HK46292A - High throughput circuit tester and test technique avoiding overdriving damage - Google Patents

High throughput circuit tester and test technique avoiding overdriving damage Download PDF

Info

Publication number
HK46292A
HK46292A HK462/92A HK46292A HK46292A HK 46292 A HK46292 A HK 46292A HK 462/92 A HK462/92 A HK 462/92A HK 46292 A HK46292 A HK 46292A HK 46292 A HK46292 A HK 46292A
Authority
HK
Hong Kong
Prior art keywords
test
circuit
damage
junction
cool down
Prior art date
Application number
HK462/92A
Other languages
German (de)
English (en)
Inventor
William A. Groves
Vance Russel Harwood
Thomas R. Fay
Elton Curtis Bingham
Michael Anthony Teska
Original Assignee
Agilent Technologies, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies, Inc. filed Critical Agilent Technologies, Inc.
Publication of HK46292A publication Critical patent/HK46292A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31915—In-circuit Testers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)

Claims (5)

  1. Procédé pour tester des circuits, du type dans lequel des signaux de test (96, 97) sont appliqués à un circuit testé (98), le circuit contenant des composants semi-conducteurs individuels, et dans lequel des signaux de sortie (99, 96) du circuit testé sont surveillés, le procédé étant caractérisé par l'étape (92) consistant à intercaler, au cours du test, des intervalles de refroidissement ayant des durées minimales suffisantes pour éviter l'endommagement du circuit par échauffement excessif des composants semi-conducteurs du circuit, les durées étant calculées en utilisant les caractéristiques thermiques des jonctions et des fils de connexion des composants.
  2. Procédé selon la revendication 1, dans lequel chaque intervalle de refroidissement est intercalé dans le test avant la partie du test pour laquelle la longueur de cet intervalle a été déterminée.
  3. Testeur de circuits pour tester un circuit contenant des composants semi-conducteurs individuels, le testeur comprenant: un moyen (96, 97) pour appliquer des signaux de test à des noeuds du circuit testé (98), ainsi qu'un moyen (99, 96) Pour surveiller des signaux sur les noeuds du circuit testé, caractérisé par un moyen (92) pour intercaler des intervalles de refroidissement dans des tests de circuit; des fichiers de données (91) contenant de l'information relative à la topologie du circuit et de l'information relative aux caractéristiques thermiques de jonctions et de fils de connexion de composants semi-conducteurs du circuit; un analyseur de dommages (95) sensible à l'information relative à la topologie du circuit et à l'information thermique sur les jonctions et les fils de connexion dans les fichiers de données pour calculer des intervalles de refroidissement de longueur minimale suffisants pour empêcher l'endommagement des composants semi-conducteurs par suite d'un échauffement excessif; ainsi qu'un dispositif de commande (96) sensible à des signaux provenant de l'analyseur de dommages et servant à ajuster la longueur de chaque intervalle de refroidissement.
  4. Testeur de circuits selon la revendication 3, dans lequel le moyen pour intercaler les intervalles de refroidissement est conçu pour pouvoir intercaler chaque intervalle de refroidissement dans le test avant la partie du test pour laquelle est déterminée sa longueur.
  5. Testeur de circuits selon la revendication 3 ou 4, dans lequel la pente des signaux de test peut être variée.
HK462/92A 1983-06-13 1992-06-25 High throughput circuit tester and test technique avoiding overdriving damage HK46292A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/503,465 US4588945A (en) 1983-06-13 1983-06-13 High throughput circuit tester and test technique avoiding overdriving damage

Publications (1)

Publication Number Publication Date
HK46292A true HK46292A (en) 1992-07-03

Family

ID=24002208

Family Applications (1)

Application Number Title Priority Date Filing Date
HK462/92A HK46292A (en) 1983-06-13 1992-06-25 High throughput circuit tester and test technique avoiding overdriving damage

Country Status (6)

