802A1 (en) * 2004-03-29 2007-10-18 Ehud Dafni Apparatus And Method Of Improved Angiographic Imaging
US7224763B2 (en) * 2004-07-27 2007-05-29 Analogic Corporation Method of and system for X-ray spectral correction in multi-energy computed tomography
US20100020934A1 (en) * 2005-12-16 2010-01-28 Edward James Morton X-Ray Scanners and X-Ray Sources Therefor
US7372934B2 (en) * 2005-12-22 2008-05-13 General Electric Company Method for performing image reconstruction using hybrid computed tomography detectors
US20090265386A1 (en) * 2007-08-30 2009-10-22 Itt Manufacturing Enterprises, Inc. Library Generation for Detection and Identification of Shielded Radioisotopes
US7636638B2 (en) * 2007-11-27 2009-12-22 Canberra Industries, Inc. Hybrid radiation detection system
US20100329532A1 (en) * 2007-12-27 2010-12-30 Omron Corporation X-ray inspecting apparatus and x-ray inspecting method
US7835495B2 (en) * 2008-10-31 2010-11-16 Morpho Detection, Inc. System and method for X-ray diffraction imaging

Also Published As

Publication number Publication date
EP2678668A1 (en) 2014-01-01
GB2501661B (en) 2017-04-12
WO2012115629A1 (en) 2012-08-30
GB201315125D0 (en) 2013-10-09
EP2678668A4 (en) 2017-04-05

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