KR100919166B1 - 스테레오 모아레를 이용한 3차원 형상 측정장치 및 그 방법 - Google Patents
스테레오 모아레를 이용한 3차원 형상 측정장치 및 그 방법Info
- Publication number
- KR100919166B1 KR100919166B1 KR1020070032164A KR20070032164A KR100919166B1 KR 100919166 B1 KR100919166 B1 KR 100919166B1 KR 1020070032164 A KR1020070032164 A KR 1020070032164A KR 20070032164 A KR20070032164 A KR 20070032164A KR 100919166 B1 KR100919166 B1 KR 100919166B1
- Authority
- KR
- South Korea
- Prior art keywords
- phase information
- stereo
- cameras
- dimensional shape
- moiré
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 68
- 238000005259 measurement Methods 0.000 title claims abstract description 59
- 238000000691 measurement method Methods 0.000 claims description 5
- 238000004458 analytical method Methods 0.000 abstract description 4
- 238000010586 diagram Methods 0.000 description 11
- 238000002474 experimental method Methods 0.000 description 9
- 230000010363 phase shift Effects 0.000 description 4
- 238000001314 profilometry Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
- G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (5)
- 디지털 패턴 주사기와 제1, 제2 카메라를 이용하여 측정 대상물에 대한 3차원 형상을 측정하는 방법으로서,상기 디지털 패턴 주사기에서 위상천이된 프린지 무늬를 상기 측정 대상물에 주사하는 제1 단계와,상기 제1, 제2 카메라에서 각각 4장씩의 프린지 영상을 얻은 후, 모아레 방법을 적용하여 2개의 위상정보와 2개의 평균위상정보를 구하는 제2 단계와,상기 위상정보와 평균위상정보를 사용하여 스테레오 정합을 만족하는 대응점들 중에서 최종적인 한 쌍의 정합점을 구하고 이들 정합점을 이용하여 3차원 형상을 측정하는 제3 단계를 포함하는 것을 특징으로 하는 스테레오 모아레를 이용한 3차원 형상 측정방법.
- 청구항 1에 있어서,상기 제1 단계에서, 상기 디지털 패턴 주사기는 위치와 각도가 이미 측정(calibration)된 자연광원을 상기 측정 대상물에 주사하는 것을 특징으로 하는 스테레오 모아레를 이용한 3차원 형상 측정방법.
- 청구항 1에 있어서,상기 제3 단계는, 상기 제2 카메라를 통해 구한 위상정보와 평균위상정보에서 각각 임의의 한 점을 선택하는 단계와,상기 제1 카메라를 통해 구한 위상정보와 평균위상정보에서 스테레오 정합을 만족하는 후보점들을 각각 선정하는 단계와,상기 후보점들 중에서 위상 차이값이 최소가 되는 한 점을 정합점으로 선택하는 단계를 포함하는 것을 특징으로 하는 스테레오 모아레를 이용한 3차원 형상 측정방법.
- 빛을 주기적으로 주사하는 디지털 패턴 주사기와, 상기 디지털 패턴 주사기의 빛에 의해 투영된 프린지 무늬를 각각 검출하는 제1, 제2 카메라, 및 상기 디지털 패턴 주사기와 상기 제1, 제2 카메라들의 작동을 제어하는 제어부를 포함하는 3차원 형상 측정장치에 있어서,상기 제어부는, 상기 제1, 제2 카메라에서 각각 4장씩의 프린지 영상을 얻은 후, 모아레 방법을 적용하여 2개의 위상정보와 2개의 평균위상정보를 구한 후, 상기 2개의 위상정보와 2개의 평균위상정보를 사용하여 스테레오 정합을 만족하는 대응점들 중에서 최종적인 한 쌍의 정합점을 구하고 이들 정합점을 이용하여 3차원 형상을 측정하는 것을 특징으로 하는 스테레오 모아레를 이용한 3차원 형상 측정장치.
