IL114010A - CT array with improved photosensor linearity and reduced crosstalk - Google Patents
CT array with improved photosensor linearity and reduced crosstalkInfo
- Publication number
- IL114010A IL114010A IL11401095A IL11401095A IL114010A IL 114010 A IL114010 A IL 114010A IL 11401095 A IL11401095 A IL 11401095A IL 11401095 A IL11401095 A IL 11401095A IL 114010 A IL114010 A IL 114010A
- Authority
- IL
- Israel
- Prior art keywords
- linearity
- array
- reduced crosstalk
- improved photosensor
- photosensor
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14665—Imagers using a photoconductor layer
- H01L27/14676—X-ray, gamma-ray or corpuscular radiation imagers
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Toxicology (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Measurement Of Radiation (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/264,098 US5430298A (en) | 1994-06-21 | 1994-06-21 | CT array with improved photosensor linearity and reduced crosstalk |
Publications (2)
Publication Number | Publication Date |
---|---|
IL114010A0 IL114010A0 (en) | 1995-10-31 |
IL114010A true IL114010A (en) | 1997-11-20 |
Family
ID=23004572
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL11401095A IL114010A (en) | 1994-06-21 | 1995-06-06 | CT array with improved photosensor linearity and reduced crosstalk |
Country Status (4)
Country | Link |
---|---|
US (1) | US5430298A (de) |
JP (1) | JP3549945B2 (de) |
DE (1) | DE19521075A1 (de) |
IL (1) | IL114010A (de) |
Families Citing this family (54)
Publication number | Priority date | Publication date | Assignee | Title |
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EP0762505A3 (de) * | 1995-08-28 | 1999-02-03 | Canon Kabushiki Kaisha | Vorrichtung zur Detektion von Strahlung und Verfahren zur Herstellung einer solchen Vorrichtung |
JP3235717B2 (ja) * | 1995-09-28 | 2001-12-04 | キヤノン株式会社 | 光電変換装置及びx線撮像装置 |
US6167110A (en) * | 1997-11-03 | 2000-12-26 | General Electric Company | High voltage x-ray and conventional radiography imaging apparatus and method |
US20030226978A1 (en) * | 1998-01-30 | 2003-12-11 | Segan Industries | Integrating ultraviolet exposure detection devices |
US6085005A (en) * | 1998-02-26 | 2000-07-04 | Lucent Technologies, Inc. | Optical assembly with a coated component |
JP2000131444A (ja) | 1998-10-28 | 2000-05-12 | Canon Inc | 放射線検出装置、放射線検出システム、及び放射線検出装置の製造方法 |
DE19914701B4 (de) * | 1999-03-31 | 2005-07-07 | Siemens Ag | Verfahren zur Herstellung eines Festkörperbilddetektors sowie Festkörperbilddetektor |
US6175615B1 (en) | 1999-04-12 | 2001-01-16 | General Electric Company | Radiation imager collimator |
US6175609B1 (en) | 1999-04-20 | 2001-01-16 | General Electric Company | Methods and apparatus for scanning an object in a computed tomography system |
US6369391B1 (en) * | 1999-05-02 | 2002-04-09 | Elgems Ltd. | Light output optimization |
DE19934768A1 (de) * | 1999-07-23 | 2001-01-25 | Philips Corp Intellectual Pty | Detektor zur Detektion von elektromagnetischer Strahlung |
US6266391B1 (en) | 1999-08-31 | 2001-07-24 | General Electric Company | Artifact compensation system for matrix-addressed x-ray imaging panel |
US6393098B1 (en) | 1999-08-31 | 2002-05-21 | General Electric Company | Amplifier offset and gain correction system for X-ray imaging panel |
