IL276058A - Automatic checking and smooth registration - Google Patents

Automatic checking and smooth registration

Info

Publication number
IL276058A
IL276058A IL276058A IL27605820A IL276058A IL 276058 A IL276058 A IL 276058A IL 276058 A IL276058 A IL 276058A IL 27605820 A IL27605820 A IL 27605820A IL 276058 A IL276058 A IL 276058A
Authority
IL
Israel
Prior art keywords
automated inspection
enrollment
part enrollment
automated
inspection
Prior art date
Application number
IL276058A
Other languages
English (en)
Hebrew (he)
Original Assignee
Kitov Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kitov Systems Ltd filed Critical Kitov Systems Ltd
Publication of IL276058A publication Critical patent/IL276058A/en

Links

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Program-control systems
    • G05B19/02Program-control systems electric
    • G05B19/18Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form
    • G05B19/401Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form characterised by control arrangements for measuring, e.g. calibration and initialisation, measuring workpiece for machining purposes
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Program-control systems
    • G05B19/02Program-control systems electric
    • G05B19/18Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form
    • G05B19/4097Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form characterised by using design data to control NC machines, e.g. CAD/CAM
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00General purpose image data processing
    • G06T1/20Processor architectures; Processor configuration, e.g. pipelining
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00General purpose image data processing
    • G06T1/60Memory management
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/35Nc in input of data, input till input file format
    • G05B2219/35216Program, generate nc program, code from cad data
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/37Measurements
    • G05B2219/37205Compare measured, vision data with computer model, cad data
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/37Measurements
    • G05B2219/37439Computer assisted inspection, cad interactive with manual commands
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/37Measurements
    • G05B2219/37443Program cmm, coordinate measuring machine, use cad data
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/37Measurements
    • G05B2219/37452Generate nc program from metrology program, defining cmm probe path
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Manufacturing & Machinery (AREA)
  • Automation & Control Theory (AREA)
  • Human Computer Interaction (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • General Factory Administration (AREA)
IL276058A 2018-01-15 2020-07-15 Automatic checking and smooth registration IL276058A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201862617312P 2018-01-15 2018-01-15
PCT/US2019/013720 WO2019156783A1 (en) 2018-01-15 2019-01-15 Automated inspection and part enrollment

Publications (1)

Publication Number Publication Date
IL276058A true IL276058A (en) 2020-08-31

Family

ID=67549747

Family Applications (1)

Application Number Title Priority Date Filing Date
IL276058A IL276058A (en) 2018-01-15 2020-07-15 Automatic checking and smooth registration

Country Status (6)

Country Link
US (1) US12347090B2 (https=)
EP (1) EP3740948B1 (https=)
JP (2) JP7692700B2 (https=)
CN (1) CN112585672A (https=)
IL (1) IL276058A (https=)
WO (1) WO2019156783A1 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10811290B2 (en) * 2018-05-23 2020-10-20 Taiwan Semiconductor Manufacturing Co., Ltd. Systems and methods for inspection stations
JP7802764B2 (ja) 2020-08-05 2026-01-20 キトフ システムズ リミテッド コンポーネント間の検査要件の設計符号化
IL301729A (en) * 2020-09-29 2023-05-01 Kitov Systems Ltd Semantic segmentation of inspection targets
US20240020655A1 (en) * 2022-07-15 2024-01-18 Onpoint Group, Llc Method and system for tracking assets
CN115752346A (zh) * 2022-11-23 2023-03-07 中国第一汽车股份有限公司 一种配合零件和待检查零件间配合状态的检查系统、方法、设备、存储介质以及汽车
US12579775B2 (en) * 2023-06-20 2026-03-17 International Business Machines Corporation Image processing using datum identification and machine learning algorithms
WO2025195902A1 (en) 2024-03-20 2025-09-25 Lem Surgical Ag Methods and apparatus for validation and modeling of robotic surgical tools