- 청구항 4에 있어서,상기 디지털 패턴 주사기는 위치와 각도가 이미 측정(calibration)된 자연광원을 상기 측정 대상물에 주사하는 것을 특징으로 하는 스테레오 모아레를 이용한 3차원 형상 측정장치.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070032164A KR100919166B1 (ko) | 2007-04-02 | 2007-04-02 | 스테레오 모아레를 이용한 3차원 형상 측정장치 및 그 방법 |
US11/998,175 US7480061B2 (en) | 2007-04-02 | 2007-11-27 | 3D shape measurement apparatus and method using stereo moiré technique |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070032164A KR100919166B1 (ko) | 2007-04-02 | 2007-04-02 | 스테레오 모아레를 이용한 3차원 형상 측정장치 및 그 방법 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020090068570A Division KR20090091093A (ko) | 2009-07-27 | 2009-07-27 | 스테레오 모아레를 이용한 3차원 형상 측정장치 및 그 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20080089691A KR20080089691A (ko) | 2008-10-08 |
KR100919166B1 true KR100919166B1 (ko) | 2009-09-28 |
Family
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KR1020070032164A KR100919166B1 (ko) | 2007-04-02 | 2007-04-02 | 스테레오 모아레를 이용한 3차원 형상 측정장치 및 그 방법 |
Country Status (2)
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US (1) | US7480061B2 (ko) |
KR (1) | KR100919166B1 (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8831280B2 (en) | 2010-12-14 | 2014-09-09 | Electronics And Telecommunications Research Institute | 3D motion recognition method and apparatus |
KR20150059472A (ko) * | 2013-11-22 | 2015-06-01 | 조춘식 | 물체의 3차원 형상 측정 장치 |
Families Citing this family (16)
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EP2183544B1 (en) | 2007-08-17 | 2015-07-15 | Renishaw PLC | Non-contact measurement apparatus and method |
US9282926B2 (en) | 2008-12-18 | 2016-03-15 | Sirona Dental Systems Gmbh | Camera for recording surface structures, such as for dental purposes |
DE102008055158B4 (de) * | 2008-12-24 | 2011-12-22 | Sirona Dental Systems Gmbh | Verfahren zur 3D-Vermessung der Oberfläche eines Objekts, insbesondere für zahnmedizinische Zwecke |
US20100309290A1 (en) * | 2009-06-08 | 2010-12-09 | Stephen Brooks Myers | System for capture and display of stereoscopic content |
GB0915904D0 (en) * | 2009-09-11 | 2009-10-14 | Renishaw Plc | Non-contact object inspection |
FR2958040B1 (fr) * | 2010-03-23 | 2012-05-25 | S G C C | Methode et installation pour detecter la presence et l'altitude de defauts dans un composant optique |
US8532340B2 (en) | 2010-09-30 | 2013-09-10 | Empire Technology Development, Llc | Projecting patterns for high resolution texture extraction |
KR101457019B1 (ko) | 2010-10-11 | 2014-10-31 | 엠파이어 테크놀로지 디벨롭먼트 엘엘씨 | 객체 모델링 |
KR101792501B1 (ko) | 2011-03-16 | 2017-11-21 | 한국전자통신연구원 | 특징기반의 스테레오 매칭 방법 및 장치 |
KR101160804B1 (ko) * | 2011-07-27 | 2012-06-28 | 경북대학교 산학협력단 | 광학식 표면 형상 측정 방법 |
KR101445831B1 (ko) * | 2013-02-08 | 2014-09-29 | 주식회사 이오테크닉스 | 3차원 형상 측정 장치 및 측정 방법 |
CN106813596B (zh) * | 2017-01-18 | 2019-01-18 | 西安工业大学 | 一种自标定阴影莫尔三维轮廓测量方法 |
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CN110230994B (zh) * | 2019-04-30 | 2020-08-14 | 浙江大学 | 像点溯源的物体光栅图像相移法相位测量误差校正方法 |
CN111562262B (zh) * | 2020-05-27 | 2020-10-13 | 江苏金恒信息科技股份有限公司 | 一种合金分析系统及其复检方法 |
CN112762860B (zh) * | 2020-12-28 | 2022-03-15 | 电子科技大学 | 一种高帧率正弦条纹场投射模块 |
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KR20040110887A (ko) * | 2003-06-20 | 2004-12-31 | 한국원자력연구소 | 위상오차 보정을 이용한 삼차원 표면형상 측정장치 및 방법 |
KR100708352B1 (ko) * | 2006-03-07 | 2007-04-18 | 한국과학기술원 | 모아레 원리의 2π 모호성과 위상천이 수단이 없도록실시되는 3차원 형상 측정장치 및 그 방법 |
Family Cites Families (1)
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US6438272B1 (en) * | 1997-12-31 | 2002-08-20 | The Research Foundation Of State University Of Ny | Method and apparatus for three dimensional surface contouring using a digital video projection system |
-
2007
- 2007-04-02 KR KR1020070032164A patent/KR100919166B1/ko not_active IP Right Cessation
- 2007-11-27 US US11/998,175 patent/US7480061B2/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20040110887A (ko) * | 2003-06-20 | 2004-12-31 | 한국원자력연구소 | 위상오차 보정을 이용한 삼차원 표면형상 측정장치 및 방법 |
KR100708352B1 (ko) * | 2006-03-07 | 2007-04-18 | 한국과학기술원 | 모아레 원리의 2π 모호성과 위상천이 수단이 없도록실시되는 3차원 형상 측정장치 및 그 방법 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8831280B2 (en) | 2010-12-14 | 2014-09-09 | Electronics And Telecommunications Research Institute | 3D motion recognition method and apparatus |
KR20150059472A (ko) * | 2013-11-22 | 2015-06-01 | 조춘식 | 물체의 3차원 형상 측정 장치 |
KR101657197B1 (ko) | 2013-11-22 | 2016-09-21 | 조춘식 | 물체의 3차원 형상 측정 장치 |
Also Published As
Publication number | Publication date |
---|---|
US7480061B2 (en) | 2009-01-20 |
KR20080089691A (ko) | 2008-10-08 |
US20080239288A1 (en) | 2008-10-02 |
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