HK40695A - Device for a measuring probe - Google Patents

Device for a measuring probe

Info

Publication number
HK40695A
HK40695A HK40695A HK40695A HK40695A HK 40695 A HK40695 A HK 40695A HK 40695 A HK40695 A HK 40695A HK 40695 A HK40695 A HK 40695A HK 40695 A HK40695 A HK 40695A
Authority
HK
Hong Kong
Prior art keywords
measuring probe
probe
measuring
Prior art date
Application number
HK40695A
Other languages
English (en)
Inventor
Helmut Fischer
Original Assignee
Helmut Fischer Gmbh & Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Helmut Fischer Gmbh & Co filed Critical Helmut Fischer Gmbh & Co
Publication of HK40695A publication Critical patent/HK40695A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
HK40695A 1989-01-25 1995-03-23 Device for a measuring probe HK40695A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19893902095 DE3902095C2 (de) 1989-01-25 1989-01-25 Meßsonde zur Messung dünner Schichten

Publications (1)

Publication Number Publication Date
HK40695A true HK40695A (en) 1995-03-31

Family

ID=6372728

Family Applications (1)

Application Number Title Priority Date Filing Date
HK40695A HK40695A (en) 1989-01-25 1995-03-23 Device for a measuring probe

Country Status (3)

Country Link
DE (1) DE3902095C2 (xx)
GB (1) GB2228571B (xx)
HK (1) HK40695A (xx)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19735433C2 (de) * 1996-09-04 1999-10-07 Nix Steingroeve Elektro Physik Meßsonde zum Messen dünner Schichten nach einem magnetischen oder Wirbelstromverfahren
US6011391A (en) * 1996-09-04 2000-01-04 Elektro-Physik Hans Nix Probe for measuring thin layers using a magnetic or eddy current process
DE19635855C2 (de) * 1996-09-04 2001-03-08 Elektrophysik Dr Steingroever Verfahren und Meßsonde zum Messen der Dicke von pulvrigen oder weichen Schichtwerkstoffen auf einem festen Grundwerkstoff
DE19649515B4 (de) * 1996-11-29 2005-02-24 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Verfahren und Vorrichtung zur Messung der Dicke dünner Schichten sowie Schaltung zur Ansteuerung der Vorrichtung
DE19722014C2 (de) * 1997-05-27 1999-11-04 Nix Steingroeve Elektro Physik Meßsonde zum Messen der Dicke von Schichten auf einem Trägermaterial
DE10014348B4 (de) * 2000-03-24 2009-03-12 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Vorrichtung zur zerstörungsfreien Messung der Dicke dünner Schichten
GB2397652B (en) * 2002-11-15 2005-12-21 Immobilienges Helmut Fischer Measurement probe for measurement of the thickness of thin layers
DE10348652B4 (de) * 2002-11-15 2015-12-03 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Messsonde, insbesondere für eine Vorrichtung zur Messung der Dicke dünner Schichten
DE102005054593B4 (de) * 2005-11-14 2018-04-26 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Messonde zur Messung der Dicke dünner Schichten

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2933677A (en) * 1955-08-26 1960-04-19 Unit Process Assemblies Probe for a thickness testing gage
GB1165631A (en) * 1967-02-14 1969-10-01 Kh I Avtomatiki Device for Measuring Absolute Vibrations in Rotor-Stator Systems.
DE2107076C3 (de) * 1971-02-15 1975-01-30 Elektro-Physik Hans Nix & Dr.-Ing. E. Steingroever Kg, 5000 Koeln Magnetischer Schicht-Dickenmesser
FR2222912A5 (xx) * 1973-03-23 1974-10-18 Siderurgie Fse Inst Rech
US4005360A (en) * 1974-12-14 1977-01-25 Albert Ott Probe with ball bearing ball
DE2556340A1 (de) * 1975-12-13 1977-06-16 Fischer Gmbh & Co Helmut Endstueck fuer messtaster
US4490913A (en) * 1983-01-24 1985-01-01 Vis Arthur D Low contact force position sensing probe
DE3331407A1 (de) * 1983-08-31 1985-03-14 Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen Elektromagnetische mess-sonde
DE3437253A1 (de) * 1983-08-31 1986-04-17 Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen Elektromagnetische mess-sonde
CH667727A5 (de) * 1985-05-28 1988-10-31 Zellweger Uster Ag Messkopf zur induktiven messung der dicke einer isolierenden schicht auf einem elektrischen leiter.

Also Published As

Publication number Publication date
GB2228571B (en) 1994-01-05
GB8904428D0 (en) 1989-04-12
GB2228571A (en) 1990-08-29
DE3902095A1 (de) 1990-07-26
DE3902095C2 (de) 1997-01-16

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Legal Events

Date Code Title Description
PF Patent in force
PE Patent expired

Effective date: 20090226