US6396046B1 (en) * | 1999-11-02 | 2002-05-28 | General Electric Company | Imager with reduced FET photoresponse and high integrity contact via |
EP1113290A3 (de) * | 1999-12-27 | 2001-07-18 | General Electric Company | Strahlungs-Bildaufnahmevorrichtung mit lichtabsorbierender Schicht |
JP2002022840A (ja) * | 2000-07-04 | 2002-01-23 | Shimadzu Corp | X線ccdカメラ |
US6541774B1 (en) * | 2000-11-03 | 2003-04-01 | General Electric Company | Radiation imager cover |
US6647092B2 (en) * | 2002-01-18 | 2003-11-11 | General Electric Company | Radiation imaging system and method of collimation |
JP2004104203A (ja) * | 2002-09-05 | 2004-04-02 | Toshiba Corp | 固体撮像装置 |
EP1543351A1 (de) * | 2002-09-18 | 2005-06-22 | Koninklijke Philips Electronics N.V. | Röntgendetektor mit mehreren detektoreinheiten |
US7115876B2 (en) * | 2002-12-02 | 2006-10-03 | General Electric Company | Imaging array and methods for fabricating same |
US7105826B2 (en) * | 2002-12-02 | 2006-09-12 | General Electric Company | Imaging array and methods for fabricating same |
US7473903B2 (en) * | 2003-02-12 | 2009-01-06 | General Electric Company | Method and apparatus for deposited hermetic cover for digital X-ray panel |
CN1809761A (zh) * | 2003-06-19 | 2006-07-26 | 皇家飞利浦电子股份有限公司 | 固态辐射探测器 |
US7233640B2 (en) * | 2003-11-26 | 2007-06-19 | General Electric Company | CT detector having an optical mask layer |
US6969899B2 (en) * | 2003-12-08 | 2005-11-29 | Taiwan Semiconductor Manufacturing Co., Ltd. | Image sensor with light guides |
WO2006097882A2 (en) * | 2005-03-16 | 2006-09-21 | Philips Intellectual Property & Standards Gmbh | X-ray detector with in-pixel processing circuits |
US7214947B2 (en) * | 2005-03-25 | 2007-05-08 | General Electric Company | Detector assembly and method of manufacture |
WO2008132634A2 (en) * | 2007-04-25 | 2008-11-06 | Koninklijke Philips Electronics N.V. | Radiation detector having a split laminate optical coupling |
FR2922319B1 (fr) * | 2007-10-10 | 2013-08-02 | Commissariat Energie Atomique | Scintillateur pour dispositif d'imagerie, module scintillateur, dispositif d'imagerie avec un tel scintillateur et procede de fabrication d'un scintillateur |
US7639777B2 (en) * | 2008-02-26 | 2009-12-29 | United Technologies Corp. | Computed tomography systems and related methods involving forward collimation |
US20090213984A1 (en) * | 2008-02-26 | 2009-08-27 | United Technologies Corp. | Computed Tomography Systems and Related Methods Involving Post-Target Collimation |
US8238521B2 (en) * | 2008-03-06 | 2012-08-07 | United Technologies Corp. | X-ray collimators, and related systems and methods involving such collimators |
US20090225954A1 (en) * | 2008-03-06 | 2009-09-10 | United Technologies Corp. | X-Ray Collimators, and Related Systems and Methods Involving Such Collimators |
US7876875B2 (en) * | 2008-04-09 | 2011-01-25 | United Technologies Corp. | Computed tomography systems and related methods involving multi-target inspection |
US7888647B2 (en) * | 2008-04-30 | 2011-02-15 | United Technologies Corp. | X-ray detector assemblies and related computed tomography systems |
US20090274264A1 (en) * | 2008-04-30 | 2009-11-05 | United Technologies Corp. | Computed Tomography Systems and Related Methods Involving Localized Bias |
US8674468B2 (en) * | 2009-05-29 | 2014-03-18 | Carestream Health, Inc. | Imaging array with dual height semiconductor and method of making same |
