IL199202A - Non-destructive inspection using laser-ultrasound and infrared thermography - Google Patents

Non-destructive inspection using laser-ultrasound and infrared thermography

Info

Publication number
IL199202A
IL199202A IL199202A IL19920209A IL199202A IL 199202 A IL199202 A IL 199202A IL 199202 A IL199202 A IL 199202A IL 19920209 A IL19920209 A IL 19920209A IL 199202 A IL199202 A IL 199202A
Authority
IL
Israel
Prior art keywords
ultrasound
laser
destructive inspection
infrared thermography
thermography
Prior art date
Application number
IL199202A
Other languages
Hebrew (he)
Original Assignee
Lockheed Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lockheed Corp filed Critical Lockheed Corp
Publication of IL199202A publication Critical patent/IL199202A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/228—Details, e.g. general constructional or apparatus details related to high temperature conditions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G01N2021/1706—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids in solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/8472—Investigation of composite materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0696—Pulsed
    • G01N2201/0697—Pulsed lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids
    • G01N2291/0231—Composite or layered materials

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Optics & Photonics (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Radiation Pyrometers (AREA)
IL199202A 2007-12-06 2009-06-04 Non-destructive inspection using laser-ultrasound and infrared thermography IL199202A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2007/025228 WO2009073014A1 (en) 2007-12-06 2007-12-06 Non-destructive inspection using laser- ultrasound and infrared thermography

Publications (1)

Publication Number Publication Date
IL199202A true IL199202A (en) 2013-04-30

Family

ID=39327481

Family Applications (1)

Application Number Title Priority Date Filing Date
IL199202A IL199202A (en) 2007-12-06 2009-06-04 Non-destructive inspection using laser-ultrasound and infrared thermography

Country Status (9)

Country Link
EP (1) EP2217908A1 (en)
JP (1) JP5307155B2 (en)
KR (1) KR101380491B1 (en)
CN (1) CN101889194B (en)
AU (1) AU2007361989B2 (en)
BR (1) BRPI0719944A2 (en)
CA (1) CA2672378A1 (en)
IL (1) IL199202A (en)
WO (1) WO2009073014A1 (en)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102735615A (en) * 2011-04-08 2012-10-17 中国科学院光电研究院 Laser ultrasonic detection device
FR2981450B1 (en) * 2011-10-17 2014-06-06 Eads Europ Aeronautic Defence SYSTEM AND METHOD FOR CONTROLLING THE QUALITY OF AN OBJECT
CN102621185B (en) * 2012-03-29 2014-04-30 冯辅周 Ultrasonic pulse excitation device with controllable parameters
JP2015132475A (en) * 2014-01-09 2015-07-23 学校法人東北学院 Electronic scanning-type light source scanning apparatus and method
US9500599B2 (en) 2014-01-23 2016-11-22 Samsung Electronics Co., Ltd. Surface inspection apparatus for semiconductor chips
FR3020678B1 (en) * 2014-04-30 2021-06-25 Areva Np PHOTOTHERMAL EXAMINATION PROCESS AND CORRESPONDING EXAMINATION SET
JP6304880B2 (en) 2014-06-17 2018-04-04 株式会社Ihi Nondestructive inspection equipment
JP2016007256A (en) * 2014-06-23 2016-01-18 株式会社東芝 Photoacoustic measuring device and photoacoustic measuring method
KR101611726B1 (en) 2014-09-11 2016-04-14 한국표준과학연구원 Nondestructive infrared thermography system and inspection method using thermal expansion
CN104237381A (en) * 2014-10-15 2014-12-24 北京新联铁科技股份有限公司 Steel rail flaw-detection method based on laser ultrasonic and high-speed photography image fusion
US9995670B2 (en) * 2015-12-09 2018-06-12 The Boeing Company Method of controlling a laser bond inspection system
CN105628739A (en) * 2015-12-25 2016-06-01 黑龙江科技大学 Robot laser infrared nondestructive testing device for large workpiece and flaw detection method
FR3053469B1 (en) * 2016-06-30 2018-08-17 Areva Np METHOD FOR INSPECTING A METAL SURFACE AND DEVICE THEREFOR
CN106768466B (en) * 2016-11-16 2019-03-29 石友安 A kind of transient state based on ultrasound turn twists the lossless detection method of hot-fluid
US10241036B2 (en) * 2017-05-08 2019-03-26 Siemens Energy, Inc. Laser thermography
CN107356674A (en) * 2017-08-17 2017-11-17 福建省永正工程质量检测有限公司 A kind of construction steel structure supersonic detection device
CN108333219A (en) * 2018-03-19 2018-07-27 长沙理工大学 A kind of online lossless detection method for band large-scale metal component laser gain material manufacturing process
CN108444936B (en) * 2018-03-27 2020-05-22 重庆交通大学 Nondestructive testing system and method for concrete filled steel tube void
KR102110399B1 (en) * 2018-06-19 2020-05-13 전주대학교 산학협력단 Method for compensating the infrared deterioration to measure internal or surface defects of the subject body
KR102283337B1 (en) * 2019-05-13 2021-07-29 단국대학교 산학협력단 Method of detecting Defect by using Plasmonic Effect
US11402356B2 (en) * 2019-12-12 2022-08-02 Provenance Laboratories LLC Object identification system and method
FR3106662B1 (en) 2020-01-24 2022-04-15 Centre Nat Rech Scient METHOD AND SELECTIVE SYSTEM FOR NON-DESTRUCTIVE TESTING OF A MECHANICAL PART
CN111426919A (en) * 2020-04-08 2020-07-17 国网山西省电力公司电力科学研究院 Basin-type insulator detection device based on laser-induced ultrasound
CN111982966B (en) * 2020-08-11 2023-10-31 深圳大学 Rail structure nondestructive and temperature detection device
CN112881427B (en) * 2021-01-13 2023-06-13 四川宇然智荟科技有限公司 Electronic component defect detection device and method based on visible light and infrared thermal imaging
CN113325027B (en) * 2021-08-02 2021-09-28 西南交通大学 Method for measuring unfrozen water content of frozen soil by piezoelectric ceramic
CN113866219A (en) * 2021-08-30 2021-12-31 东南大学 Ultrasonic infrared thermal imaging detection method and system for microcracks of gas cylinder liner
CN114414658B (en) * 2022-01-11 2024-04-09 南京大学 Laser ultrasonic detection method for depth of microcracks on metal surface
CN117571712B (en) * 2023-08-17 2024-07-16 哈尔滨工业大学 Mixed laser-induced ultrasonic infrared multi-field imaging detection device and method for reusing multi-type cross-scale damage of spacecraft

