HK51394A - Semiconductor integrated circuit device - Google Patents
Semiconductor integrated circuit deviceInfo
- Publication number
- HK51394A HK51394A HK51394A HK51394A HK51394A HK 51394 A HK51394 A HK 51394A HK 51394 A HK51394 A HK 51394A HK 51394 A HK51394 A HK 51394A HK 51394 A HK51394 A HK 51394A
- Authority
- HK
- Hong Kong
- Prior art keywords
- integrated circuit
- semiconductor integrated
- circuit device
- semiconductor
- integrated
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F15/00—Digital computers in general; Data processing equipment in general
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
- G06F21/78—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure storage of data
- G06F21/79—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure storage of data in semiconductor storage media, e.g. directly-addressable memories
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60206419A JPS6267800A (ja) | 1985-09-20 | 1985-09-20 | 半導体集積回路装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
HK51394A true HK51394A (en) | 1994-05-27 |
Family
ID=16523060
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK51394A HK51394A (en) | 1985-09-20 | 1994-05-19 | Semiconductor integrated circuit device |
Country Status (6)
Country | Link |
---|---|
US (2) | US4777586A (xx) |
EP (1) | EP0215464B1 (xx) |
JP (1) | JPS6267800A (xx) |
KR (1) | KR940009101B1 (xx) |
DE (1) | DE3685071D1 (xx) |
HK (1) | HK51394A (xx) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6267800A (ja) * | 1985-09-20 | 1987-03-27 | Hitachi Ltd | 半導体集積回路装置 |
JPH0827730B2 (ja) * | 1986-11-07 | 1996-03-21 | 沖電気工業株式会社 | シングルチップマイクロコンピュータ及びそのテスト方法 |
JPS63121934A (ja) * | 1986-11-10 | 1988-05-26 | Oki Electric Ind Co Ltd | 評価用ワンチツプマイクロコンピユ−タ |
US5089951A (en) * | 1987-11-05 | 1992-02-18 | Kabushiki Kaisha Toshiba | Microcomputer incorporating memory |
DK169883B1 (da) * | 1988-02-25 | 1995-03-20 | Siemens Ag | Fremgangsmåde til sikring af hemmelige kodedata lagret i et datalager og kredsløbsarrangement til udøvelse af fremgangsmåden |
JP2534314B2 (ja) * | 1988-04-15 | 1996-09-11 | 富士通株式会社 | 半導体集積回路 |
DE3820728A1 (de) * | 1988-06-18 | 1989-12-21 | Philips Patentverwaltung | Verfahren zum pruefen eines festwertspeichers und anordnung zur durchfuehrung des verfahrens |
KR0136594B1 (ko) * | 1988-09-30 | 1998-10-01 | 미다 가쓰시게 | 단일칩 마이크로 컴퓨터 |
JPH02255925A (ja) * | 1988-11-30 | 1990-10-16 | Hitachi Ltd | メモリテスト方法および装置 |
US5293610A (en) * | 1989-08-04 | 1994-03-08 | Motorola, Inc. | Memory system having two-level security system for enhanced protection against unauthorized access |
JPH0393098A (ja) * | 1989-09-04 | 1991-04-18 | Sharp Corp | 集積回路 |
EP0418521A3 (en) * | 1989-09-20 | 1992-07-15 | International Business Machines Corporation | Testable latch self checker |
US5278839A (en) * | 1990-04-18 | 1994-01-11 | Hitachi, Ltd. | Semiconductor integrated circuit having self-check and self-repair capabilities |
JPH04195546A (ja) * | 1990-11-28 | 1992-07-15 | Nec Corp | マイクロコンピュータのテストモード設定回路 |
US5974570A (en) * | 1990-12-01 | 1999-10-26 | Hitachi, Ltd. | Method for managing data processing system and high-reliability memory |
