HUE045601T2 - Kristályrács modul és eljárás annak elõállítására - Google Patents
Kristályrács modul és eljárás annak elõállításáraInfo
- Publication number
- HUE045601T2 HUE045601T2 HUE13893179A HUE13893179A HUE045601T2 HU E045601 T2 HUE045601 T2 HU E045601T2 HU E13893179 A HUE13893179 A HU E13893179A HU E13893179 A HUE13893179 A HU E13893179A HU E045601 T2 HUE045601 T2 HU E045601T2
- Authority
- HU
- Hungary
- Prior art keywords
- crystal
- fabrication method
- array module
- array
- module
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2002—Optical details, e.g. reflecting or diffusing layers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20187—Position of the scintillator with respect to the photodiode, e.g. photodiode surrounding the crystal, the crystal surrounding the photodiode, shape or size of the scintillator
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
- H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
- H01L27/14663—Indirect radiation imagers, e.g. using luminescent members
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
- H01L27/14685—Process for coatings or optical elements
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Molecular Biology (AREA)
- High Energy & Nuclear Physics (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Toxicology (AREA)
- Measurement Of Radiation (AREA)
- Conversion Of X-Rays Into Visible Images (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201310426359.0A CN104422950B (zh) | 2013-09-08 | 2013-09-08 | 一种阵列晶体模块及其加工方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
HUE045601T2 true HUE045601T2 (hu) | 2020-01-28 |
Family
ID=52627746
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HUE13893179A HUE045601T2 (hu) | 2013-09-08 | 2013-11-14 | Kristályrács modul és eljárás annak elõállítására |
Country Status (6)
Country | Link |
---|---|
US (1) | US9599726B2 (hu) |
EP (1) | EP3043193B1 (hu) |
JP (1) | JP6397027B2 (hu) |
CN (1) | CN104422950B (hu) |
HU (1) | HUE045601T2 (hu) |
WO (1) | WO2015032130A1 (hu) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6671839B2 (ja) * | 2014-10-07 | 2020-03-25 | キヤノン株式会社 | 放射線撮像装置及び撮像システム |
CN106501838B (zh) * | 2015-09-08 | 2019-08-27 | 中国科学院高能物理研究所 | 一种辐射探测器的光导及其制备方法、辐射探测器 |
CN106646582A (zh) * | 2016-09-13 | 2017-05-10 | 沈阳东软医疗系统有限公司 | 一种pet检测器及其制作方法 |
WO2020146475A1 (en) | 2019-01-08 | 2020-07-16 | The Research Foundation For The State University Of New York | Prismatoid light guide |
US11275182B2 (en) * | 2020-04-22 | 2022-03-15 | GE Precision Healthcare LLC | Systems and methods for scintillators having reflective inserts |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58153190A (ja) | 1982-03-09 | 1983-09-12 | Toshiba Corp | 放射線検出器 |
JPS58216973A (ja) | 1982-06-11 | 1983-12-16 | Toshiba Corp | 放射線検出器ブロツク |
DE4101645A1 (de) * | 1990-01-29 | 1991-08-01 | Gen Electric | Zweidimensionaler mosaikartiger szintillationsdetektor |
US5059800A (en) * | 1991-04-19 | 1991-10-22 | General Electric Company | Two dimensional mosaic scintillation detector |
JP2547908B2 (ja) * | 1991-10-02 | 1996-10-30 | 浜松ホトニクス株式会社 | 放射線検出装置 |
WO1998035242A1 (en) * | 1997-02-10 | 1998-08-13 | The University Of Alberta, Simon Fraser University, The University Of Victoria, And The University Of British Columbia, Doing Business As Triumf | Segmented scintillation detector for photon interaction coordinates |
US6552348B2 (en) | 1999-12-14 | 2003-04-22 | Regents Of The University Of California | Apparatus and method for breast cancer imaging |
JP3975091B2 (ja) * | 2002-02-12 | 2007-09-12 | 浜松ホトニクス株式会社 | 放射線検出器 |
JP2003240857A (ja) | 2002-02-19 | 2003-08-27 | Shimadzu Corp | 放射線検出器 |
JP2004354343A (ja) * | 2003-05-30 | 2004-12-16 | Shimadzu Corp | 放射線検出器 |
JP4305241B2 (ja) * | 2004-03-26 | 2009-07-29 | 株式会社島津製作所 | 放射線検出器 |
CN101073019B (zh) * | 2004-12-09 | 2011-06-29 | 皇家飞利浦电子股份有限公司 | 具有相互作用深度灵敏度的像素化探测器 |
CN101142497B (zh) | 2005-03-16 | 2011-06-01 | 皇家飞利浦电子股份有限公司 | 具有像素内处理电路的x射线检测器 |
JP2007078567A (ja) * | 2005-09-15 | 2007-03-29 | Shimadzu Corp | 放射線検出器およびその製造方法 |
US20090242774A1 (en) | 2006-04-04 | 2009-10-01 | Shimadzu Corporation | Radiation detector |
US20080073542A1 (en) * | 2006-09-22 | 2008-03-27 | Stefan Siegel | Light guide having a tapered geometrical configuration for improving light collection in a radiation detector |
JP2009025075A (ja) | 2007-07-18 | 2009-02-05 | Konica Minolta Medical & Graphic Inc | 放射線用シンチレータパネルおよびフラットパネルディテクター |
EP2265974B1 (en) | 2008-04-10 | 2015-06-17 | Koninklijke Philips N.V. | Modular multi-geometry pet system |
JP2010249672A (ja) | 2009-04-16 | 2010-11-04 | Toshiba Corp | ポジトロンct装置 |
CN101856236B (zh) | 2010-06-13 | 2012-07-04 | 苏州瑞派宁科技有限公司 | 一种应用适应性的正电子发射断层成像方法及装置 |
JP2012058170A (ja) | 2010-09-13 | 2012-03-22 | Konica Minolta Medical & Graphic Inc | シンチレータパネル |
CN102129082B (zh) * | 2010-12-23 | 2013-06-19 | 苏州瑞派宁科技有限公司 | 一种锥形闪烁晶体模块及其加工方法 |
CN102178542B (zh) | 2011-04-02 | 2012-09-26 | 苏州瑞派宁科技有限公司 | 一种可变结构的正电子发射断层成像机架 |
JP2012251978A (ja) | 2011-06-07 | 2012-12-20 | Fujifilm Corp | 放射線検出装置 |
CN203414599U (zh) * | 2013-09-08 | 2014-01-29 | 苏州瑞派宁科技有限公司 | 一种阵列晶体模块 |
-
2013
- 2013-09-08 CN CN201310426359.0A patent/CN104422950B/zh active Active
- 2013-11-14 EP EP13893179.5A patent/EP3043193B1/en active Active
- 2013-11-14 US US14/916,699 patent/US9599726B2/en active Active
- 2013-11-14 HU HUE13893179A patent/HUE045601T2/hu unknown
- 2013-11-14 JP JP2016539390A patent/JP6397027B2/ja active Active
- 2013-11-14 WO PCT/CN2013/087119 patent/WO2015032130A1/zh active Application Filing
Also Published As
Publication number | Publication date |
---|---|
EP3043193A1 (en) | 2016-07-13 |
JP2016537640A (ja) | 2016-12-01 |
CN104422950B (zh) | 2017-10-24 |
WO2015032130A1 (zh) | 2015-03-12 |
JP6397027B2 (ja) | 2018-09-26 |
CN104422950A (zh) | 2015-03-18 |
US20160202361A1 (en) | 2016-07-14 |
EP3043193A4 (en) | 2017-03-22 |
US9599726B2 (en) | 2017-03-21 |
EP3043193B1 (en) | 2019-07-17 |
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