US7968358B2 (en) * | 2009-07-29 | 2011-06-28 | Carestream Health, Inc. | Digital radiographic flat-panel imaging array with dual height semiconductor and method of making same |
US8405036B2 (en) | 2010-08-24 | 2013-03-26 | Carestream Health, Inc. | Digital radiography imager with buried interconnect layer in silicon-on-glass and method of fabricating same |
US20120073634A1 (en) * | 2010-09-29 | 2012-03-29 | Serguei Okhonin | Solar Cells and Solar Cell Arrays |
WO2012137160A2 (en) * | 2011-04-06 | 2012-10-11 | Koninklijke Philips Electronics N.V. | Imaging detector |
JP5720404B2 (ja) * | 2011-05-10 | 2015-05-20 | コニカミノルタ株式会社 | 放射線検出パネルおよび放射線画像検出器 |
US9018588B2 (en) | 2011-12-30 | 2015-04-28 | Saint-Gobain Ceramics & Plastics, Inc. | Radiation detection apparatuses including optical coupling material, and processes of forming the same |
US9052399B2 (en) | 2011-12-30 | 2015-06-09 | Saint-Gobain Ceramics & Plastics, Inc. | Scintillator pixel array with reduced cross talk |
TWI500926B (zh) * | 2012-11-23 | 2015-09-21 | Innocom Tech Shenzhen Co Ltd | X光平板偵測裝置 |
JP2015081863A (ja) * | 2013-10-23 | 2015-04-27 | 株式会社東芝 | 光検出器 |
WO2017063156A1 (en) * | 2015-10-14 | 2017-04-20 | Shenzhen Xpectvision Technology Co., Ltd. | X-ray detectors of high spatial resolution |
JP2018084485A (ja) * | 2016-11-24 | 2018-05-31 | コニカミノルタ株式会社 | 放射線画像撮影装置 |
JP2020529607A (ja) | 2017-08-03 | 2020-10-08 | ザ・リサーチ・ファウンデーション・フォー・ザ・ステイト・ユニヴァーシティ・オブ・ニューヨーク | 非対称反射スクリーンによるデュアルスクリーンデジタル放射線撮像 |
CN107582089B (zh) * | 2017-09-29 | 2021-06-29 | 上海联影医疗科技股份有限公司 | 准直器、成像设备、焦点位置跟踪方法及校正方法 |
US11802979B2 (en) | 2018-05-23 | 2023-10-31 | The Research Foundation For The State University Of New York | Flat panel x-ray imager with scintillating glass substrate |
CN110244341A (zh) * | 2019-07-11 | 2019-09-17 | 上海联影医疗科技有限公司 | 一种闪烁体探测器阵列 |
KR102665050B1 (ko) * | 2020-03-30 | 2024-05-13 | 도레이 카부시키가이샤 | 신틸레이터 패널 및 신틸레이터 패널의 제조 방법 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4720426A (en) * | 1986-06-30 | 1988-01-19 | General Electric Company | Reflective coating for solid-state scintillator bar |
US4914301A (en) * | 1987-04-21 | 1990-04-03 | Kabushiki Kaisha Toshiba | X-ray detector |
US4982096A (en) * | 1988-01-06 | 1991-01-01 | Hitachi Medical Corporation | Multi-element radiation detector |
US5179284A (en) * | 1991-08-21 | 1993-01-12 | General Electric Company | Solid state radiation imager having a reflective and protective coating |
US5233181A (en) * | 1992-06-01 | 1993-08-03 | General Electric Company | Photosensitive element with two layer passivation coating |
-
1994
- 1994-06-21 US US08/264,098 patent/US5430298A/en not_active Expired - Lifetime
-
1995
- 1995-06-06 IL IL11401095A patent/IL114010A/xx not_active IP Right Cessation
- 1995-06-09 DE DE19521075A patent/DE19521075A1/de not_active Ceased
- 1995-06-14 JP JP14665795A patent/JP3549945B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
IL114010A0 (en) | 1995-10-31 |
JP3549945B2 (ja) | 2004-08-04 |
US5430298A (en) | 1995-07-04 |
DE19521075A1 (de) | 1996-01-04 |
JPH08166460A (ja) | 1996-06-25 |
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Legal Events
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FF | Patent granted | ||
KB | Patent renewed | ||
KB | Patent renewed | ||
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KB | Patent renewed | ||
EXP | Patent expired |