US5353431A (en) * | 1991-04-29 | 1994-10-04 | Intel Corporation | Memory address decoder with storage for memory attribute information |
US5399912A (en) * | 1992-01-13 | 1995-03-21 | Hitachi, Ltd. | Hold-type latch circuit with increased margin in the feedback timing and a memory device using same for holding parity check error |
JP3186359B2 (ja) * | 1993-07-28 | 2001-07-11 | 安藤電気株式会社 | 物理アドレス変換回路 |
US5617531A (en) * | 1993-11-02 | 1997-04-01 | Motorola, Inc. | Data Processor having a built-in internal self test controller for testing a plurality of memories internal to the data processor |
GB9414266D0 (en) * | 1994-07-14 | 1994-08-31 | Jonhig Ltd | Testing of memory content |
US5592493A (en) * | 1994-09-13 | 1997-01-07 | Motorola Inc. | Serial scan chain architecture for a data processing system and method of operation |
US5615335A (en) * | 1994-11-10 | 1997-03-25 | Emc Corporation | Storage system self-test apparatus and method |
DE69500346T2 (de) * | 1995-01-23 | 1997-12-11 | Ibm | Verbesserte Speicherselbstprüfung |
WO1998022879A1 (en) * | 1996-11-15 | 1998-05-28 | Philips Electronics N.V. | A protection method against eeprom-directed intrusion into a mobile communication device that has a processor, and a device having such protection mechanism |
JP3606788B2 (ja) | 2000-05-31 | 2005-01-05 | 松下電器産業株式会社 | 半導体集積回路および半導体集積回路の検査方法 |
WO2003107193A1 (ja) * | 2002-06-14 | 2003-12-24 | 松下電器産業株式会社 | 半導体集積回路装置、データ記憶検証装置およびデータ記憶検証方法 |
US20080114582A1 (en) * | 2006-11-10 | 2008-05-15 | Texas Instruments Incorporated | Detecting tampering of a signal |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1980002881A1 (en) * | 1979-06-12 | 1980-12-24 | Motorola Inc | Microcomputer with mpu-programmable eprom |
US4414665A (en) * | 1979-11-21 | 1983-11-08 | Nippon Telegraph & Telephone Public Corp. | Semiconductor memory device test apparatus |
GB2092338B (en) * | 1981-01-31 | 1984-07-18 | Jpm Automatic Machines Ltd | Improvements relating to programmable memories |
DE3588121T2 (de) * | 1984-05-31 | 1997-01-16 | Fujitsu Ltd | Halbleiterintegrierte Schaltung mit einer Ersatzredundanzschaltung |
JPS6267800A (ja) * | 1985-09-20 | 1987-03-27 | Hitachi Ltd | 半導体集積回路装置 |
-
1985
- 1985-09-20 JP JP60206419A patent/JPS6267800A/ja active Pending
-
1986
- 1986-08-20 KR KR1019860007256A patent/KR940009101B1/ko not_active IP Right Cessation
- 1986-09-15 DE DE8686112703T patent/DE3685071D1/de not_active Expired - Lifetime
- 1986-09-15 EP EP86112703A patent/EP0215464B1/en not_active Expired - Lifetime
- 1986-09-22 US US06/909,927 patent/US4777586A/en not_active Expired - Lifetime
-
1988
- 1988-10-04 US US07/253,182 patent/US4905142A/en not_active Expired - Lifetime
-
1994
- 1994-05-19 HK HK51394A patent/HK51394A/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
DE3685071D1 (de) | 1992-06-04 |
US4777586A (en) | 1988-10-11 |
KR940009101B1 (ko) | 1994-09-29 |
JPS6267800A (ja) | 1987-03-27 |
EP0215464A2 (en) | 1987-03-25 |
KR870003430A (ko) | 1987-04-17 |
EP0215464B1 (en) | 1992-04-29 |
EP0215464A3 (en) | 1989-03-15 |
US4905142A (en) | 1990-02-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |