FR2958040B1 - Methode et installation pour detecter la presence et l'altitude de defauts dans un composant optique - Google Patents
Methode et installation pour detecter la presence et l'altitude de defauts dans un composant optiqueInfo
- Publication number
- FR2958040B1 FR2958040B1 FR1052096A FR1052096A FR2958040B1 FR 2958040 B1 FR2958040 B1 FR 2958040B1 FR 1052096 A FR1052096 A FR 1052096A FR 1052096 A FR1052096 A FR 1052096A FR 2958040 B1 FR2958040 B1 FR 2958040B1
- Authority
- FR
- France
- Prior art keywords
- altitude
- defects
- installation
- detecting
- optical component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
- G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
- G01N2021/8832—Structured background, e.g. for transparent objects
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Geometry (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1052096A FR2958040B1 (fr) | 2010-03-23 | 2010-03-23 | Methode et installation pour detecter la presence et l'altitude de defauts dans un composant optique |
PCT/FR2011/050616 WO2011117539A1 (fr) | 2010-03-23 | 2011-03-23 | Methode et installation pour detecter la presence et l'altitude de defauts dans un composant optique |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1052096A FR2958040B1 (fr) | 2010-03-23 | 2010-03-23 | Methode et installation pour detecter la presence et l'altitude de defauts dans un composant optique |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2958040A1 FR2958040A1 (fr) | 2011-09-30 |
FR2958040B1 true FR2958040B1 (fr) | 2012-05-25 |
Family
ID=43033181
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1052096A Expired - Fee Related FR2958040B1 (fr) | 2010-03-23 | 2010-03-23 | Methode et installation pour detecter la presence et l'altitude de defauts dans un composant optique |
Country Status (2)
Country | Link |
---|---|
FR (1) | FR2958040B1 (fr) |
WO (1) | WO2011117539A1 (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106068450A (zh) * | 2014-01-22 | 2016-11-02 | 蒂阿马公司 | 用于检测特别是折射缺陷的方法和装置 |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2993662B1 (fr) * | 2012-07-23 | 2015-05-15 | Msc & Sgcc | Procede et installation pour la detection notamment de defauts refractants |
DE102014005281B4 (de) * | 2014-04-09 | 2016-07-14 | Rodenstock Gmbh | Bestimmung der Position zumindest eines Brillenglases im Raum |
US20160178535A1 (en) * | 2014-12-17 | 2016-06-23 | Xerox Corporation | Inspection Device And Method |
FR3039660B1 (fr) * | 2015-07-30 | 2017-09-08 | Essilor Int | Methode de verification d'une caracteristique geometrique et d'une caracteristique optique d'une lentille ophtalmique detouree et dispositif associe |
EP3943909A1 (fr) | 2017-04-13 | 2022-01-26 | Carl Zeiss Vision International GmbH | Procédé de fourniture d'une ébauche pour lunettes ou d'un demi-produit de lunettes pour la fabrication des lunettes |
JP2019105458A (ja) * | 2017-12-08 | 2019-06-27 | 株式会社日立ハイテクファインシステムズ | 欠陥検査装置及び欠陥検査方法 |
EP3588048A1 (fr) * | 2018-06-21 | 2020-01-01 | Essilor International (Compagnie Generale D'optique) | Procédé pour détecter un défaut dans une zone d'intérêt d'une lentille optique |
CN111080638B (zh) * | 2019-12-27 | 2023-04-07 | 成都泓睿科技有限责任公司 | 一种检测模制瓶瓶底脏污的方法 |
GB2598283A (en) * | 2020-07-07 | 2022-03-02 | Eyoto Group Ltd | Method and apparatus for inspecting the surface of a transparent object |
US11650126B2 (en) | 2020-09-22 | 2023-05-16 | Indizen Optical Technologies S.L. | Systems and methods for automatic visual inspection of defects in ophthalmic lenses |
CN112326202B (zh) * | 2020-10-23 | 2022-12-09 | 歌尔光学科技有限公司 | 虚拟现实设备的双目视差测试方法、装置及工装 |
FR3132352A1 (fr) | 2022-01-28 | 2023-08-04 | Tiama | Procédés et systèmes opto-informatiques d’inspection en lumière traversante d’un récipient en verre |
EP4382882A1 (fr) * | 2022-12-08 | 2024-06-12 | Essilor International | Système de détermination d'une valeur d'un paramètre caractéristique d'un défaut dans une lentille ophtalmique testé |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3926349A1 (de) * | 1989-08-09 | 1991-02-14 | Sick Optik Elektronik Erwin | Optische fehlerinspektionsvorrichtung |
DE19944354C5 (de) * | 1999-09-16 | 2011-07-07 | Häusler, Gerd, Prof. Dr., 91056 | Verfahren und Vorrichtung zur Vermessung von spiegelnden oder transparenten Prüflingen |
US6512239B1 (en) * | 2000-06-27 | 2003-01-28 | Photon Dynamics Canada Inc. | Stereo vision inspection system for transparent media |
DE102004020419B3 (de) * | 2004-04-23 | 2005-10-20 | 3D Shape Gmbh | Verfahren und Vorrichtung zur Bestimmung der Form und der lokalen Oberflächennormalen spiegelnder Oberflächen |
WO2006039192A1 (fr) * | 2004-09-29 | 2006-04-13 | Telco Testing Solutions, Llc | Appareil et procede de detection de particules de contaminants ou de defauts de composants |
KR100919166B1 (ko) * | 2007-04-02 | 2009-09-28 | 한국과학기술원 | 스테레오 모아레를 이용한 3차원 형상 측정장치 및 그 방법 |
EP1980843A1 (fr) | 2007-04-13 | 2008-10-15 | Essilor International (Compagnie Generale D'optique) | Procédé et appareil de détection de défauts dans des composants optiques |
EP2101143A1 (fr) * | 2008-03-10 | 2009-09-16 | Technische Universität Carolo-Wilhelmina zu Braunschweig | Procédé et dispositif destinés à la saisie de la forme d'objets réfractifs transparents |
-
2010
- 2010-03-23 FR FR1052096A patent/FR2958040B1/fr not_active Expired - Fee Related
-
2011
- 2011-03-23 WO PCT/FR2011/050616 patent/WO2011117539A1/fr active Application Filing
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106068450A (zh) * | 2014-01-22 | 2016-11-02 | 蒂阿马公司 | 用于检测特别是折射缺陷的方法和装置 |
CN106068450B (zh) * | 2014-01-22 | 2019-12-27 | 蒂阿马公司 | 用于检测特别是折射缺陷的方法和装置 |
Also Published As
Publication number | Publication date |
---|---|
FR2958040A1 (fr) | 2011-09-30 |
WO2011117539A1 (fr) | 2011-09-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20141128 |