Country Link
US (1) US4588945A (fr)
EP (1) EP0128774B1 (fr)
JP (2) JPS6013267A (fr)
DE (1) DE3485280D1 (fr)
HK (1) HK46292A (fr)
SG (1) SG34092G (fr)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3543699A1 (de) * 1985-12-11 1987-06-19 Rohde & Schwarz Verfahren zum pruefen der einzelnen bauelemente einer leiterplatte (in-circuit-test)
GB2186701B (en) * 1986-02-14 1990-03-28 Membrain Ltd Circuit testers
SE461939B (sv) * 1988-09-12 1990-04-09 Kjell Moum Instrument foer kontroll av ic-kretsar
US4947113A (en) * 1989-03-31 1990-08-07 Hewlett-Packard Company Driver circuit for providing pulses having clean edges
US4998026A (en) * 1989-04-19 1991-03-05 Hewlett-Packard Company Driver circuit for in-circuit overdrive/functional tester
US5027064A (en) * 1989-04-19 1991-06-25 Celeritek, Inc. Method and means for measuring operating temperature of semiconductor devices by monitoring RF characteristics
US5005008A (en) * 1989-04-20 1991-04-02 Hewlett Packard Company Method and apparatus for providing thermodynamic protection of a driver circuit used in an in-circuit tester
JP2584673B2 (ja) * 1989-06-09 1997-02-26 株式会社日立製作所 テストデータ変更回路を有する論理回路テスト装置
US5032789A (en) * 1989-06-19 1991-07-16 Hewlett-Packard Company Modular/concurrent board tester
US5127009A (en) * 1989-08-29 1992-06-30 Genrad, Inc. Method and apparatus for circuit board testing with controlled backdrive stress
US5111137A (en) * 1990-10-29 1992-05-05 Hewlett-Packard Company Method and apparatus for the detection of leakage current
US5321701A (en) * 1990-12-06 1994-06-14 Teradyne, Inc. Method and apparatus for a minimal memory in-circuit digital tester
US5144229A (en) * 1991-08-30 1992-09-01 Hewlett-Packard Company Method for selectively conditioning integrated circuit outputs for in-circuit test
US5184029A (en) * 1991-10-15 1993-02-02 Hewlett-Packard Company Driver circuit for circuit tester
US5448166A (en) * 1992-01-03 1995-09-05 Hewlett-Packard Company Powered testing of mixed conventional/boundary-scan logic
US5260649A (en) * 1992-01-03 1993-11-09 Hewlett-Packard Company Powered testing of mixed conventional/boundary-scan logic
US5761214A (en) * 1992-10-16 1998-06-02 International Business Machines Corporation Method for testing integrated circuit devices
US5808919A (en) * 1993-11-23 1998-09-15 Hewlett-Packard Company Diagnostic system
US5502390A (en) * 1994-03-15 1996-03-26 International Business Machines Corporation Adiabatic conductor analyzer method and system
US5682337A (en) * 1995-04-13 1997-10-28 Synopsys, Inc. High speed three-state sampling
WO1999023700A1 (fr) 1997-11-05 1999-05-14 Martin Robert A Corps de circuit integre, procedes de fabrication et de fixation de ces circuits integres
US6175230B1 (en) 1999-01-14 2001-01-16 Genrad, Inc. Circuit-board tester with backdrive-based burst timing
US7078924B2 (en) * 2002-09-20 2006-07-18 Lsi Logic Corporation Methodology to accurately test clock to signal valid and slew rates of PCI signals
US8227929B2 (en) 2009-09-25 2012-07-24 General Electric Company Multi-use energy storage for renewable sources
CA2879578A1 (fr) * 2012-08-03 2014-02-06 Abb Technology Ag Limitation de surcharge en fonctionnement de puissance de crete
JP6633949B2 (ja) * 2016-03-14 2020-01-22 ヤマハファインテック株式会社 基板検査装置及び基板検査方法
US10972192B2 (en) * 2018-05-11 2021-04-06 Teradyne, Inc. Handler change kit for a test system
JP7089440B2 (ja) * 2018-08-28 2022-06-22 ルネサスエレクトロニクス株式会社 半導体装置及びその自己診断の制御方法
CN109765479B (zh) * 2019-01-28 2021-10-01 合肥京东方视讯科技有限公司 一种电路板缺件检测装置和方法
KR102784150B1 (ko) * 2020-08-04 2025-03-21 주식회사 아도반테스토 양방향 전용 실시간 인터페이스를 사용하여 피시험 디바이스를 테스트하기 위한 자동 테스트 장비, 핸들러 및 방법
US12066483B2 (en) * 2022-11-11 2024-08-20 Texas Instruments Incorporated Method for testing an integrated circuit (IC) device at a testing temperature

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3870953A (en) * 1972-08-01 1975-03-11 Roger Boatman & Associates Inc In circuit electronic component tester
JPS57113377A (en) * 1981-01-07 1982-07-14 Hitachi Ltd Semiconductor testing device
US4507576A (en) * 1982-10-28 1985-03-26 Tektronix, Inc. Method and apparatus for synthesizing a drive signal for active IC testing including slew rate adjustment
JPS59221679A (ja) * 1983-05-31 1984-12-13 Advantest Corp 論理回路試験装置

Also Published As

Publication number Publication date
US4588945A (en) 1986-05-13
JPS6013267A (ja) 1985-01-23
EP0128774A3 (en) 1987-08-05
SG34092G (en) 1992-06-12
EP0128774A2 (fr) 1984-12-19
JPH05188110A (ja) 1993-07-30
JP2723382B2 (ja) 1998-03-09
DE3485280D1 (de) 1992-01-02
EP0128774B1 (fr) 1991-11-21

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PE Patent expired

Effective date: 20040612

PE Patent expired