HUE037774T2 - Eljárás és berendezés optikai alkotórészekben hibák detektálására - Google Patents

Eljárás és berendezés optikai alkotórészekben hibák detektálására

Info

Publication number
HUE037774T2
HUE037774T2 HUE08736200A HUE08736200A HUE037774T2 HU E037774 T2 HUE037774 T2 HU E037774T2 HU E08736200 A HUE08736200 A HU E08736200A HU E08736200 A HUE08736200 A HU E08736200A HU E037774 T2 HUE037774 T2 HU E037774T2
Authority
HU
Hungary
Prior art keywords
optical components
detecting defects
defects
detecting
optical
Prior art date
Application number
HUE08736200A
Other languages
English (en)
Inventor
Frederic Dubois
Guy Schott
Philippe Raulot
Original Assignee
Essilor Int
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Essilor Int filed Critical Essilor Int
Publication of HUE037774T2 publication Critical patent/HUE037774T2/hu

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Geometry (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Eyeglasses (AREA)
HUE08736200A 2007-04-13 2008-04-14 Eljárás és berendezés optikai alkotórészekben hibák detektálására HUE037774T2 (hu)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP07290457A EP1980843A1 (en) 2007-04-13 2007-04-13 Method and apparatus for detecting defects in optical components.

Publications (1)

Publication Number Publication Date
HUE037774T2 true HUE037774T2 (hu) 2018-09-28

Family

ID=38519833

Family Applications (1)

Application Number Title Priority Date Filing Date
HUE08736200A HUE037774T2 (hu) 2007-04-13 2008-04-14 Eljárás és berendezés optikai alkotórészekben hibák detektálására

Country Status (5)

Country Link
US (1) US8295581B2 (hu)
EP (2) EP1980843A1 (hu)
HU (1) HUE037774T2 (hu)
PT (1) PT2137519T (hu)
WO (1) WO2008125660A1 (hu)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1727024A1 (en) 2005-05-27 2006-11-29 Sony Ericsson Mobile Communications AB Automatic language selection for text input in messaging context
CA2546758C (en) * 2006-05-12 2009-07-07 Alberta Research Council Inc. A system and a method for detecting a damaged or missing machine part
US8326333B2 (en) 2009-11-11 2012-12-04 Sony Ericsson Mobile Communications Ab Electronic device and method of controlling the electronic device
FR2958040B1 (fr) 2010-03-23 2012-05-25 S G C C Methode et installation pour detecter la presence et l'altitude de defauts dans un composant optique
EP2812678A1 (en) 2012-02-07 2014-12-17 Tyco Electronics Raychem BVBA Visually inspecting optical fibers
FR2993662B1 (fr) * 2012-07-23 2015-05-15 Msc & Sgcc Procede et installation pour la detection notamment de defauts refractants
MX2015014867A (es) 2013-04-23 2016-03-09 Essilor Int Metodo para controlar un dispositivo de fabricacion utilizado en un proceso de fabricacion de lentes opticas.
FR3016699B1 (fr) 2014-01-22 2016-02-12 Msc & Sgcc Procede et dispositif pour la detection notamment de defauts refractants
US20160025591A1 (en) * 2014-07-22 2016-01-28 Esolar Inc. Automated deflectometry system for assessing reflector quality
FR3039660B1 (fr) * 2015-07-30 2017-09-08 Essilor Int Methode de verification d'une caracteristique geometrique et d'une caracteristique optique d'une lentille ophtalmique detouree et dispositif associe
CN105719291A (zh) * 2016-01-20 2016-06-29 江苏省沙钢钢铁研究院有限公司 品种可选择的表面缺陷图像分类系统
GB201607639D0 (en) 2016-05-02 2016-06-15 Univ Leuven Kath Sensing method
CN109406550B (zh) * 2018-12-07 2023-02-07 立讯精密工业（昆山）有限公司 基于多材质物体相位提取的缺陷检测方法及检测装置
FR3104700A1 (fr) 2019-12-13 2021-06-18 V-Optics Contrôle de lentilles ophtalmiques par déflectométrie
EP3835748A1 (fr) * 2019-12-13 2021-06-16 V-Optics Systeme de controle d'au moins un composant d'un element optique
US11650126B2 (en) * 2020-09-22 2023-05-16 Indizen Optical Technologies S.L. Systems and methods for automatic visual inspection of defects in ophthalmic lenses
CN112581424B (zh) * 2020-10-26 2022-04-26 浙江大学 一种光学元件表面与亚表面缺陷的分类提取方法
CN112816408B (zh) * 2020-12-29 2024-03-26 南京施密特光学仪器有限公司 一种光学镜片的瑕疵检测方法
WO2023041659A1 (en) 2021-09-16 2023-03-23 Schneider Gmbh & Co. Kg Method and apparatus for quality control of ophthalmic lenses
DE102022200614A1 (de) * 2022-01-20 2023-07-20 Rodenstock Gmbh Vorrichtung zur Untersuchung eines transparenten Werkstückes sowie die Verwendung einer solchen Vorrichtung als telezentrisches Messystem in Transmission
CN114486916A (zh) * 2022-01-26 2022-05-13 上海电机学院 基于机器视觉的手机玻璃盖板缺陷检测方法
FR3132352A1 (fr) 2022-01-28 2023-08-04 Tiama Procédés et systèmes opto-informatiques d’inspection en lumière traversante d’un récipient en verre
CN114913177B (zh) * 2022-07-19 2022-09-23 山东聊城富锋汽车部件有限公司 一种基于霍夫圆的汽车零部件缺陷检测方法
CN116773152B (zh) * 2023-08-25 2023-11-03 成都中嘉微视科技有限公司 一种镜头性能的检测方法、装置、电子设备及存储介质

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4641972A (en) * 1984-09-14 1987-02-10 New York Institute Of Technology Method and apparatus for surface profilometry
US4776698A (en) * 1986-08-04 1988-10-11 Eastman Kodak Company Measuring
FR2720831B3 (fr) * 1994-06-02 1996-07-12 Saint Gobain Vitrage Procédé de mesure de la qualité optique d'un vitrage.
US6208412B1 (en) * 1999-06-14 2001-03-27 Visteon Global Technologies, Inc. Method and apparatus for determining optical quality
FR2817042B1 (fr) * 2000-11-22 2003-06-20 Saint Gobain Procede et dispositif d'analyse de la surface d'un substrat
US7061628B2 (en) * 2001-06-27 2006-06-13 Southwest Research Institute Non-contact apparatus and method for measuring surface profile
US7990531B2 (en) * 2008-06-05 2011-08-02 Coopervision International Holding Company, Lp Multi-imaging automated inspection methods and systems for wet ophthalmic lenses

Also Published As

Publication number Publication date
EP2137519B1 (en) 2018-03-28
EP2137519A1 (en) 2009-12-30
WO2008125660A1 (en) 2008-10-23
US20100290694A1 (en) 2010-11-18
US8295581B2 (en) 2012-10-23
EP1980843A1 (en) 2008-10-15
PT2137519T (pt) 2018-05-17

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