GB2228571B - Device for a measuring probe - Google Patents

Device for a measuring probe

Info

Publication number
GB2228571B
GB2228571B GB8904428A GB8904428A GB2228571B GB 2228571 B GB2228571 B GB 2228571B GB 8904428 A GB8904428 A GB 8904428A GB 8904428 A GB8904428 A GB 8904428A GB 2228571 B GB2228571 B GB 2228571B
Authority
GB
United Kingdom
Prior art keywords
measuring probe
probe
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
GB8904428A
Other versions
GB8904428D0 (en
GB2228571A (en
Inventor
Helmut Fischer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Helmut Fischer GmbH and Co
Original Assignee
Helmut Fischer GmbH and Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Helmut Fischer GmbH and Co filed Critical Helmut Fischer GmbH and Co
Publication of GB8904428D0 publication Critical patent/GB8904428D0/en
Publication of GB2228571A publication Critical patent/GB2228571A/en
Application granted granted Critical
Publication of GB2228571B publication Critical patent/GB2228571B/en
Priority to SG132694A priority Critical patent/SG132694G/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
GB8904428A 1989-01-25 1989-02-27 Device for a measuring probe Expired - Lifetime GB2228571B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SG132694A SG132694G (en) 1989-02-27 1994-09-17 Device for a measuring probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19893902095 DE3902095C2 (en) 1989-01-25 1989-01-25 Measuring probe for measuring thin layers

Publications (3)

Publication Number Publication Date
GB8904428D0 GB8904428D0 (en) 1989-04-12
GB2228571A GB2228571A (en) 1990-08-29
GB2228571B true GB2228571B (en) 1994-01-05

Family

ID=6372728

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8904428A Expired - Lifetime GB2228571B (en) 1989-01-25 1989-02-27 Device for a measuring probe

Country Status (3)

Country Link
DE (1) DE3902095C2 (en)
GB (1) GB2228571B (en)
HK (1) HK40695A (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19735433C2 (en) * 1996-09-04 1999-10-07 Nix Steingroeve Elektro Physik Measuring probe for measuring thin layers using a magnetic or eddy current method
DE19635855C2 (en) * 1996-09-04 2001-03-08 Elektrophysik Dr Steingroever Method and measuring probe for measuring the thickness of powdery or soft layer materials on a solid base material
US6011391A (en) * 1996-09-04 2000-01-04 Elektro-Physik Hans Nix Probe for measuring thin layers using a magnetic or eddy current process
DE19649515B4 (en) * 1996-11-29 2005-02-24 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Method and device for measuring the thickness of thin layers and circuit for driving the device
DE19722014C2 (en) * 1997-05-27 1999-11-04 Nix Steingroeve Elektro Physik Measuring probe for measuring the thickness of layers on a substrate
DE10014348B4 (en) * 2000-03-24 2009-03-12 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Device for nondestructive measurement of the thickness of thin layers
GB2397652B (en) * 2002-11-15 2005-12-21 Immobilienges Helmut Fischer Measurement probe for measurement of the thickness of thin layers
DE10348652B4 (en) * 2002-11-15 2015-12-03 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Measuring probe, in particular for a device for measuring the thickness of thin layers
DE102005054593B4 (en) * 2005-11-14 2018-04-26 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Measuring probe for measuring the thickness of thin layers

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1165631A (en) * 1967-02-14 1969-10-01 Kh I Avtomatiki Device for Measuring Absolute Vibrations in Rotor-Stator Systems.
GB1418853A (en) * 1973-03-23 1975-12-24 Siderurgie Fse Inst Rech Device for automatically following crack propagation in an object
US4005360A (en) * 1974-12-14 1977-01-25 Albert Ott Probe with ball bearing ball
US4490913A (en) * 1983-01-24 1985-01-01 Vis Arthur D Low contact force position sensing probe

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2933677A (en) * 1955-08-26 1960-04-19 Unit Process Assemblies Probe for a thickness testing gage
DE2107076C3 (en) * 1971-02-15 1975-01-30 Elektro-Physik Hans Nix & Dr.-Ing. E. Steingroever Kg, 5000 Koeln Magnetic layer thickness meter
DE2556340A1 (en) * 1975-12-13 1977-06-16 Fischer Gmbh & Co Helmut END PIECE FOR PROBE
DE3437253A1 (en) * 1983-08-31 1986-04-17 Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen Electromagnetic measurement probe
DE3331407A1 (en) * 1983-08-31 1985-03-14 Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen Electromagnetic measuring probe
CH667727A5 (en) * 1985-05-28 1988-10-31 Zellweger Uster Ag MEASURING HEAD FOR INDUCTIVE MEASUREMENT OF THE THICKNESS OF AN INSULATING LAYER ON AN ELECTRIC CONDUCTOR.

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1165631A (en) * 1967-02-14 1969-10-01 Kh I Avtomatiki Device for Measuring Absolute Vibrations in Rotor-Stator Systems.
GB1418853A (en) * 1973-03-23 1975-12-24 Siderurgie Fse Inst Rech Device for automatically following crack propagation in an object
US4005360A (en) * 1974-12-14 1977-01-25 Albert Ott Probe with ball bearing ball
US4490913A (en) * 1983-01-24 1985-01-01 Vis Arthur D Low contact force position sensing probe

Also Published As

Publication number Publication date
GB8904428D0 (en) 1989-04-12
DE3902095C2 (en) 1997-01-16
HK40695A (en) 1995-03-31
DE3902095A1 (en) 1990-07-26
GB2228571A (en) 1990-08-29

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Legal Events

Date Code Title Description
PE20 Patent expired after termination of 20 years

Expiry date: 20090226