BRPI0719944A2 - NON-DESTRUCTIVE INSPECTION USING LASER THERMOGRAPHY - ULTRASOUND AND INFRARED - Google Patents

NON-DESTRUCTIVE INSPECTION USING LASER THERMOGRAPHY - ULTRASOUND AND INFRARED

Info

Publication number
BRPI0719944A2
BRPI0719944A2 BRPI0719944-9A2A BRPI0719944A BRPI0719944A2 BR PI0719944 A2 BRPI0719944 A2 BR PI0719944A2 BR PI0719944 A BRPI0719944 A BR PI0719944A BR PI0719944 A2 BRPI0719944 A2 BR PI0719944A2
Authority
BR
Brazil
Prior art keywords
ultrasound
infrared
destructive inspection
thermography
laser
Prior art date
Application number
BRPI0719944-9A2A
Other languages
Portuguese (pt)
Inventor
Peter William Lorraine
Donald Robert Howard
Henry Israel Ringermacher
Marc Dubois
William Peter Drake
Original Assignee
Lockheed Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lockheed Corp filed Critical Lockheed Corp
Publication of BRPI0719944A2 publication Critical patent/BRPI0719944A2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/228—Details, e.g. general constructional or apparatus details related to high temperature conditions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G01N2021/1706—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids in solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/8472—Investigation of composite materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0696—Pulsed
    • G01N2201/0697—Pulsed lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids
    • G01N2291/0231—Composite or layered materials

Landscapes

  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Acoustics & Sound (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Radiation Pyrometers (AREA)
BRPI0719944-9A2A 2007-12-06 2007-12-06 NON-DESTRUCTIVE INSPECTION USING LASER THERMOGRAPHY - ULTRASOUND AND INFRARED BRPI0719944A2 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2007/025228 WO2009073014A1 (en) 2007-12-06 2007-12-06 Non-destructive inspection using laser- ultrasound and infrared thermography

Publications (1)

Publication Number Publication Date
BRPI0719944A2 true BRPI0719944A2 (en) 2014-06-10

Family

ID=39327481

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0719944-9A2A BRPI0719944A2 (en) 2007-12-06 2007-12-06 NON-DESTRUCTIVE INSPECTION USING LASER THERMOGRAPHY - ULTRASOUND AND INFRARED

Country Status (9)

Country Link
EP (1) EP2217908A1 (en)
JP (1) JP5307155B2 (en)
KR (1) KR101380491B1 (en)
CN (1) CN101889194B (en)
AU (1) AU2007361989B2 (en)
BR (1) BRPI0719944A2 (en)
CA (1) CA2672378A1 (en)
IL (1) IL199202A (en)
WO (1) WO2009073014A1 (en)