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62129741A (en) * 1985-12-02 1987-06-12 Hitachi Ltd Photoacoustic analysis method and apparatus
JPH0718797B2 (en) * 1987-05-01 1995-03-06 株式会社日立製作所 Local stress distribution measuring device
JPH08285820A (en) * 1995-04-17 1996-11-01 Nippon Steel Corp Laser-ultrasonic inspection apparatus
CN2279605Y (en) * 1996-11-27 1998-04-22 北方交通大学 Pulse type heating device for infrared imaging nondestructive inspection
US6367969B1 (en) * 1999-07-21 2002-04-09 General Electric Company Synthetic reference thermal imaging method
GB9921970D0 (en) * 1999-09-16 1999-11-17 Univ London An optical interferometer sensor array
US6696692B1 (en) * 2000-11-06 2004-02-24 Hrl Laboratories, Llc Process control methods for use with e-beam fabrication technology
US6880387B2 (en) * 2001-08-22 2005-04-19 Sonoscan, Inc. Acoustic micro imaging method providing improved information derivation and visualization
US6698288B2 (en) * 2001-12-06 2004-03-02 General Electric Company Method and system for assembling and nondestructive testing of assemblies with composite components
EP1582867B1 (en) * 2002-08-28 2012-05-23 Siemens Energy, Inc. System and method for multi-frequency sonic excitation in infrared imaging
CN100491970C (en) * 2003-05-23 2009-05-27 首都师范大学 Infrared heat wave detecting system with THZ wave as light source
JP2006170684A (en) * 2004-12-14 2006-06-29 Toyota Motor Corp Method and device for inspecting press failure
US7612894B2 (en) 2006-07-18 2009-11-03 Lockheed Martin Corporation Fiber laser for ultrasonic testing
US7605924B2 (en) * 2006-12-06 2009-10-20 Lockheed Martin Corporation Laser-ultrasound inspection using infrared thermography

Also Published As

Publication number Publication date
KR101380491B1 (en) 2014-04-01
JP5307155B2 (en) 2013-10-02
BRPI0719944A2 (en) 2014-06-10
KR20100099040A (en) 2010-09-10
CN101889194A (en) 2010-11-17
CN101889194B (en) 2014-06-18
AU2007361989A1 (en) 2009-06-11
WO2009073014A1 (en) 2009-06-11
JP2011506927A (en) 2011-03-03
CA2672378A1 (en) 2009-06-11
AU2007361989B2 (en) 2013-10-03
EP2217908A1 (en) 2010-08-18

Similar Documents

Publication Publication Date Title
IL199202A (en) Non-destructive inspection using laser-ultrasound and infrared thermography
TWI368035B (en) Probe device and inspection apparatus
GB0613165D0 (en) Real-time infrared measurement and imaging system
EP2158461A4 (en) Electric-field-enhancement structure and detection apparatus using same
EP2244629A4 (en) Whole body infrared thermography systems and methods
EP2357466A4 (en) Infrared thermal image analyzer
GB2456698B (en) Remote nondestructive inspection systems and methods
TWI370250B (en) Probe assembly and inspection apparatus
IL201599A0 (en) Curved sensor array apparatus and methods
EP2240926A4 (en) Image manipulation and processing techniques for remote inspection device
GB0724630D0 (en) Temperature sensor and method for measuring temperature
EP1959274A4 (en) Radiation detecting unit and radiation inspecting apparatus
GB2454155B (en) Differential scanning calorimeter sensor and method
EP2159569A4 (en) Apparatus for transferring subject to be inspected and appearance inspecting apparatus
EP2135049A4 (en) Sensor for thermal analysis and systems including same
EP2115427A4 (en) Methods and apparatus for the non-destructive detection of variations in a sample
EP2120446A4 (en) Image processing method and image inspecting method
EP2129287A4 (en) Foldable sensor device and method of using same
EP2022735A4 (en) Transfer apparatus and transfer object inspecting apparatus
GB0606346D0 (en) Preconcentrator and detector apparatus
GB0807251D0 (en) Thermal switch calibration apparatus and methods
EP2382787A4 (en) Imaging element and imaging apparatus using the same
GB0701641D0 (en) Analyte manipulation and detection
GB0803798D0 (en) Spectroscopic apparatus and methods
EP2015108A4 (en) Radiation detector and radiation inspecting apparatus

Legal Events

Date Code Title Description
FF Patent granted
KB Patent renewed
MM9K Patent not in force due to non-payment of renewal fees