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* Cited by examiner, † Cited by third party
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JP3360969B2 (ja) * 1995-04-28 2003-01-07 株式会社東芝 プラント点検支援装置
JPH09304286A (ja) 1996-05-21 1997-11-28 Canon Inc 欠陥検出処理装置及び方法
JP3015325B2 (ja) 1996-06-26 2000-03-06 東芝エンジニアリング株式会社 スジキズ検査方法及びその装置
JP2002008013A (ja) 2000-06-27 2002-01-11 Matsushita Electric Works Ltd 外観検査プログラム作成装置およびその方法
GB0210990D0 (en) * 2002-05-14 2002-06-19 Rolls Royce Plc Method of generating an inspection program and method of generating a visual display
DE102004007829B4 (de) * 2004-02-18 2007-04-05 Isra Vision Systems Ag Verfahren zur Bestimmung von zu inspizierenden Bereichen
JP4266946B2 (ja) * 2005-03-17 2009-05-27 ファナック株式会社 オフライン教示装置
US7337651B2 (en) * 2005-04-05 2008-03-04 General Electric Company Method for performing model based scanplan generation of a component under inspection
US9363487B2 (en) * 2005-09-08 2016-06-07 Avigilon Fortress Corporation Scanning camera-based video surveillance system
DE102009029061A1 (de) * 2008-09-05 2010-03-11 Mori Seiki Co., Ltd., Yamatokoriyama-shi Verfahren und Vorrichtung zur Bearbeitungszustandsprüfung
CN103380057B (zh) * 2010-09-29 2016-10-05 航空机器股份有限公司 飞机的无损检测的创新系统和方法
US20130203320A1 (en) * 2012-02-06 2013-08-08 Hamid R. Ghalambor Methods and Systems for Sensor-Based Deburring
US20130278725A1 (en) * 2012-04-24 2013-10-24 Connecticut Center for Advanced Technology, Inc. Integrated Structured Light 3D Scanner
US20140293047A1 (en) * 2013-04-02 2014-10-02 Caterpillar Inc. System for generating overhead view of machine
JP6415026B2 (ja) * 2013-06-28 2018-10-31 キヤノン株式会社 干渉判定装置、干渉判定方法、コンピュータプログラム
US9187188B2 (en) * 2013-07-02 2015-11-17 Premium Aerotec Gmbh Assembly inspection system and method
US9639083B2 (en) * 2013-12-18 2017-05-02 Mitutoyo Corporation System and method for programming workpiece feature inspection operations for a coordinate measuring machine
US9441936B2 (en) * 2014-07-29 2016-09-13 Plethora Corporation System and method for automated object measurement
EP3180583A4 (en) * 2014-08-12 2018-06-06 Mectron Engineering Company Inc. Video parts inspection system
CN107408297B (zh) 2014-11-24 2021-02-02 基托夫系统有限公司 自动检查
US11185985B2 (en) * 2015-01-05 2021-11-30 Bell Helicopter Textron Inc. Inspecting components using mobile robotic inspection systems
EP3292060B1 (en) * 2015-05-04 2025-12-17 Mitutoyo Corporation Inspection program editing environment providing user defined collision avoidance volumes
US11520472B2 (en) * 2015-09-24 2022-12-06 Mitutoyo Corporation Inspection program editing environment including integrated alignment program planning and editing features
US10018465B2 (en) * 2015-09-25 2018-07-10 General Electric Company Inspection path display
JP2017194334A (ja) 2016-04-20 2017-10-26 株式会社リコー 検査装置、検査方法及び検査プログラム
JP6356845B1 (ja) * 2017-02-13 2018-07-11 ファナック株式会社 検査システムの動作プログラムを生成する装置および方法
JP6626057B2 (ja) * 2017-09-27 2019-12-25 ファナック株式会社 検査装置及び検査システム

Also Published As

Publication number Publication date
JP2024026316A (ja) 2024-02-28
US20210082105A1 (en) 2021-03-18
EP3740948A1 (en) 2020-11-25
JP7692700B2 (ja) 2025-06-16
JP2021511594A (ja) 2021-05-06
EP3740948B1 (en) 2025-09-03
EP3740948A4 (en) 2021-10-27
CN112585672A (zh) 2021-03-30
WO2019156783A1 (en) 2019-08-15
US12347090B2 (en) 2025-07-01

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