IN2012DN00837A - - Google Patents

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Publication number
IN2012DN00837A
IN2012DN00837A IN837DEN2012A IN2012DN00837A IN 2012DN00837 A IN2012DN00837 A IN 2012DN00837A IN 837DEN2012 A IN837DEN2012 A IN 837DEN2012A IN 2012DN00837 A IN2012DN00837 A IN 2012DN00837A
Authority
IN
India
Prior art keywords
electron microscope
scanning electron
unit
main scanning
bottom plate
Prior art date
Application number
Other languages
English (en)
Inventor
Tomohisa Ohtaki
Masahiko Ajima
Sukehiro Ito
Mitsuru Onuma
Akira Omachi
Original Assignee
Hitachi High Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Tech Corp filed Critical Hitachi High Tech Corp
Publication of IN2012DN00837A publication Critical patent/IN2012DN00837A/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16FSPRINGS; SHOCK-ABSORBERS; MEANS FOR DAMPING VIBRATION
    • F16F15/00Suppression of vibrations in systems; Means or arrangements for avoiding or reducing out-of-balance forces, e.g. due to motion
    • F16F15/02Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems
    • F16F15/04Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems using elastic means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/16Vessels; Containers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/02Details
    • H01J2237/0216Means for avoiding or correcting vibration effects

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Vibration Prevention Devices (AREA)
  • Electron Sources, Ion Sources (AREA)
IN837DEN2012 2009-07-30 2010-07-20 IN2012DN00837A (enrdf_load_stackoverflow)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2009177196 2009-07-30
PCT/JP2010/004636 WO2011013323A1 (ja) 2009-07-30 2010-07-20 走査電子顕微鏡

Publications (1)

Publication Number Publication Date
IN2012DN00837A true IN2012DN00837A (enrdf_load_stackoverflow) 2015-06-26

Family

ID=43528997

Family Applications (1)

Application Number Title Priority Date Filing Date
IN837DEN2012 IN2012DN00837A (enrdf_load_stackoverflow) 2009-07-30 2010-07-20

Country Status (7)

Country Link
US (1) US8809782B2 (enrdf_load_stackoverflow)
JP (1) JP5241922B2 (enrdf_load_stackoverflow)
KR (1) KR101364289B1 (enrdf_load_stackoverflow)
CN (1) CN102473577B (enrdf_load_stackoverflow)
DE (1) DE112010003102B4 (enrdf_load_stackoverflow)
IN (1) IN2012DN00837A (enrdf_load_stackoverflow)
WO (1) WO2011013323A1 (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10008361B2 (en) 2015-04-28 2018-06-26 Hitachi High-Technologies Corporation Charged particle beam device and installation method
JP6633986B2 (ja) 2016-07-20 2020-01-22 株式会社日立ハイテクノロジーズ 荷電粒子線装置

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2106378C3 (de) * 1971-02-05 1974-06-20 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V., 3400 Goettingen Korpuskularstrahlmikroskop, insbesondere Elektronenmikroskop, mit einem schwingungsfähigen Fundament
GB1400389A (en) * 1971-06-23 1975-07-16 Ass Elect Ind Arrangements for supporting a mass with vibration isolation
DE2540594C2 (de) * 1975-09-09 1977-11-03 Siemens AG, 1000 Berlin und 8000 München Korpuskularstrahlmikroskop, insbesondere Elektronenmikroskop, mit einem schwingungsgedämpften Sockel
JPS611U (ja) 1984-06-06 1986-01-06 フジタ工業株式会社 埋め込み金物測定ゲ−ジ
JPH0624124Y2 (ja) * 1989-06-09 1994-06-22 日本電子株式会社 走査電子顕微鏡
JPH0845462A (ja) * 1994-07-27 1996-02-16 Topcon Corp 搬送装置を備えた走査型電子顕微鏡
US5559329A (en) * 1994-08-31 1996-09-24 Touchstone Research Laboratory, Ltd. Scanning electron microscope fiber push-out apparatus and method
DE69631362T2 (de) * 1995-10-04 2004-11-04 Ebara Corp. Vorrichtung zur Schwingungsdämpfung
WO1999034418A1 (fr) * 1997-12-26 1999-07-08 Nikon Corporation Appareil d'exposition, procede pour produire cet appareil, et methode d'exposition, ainsi que dispositif et procede pour fabriquer ce dispositif
US6246190B1 (en) * 1999-07-30 2001-06-12 Etec Systems, Inc. Integrated electron gun and electronics module
JP2004176851A (ja) * 2002-11-28 2004-06-24 Fujikura Rubber Ltd 除振台
JP2004253374A (ja) 2003-01-28 2004-09-09 Hitachi Ltd 電子顕微鏡
CN1518049A (zh) * 2003-01-28 2004-08-04 ������������ʽ���� 电子显微镜
JP2005010059A (ja) 2003-06-20 2005-01-13 Jeol Ltd 走査形プローブ顕微鏡
JP2005077498A (ja) 2003-08-28 2005-03-24 Ricoh Co Ltd 画像形成装置
JP2006079870A (ja) * 2004-09-08 2006-03-23 Hitachi High-Technologies Corp 荷電粒子線装置

Also Published As

Publication number Publication date
JPWO2011013323A1 (ja) 2013-01-07
KR20120047923A (ko) 2012-05-14
US20120127299A1 (en) 2012-05-24
DE112010003102T5 (de) 2012-10-04
WO2011013323A1 (ja) 2011-02-03
KR101364289B1 (ko) 2014-02-18
JP5241922B2 (ja) 2013-07-17
CN102473577A (zh) 2012-05-23
CN102473577B (zh) 2015-05-06
US8809782B2 (en) 2014-08-19
DE112010003102B4 (de) 2019-11-28

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