IL132097A0 - Impedance-to-voltage converter and converting method - Google Patents

Impedance-to-voltage converter and converting method

Info

Publication number
IL132097A0
IL132097A0 IL13209799A IL13209799A IL132097A0 IL 132097 A0 IL132097 A0 IL 132097A0 IL 13209799 A IL13209799 A IL 13209799A IL 13209799 A IL13209799 A IL 13209799A IL 132097 A0 IL132097 A0 IL 132097A0
Authority
IL
Israel
Prior art keywords
impedance
voltage converter
converting method
converting
converter
Prior art date
Application number
IL13209799A
Other languages
English (en)
Original Assignee
Sumitomo Metal Ind
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Ind filed Critical Sumitomo Metal Ind
Publication of IL132097A0 publication Critical patent/IL132097A0/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Amplifiers (AREA)
  • Networks Using Active Elements (AREA)
  • Measurement Of Current Or Voltage (AREA)
IL13209799A 1998-02-05 1999-01-22 Impedance-to-voltage converter and converting method IL132097A0 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2438498 1998-02-05
PCT/JP1999/000230 WO1999040447A1 (en) 1998-02-05 1999-01-22 Impedance-to-voltage converter and converting method

Publications (1)

Publication Number Publication Date
IL132097A0 true IL132097A0 (en) 2001-03-19

Family

ID=12136697

Family Applications (1)

Application Number Title Priority Date Filing Date
IL13209799A IL132097A0 (en) 1998-02-05 1999-01-22 Impedance-to-voltage converter and converting method

Country Status (12)

Country Link
US (1) US6194888B1 (xx)
EP (1) EP0972205B1 (xx)
JP (1) JP3469586B2 (xx)
KR (1) KR100341966B1 (xx)
CN (1) CN1211666C (xx)
AU (1) AU725099B2 (xx)
DE (1) DE69934359T2 (xx)
DK (1) DK0972205T3 (xx)
IL (1) IL132097A0 (xx)
MY (1) MY123446A (xx)
TW (1) TW417019B (xx)
WO (1) WO1999040447A1 (xx)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW546480B (en) * 2000-03-07 2003-08-11 Sumitomo Metal Ind Circuit, apparatus and method for inspecting impedance
JP4488400B2 (ja) * 2001-05-29 2010-06-23 東京エレクトロン株式会社 インピーダンス検出回路
TWI221196B (en) * 2001-09-06 2004-09-21 Tokyo Electron Ltd Impedance measuring circuit, its method, and electrostatic capacitance measuring circuit
EP1576611B1 (en) * 2002-12-18 2012-11-28 Crocus Technology, Inc. Tamper-resistant i.c. packaging and approach
CN100523835C (zh) * 2004-05-12 2009-08-05 精工电子有限公司 电容-电压转换电路
JP5502597B2 (ja) * 2010-05-24 2014-05-28 ルネサスエレクトロニクス株式会社 インピーダンス検出回路およびインピーダンス検出方法
CN105004259B (zh) * 2015-07-31 2018-11-02 华南理工大学 一种电容式mems传感器检测电路
WO2019196116A1 (zh) * 2018-04-13 2019-10-17 深圳市汇顶科技股份有限公司 触摸检测芯片、触摸屏的检测方法
US11050348B2 (en) * 2018-11-09 2021-06-29 Rohm Co., Ltd. Semiconductor device
CN112394226A (zh) * 2019-08-16 2021-02-23 Oppo广东移动通信有限公司 信号检测电路和电子设备
CN111708463A (zh) * 2020-06-29 2020-09-25 广州华欣电子科技有限公司 一种混合信号处理装置

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5425381A (en) 1977-07-27 1979-02-26 Matsushita Electric Ind Co Ltd Home-use electric appliance
GB2020816B (en) 1977-08-09 1983-02-02 Micro Sensors Inc Capacitive measuring system with automatic calibration means
US4473796A (en) 1981-03-02 1984-09-25 Ford Aerospace & Communications Corporation Resistance and capacitance measuring device
CH652215A5 (de) 1981-05-18 1985-10-31 Novasina Ag Verfahren und schaltungsanordnung zur messung der impedanz eines sensors.
DE3413849C2 (de) 1984-02-21 1986-07-10 Dietrich 8891 Obergriesbach Lüderitz Kapazitäts-Meßgerät
FR2576421B1 (fr) 1985-01-22 1987-02-13 Renault Transducteur capacite-frequence notamment pour capteurs capacitifs
US4918376A (en) 1989-03-07 1990-04-17 Ade Corporation A.C. capacitive gauging system
DE4135991C1 (en) 1990-12-06 1992-12-17 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung Ev, 8000 Muenchen, De Capacitance-frequency converter producing rectangular pulse train signal - has two changeover switches connected to respective plates of capacitor for connection to different potentials
JP3262819B2 (ja) 1991-10-28 2002-03-04 アジレント・テクノロジー株式会社 接触判定回路を備えるインピーダンス測定装置及びその接触判定方法
JPH06180336A (ja) 1992-12-14 1994-06-28 Nippondenso Co Ltd 静電容量式物理量検出装置
JP2613358B2 (ja) 1994-02-17 1997-05-28 ティーディーケイ株式会社 湿度センサ
US5701101A (en) * 1995-03-20 1997-12-23 The United States Of America As Represented By The Secretary Of The Navy Charge amplifier for blast gauges
JPH09280806A (ja) * 1996-04-09 1997-10-31 Nissan Motor Co Ltd 静電容量式変位計
JP3851375B2 (ja) 1996-04-18 2006-11-29 アジレント・テクノロジーズ・インク インピーダンス測定装置
US5808516A (en) * 1996-06-28 1998-09-15 Harris Corporation Linearization of voltage-controlled amplifier using MOSFET gain control circuit
JP3930586B2 (ja) 1996-07-26 2007-06-13 アジレント・テクノロジーズ・インク インピーダンス測定装置の帰還ループ安定化方法
KR100621979B1 (ko) 2004-03-22 2006-09-14 볼보 컨스트럭션 이키프먼트 홀딩 스웨덴 에이비 조작레버 오작동 방지 시스템

Also Published As

Publication number Publication date
MY123446A (en) 2006-05-31
AU2074299A (en) 1999-08-23
EP0972205B1 (en) 2006-12-13
DE69934359D1 (de) 2007-01-25
CN1256758A (zh) 2000-06-14
JP3469586B2 (ja) 2003-11-25
DE69934359T2 (de) 2007-04-19
TW417019B (en) 2001-01-01
US6194888B1 (en) 2001-02-27
JP2000514200A (ja) 2000-10-24
AU725099B2 (en) 2000-10-05
KR20010006034A (ko) 2001-01-15
CN1211666C (zh) 2005-07-20
WO1999040447A1 (en) 1999-08-12
DK0972205T3 (da) 2007-03-05
EP0972205A1 (en) 2000-01-19
KR100341966B1 (ko) 2002-06-26

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