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CN102735615A (en) * 2011-04-08 2012-10-17 中国科学院光电研究院 Laser ultrasonic detection device
FR2981450B1 (en) * 2011-10-17 2014-06-06 Eads Europ Aeronautic Defence SYSTEM AND METHOD FOR CONTROLLING THE QUALITY OF AN OBJECT
CN102621185B (en) * 2012-03-29 2014-04-30 冯辅周 Ultrasonic pulse excitation device with controllable parameters
JP2015132475A (en) * 2014-01-09 2015-07-23 学校法人東北学院 Electronic scanning-type light source scanning apparatus and method
KR102399493B1 (en) 2014-01-23 2022-05-19 삼성전자주식회사 Surface inspection apparatus for semiconductor chips and method of inspecting surfaces of semiconductor chips using the same
FR3020678B1 (en) * 2014-04-30 2021-06-25 Areva Np PHOTOTHERMAL EXAMINATION PROCESS AND CORRESPONDING EXAMINATION SET
JP6304880B2 (en) 2014-06-17 2018-04-04 株式会社Ihi Nondestructive inspection equipment
JP2016007256A (en) * 2014-06-23 2016-01-18 株式会社東芝 Photoacoustic measuring device and photoacoustic measuring method
KR101611726B1 (en) 2014-09-11 2016-04-14 한국표준과학연구원 Nondestructive infrared thermography system and inspection method using thermal expansion
CN104237381A (en) * 2014-10-15 2014-12-24 北京新联铁科技股份有限公司 Steel rail flaw-detection method based on laser ultrasonic and high-speed photography image fusion
US9995670B2 (en) * 2015-12-09 2018-06-12 The Boeing Company Method of controlling a laser bond inspection system
CN105628739A (en) * 2015-12-25 2016-06-01 黑龙江科技大学 Robot laser infrared nondestructive testing device for large workpiece and flaw detection method
FR3053469B1 (en) * 2016-06-30 2018-08-17 Areva Np METHOD FOR INSPECTING A METAL SURFACE AND DEVICE THEREFOR
CN106768466B (en) * 2016-11-16 2019-03-29 石友安 A kind of transient state based on ultrasound turn twists the lossless detection method of hot-fluid
US10241036B2 (en) * 2017-05-08 2019-03-26 Siemens Energy, Inc. Laser thermography
CN107356674A (en) * 2017-08-17 2017-11-17 福建省永正工程质量检测有限公司 A kind of construction steel structure supersonic detection device
CN108333219A (en) * 2018-03-19 2018-07-27 长沙理工大学 A kind of online lossless detection method for band large-scale metal component laser gain material manufacturing process
CN108444936B (en) * 2018-03-27 2020-05-22 重庆交通大学 Nondestructive testing system and method for concrete filled steel tube void
KR102110399B1 (en) * 2018-06-19 2020-05-13 전주대학교 산학협력단 Method for compensating the infrared deterioration to measure internal or surface defects of the subject body
KR102283337B1 (en) * 2019-05-13 2021-07-29 단국대학교 산학협력단 Method of detecting Defect by using Plasmonic Effect
US11402356B2 (en) * 2019-12-12 2022-08-02 Provenance Laboratories LLC Object identification system and method
FR3106662B1 (en) 2020-01-24 2022-04-15 Centre Nat Rech Scient METHOD AND SELECTIVE SYSTEM FOR NON-DESTRUCTIVE TESTING OF A MECHANICAL PART
CN111426919A (en) * 2020-04-08 2020-07-17 国网山西省电力公司电力科学研究院 Basin-type insulator detection device based on laser-induced ultrasound
CN111982966B (en) * 2020-08-11 2023-10-31 深圳大学 Rail structure nondestructive and temperature detection device
CN112881427B (en) * 2021-01-13 2023-06-13 四川宇然智荟科技有限公司 Electronic component defect detection device and method based on visible light and infrared thermal imaging
CN113325027B (en) * 2021-08-02 2021-09-28 西南交通大学 Method for measuring unfrozen water content of frozen soil by piezoelectric ceramic
CN113866219A (en) * 2021-08-30 2021-12-31 东南大学 Ultrasonic infrared thermal imaging detection method and system for microcracks of gas cylinder liner
CN114414658B (en) * 2022-01-11 2024-04-09 南京大学 Laser ultrasonic detection method for depth of microcracks on metal surface
CN117571712B (en) * 2023-08-17 2024-07-16 哈尔滨工业大学 Mixed laser-induced ultrasonic infrared multi-field imaging detection device and method for reusing multi-type cross-scale damage of spacecraft

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Also Published As

Publication number Publication date
AU2007361989A1 (en) 2009-06-11
KR101380491B1 (en) 2014-04-01
IL199202A (en) 2013-04-30
AU2007361989B2 (en) 2013-10-03
EP2217908A1 (en) 2010-08-18
CA2672378A1 (en) 2009-06-11
JP5307155B2 (en) 2013-10-02
CN101889194A (en) 2010-11-17
WO2009073014A1 (en) 2009-06-11
CN101889194B (en) 2014-06-18
KR20100099040A (en) 2010-09-10
JP2011506927A (en) 2011-03-03

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Legal Events

Date Code Title Description
B07A Application suspended after technical examination (opinion) [chapter 7.1 patent gazette]
B09B Patent application refused [chapter 9.2 patent gazette]
B09B Patent application refused [chapter 9.2 patent gazette]

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