HK40695A - Device for a measuring probe - Google Patents
Device for a measuring probeInfo
- Publication number
- HK40695A HK40695A HK40695A HK40695A HK40695A HK 40695 A HK40695 A HK 40695A HK 40695 A HK40695 A HK 40695A HK 40695 A HK40695 A HK 40695A HK 40695 A HK40695 A HK 40695A
- Authority
- HK
- Hong Kong
- Prior art keywords
- measuring probe
- probe
- measuring
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
- G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19893902095 DE3902095C2 (en) | 1989-01-25 | 1989-01-25 | Measuring probe for measuring thin layers |
Publications (1)
Publication Number | Publication Date |
---|---|
HK40695A true HK40695A (en) | 1995-03-31 |
Family
ID=6372728
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK40695A HK40695A (en) | 1989-01-25 | 1995-03-23 | Device for a measuring probe |
Country Status (3)
Country | Link |
---|---|
DE (1) | DE3902095C2 (en) |
GB (1) | GB2228571B (en) |
HK (1) | HK40695A (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19735433C2 (en) * | 1996-09-04 | 1999-10-07 | Nix Steingroeve Elektro Physik | Measuring probe for measuring thin layers using a magnetic or eddy current method |
US6011391A (en) * | 1996-09-04 | 2000-01-04 | Elektro-Physik Hans Nix | Probe for measuring thin layers using a magnetic or eddy current process |
DE19635855C2 (en) * | 1996-09-04 | 2001-03-08 | Elektrophysik Dr Steingroever | Method and measuring probe for measuring the thickness of powdery or soft layer materials on a solid base material |
DE19649515B4 (en) * | 1996-11-29 | 2005-02-24 | Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg | Method and device for measuring the thickness of thin layers and circuit for driving the device |
DE19722014C2 (en) * | 1997-05-27 | 1999-11-04 | Nix Steingroeve Elektro Physik | Measuring probe for measuring the thickness of layers on a substrate |
DE10014348B4 (en) * | 2000-03-24 | 2009-03-12 | Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg | Device for nondestructive measurement of the thickness of thin layers |
DE10348652B4 (en) * | 2002-11-15 | 2015-12-03 | Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg | Measuring probe, in particular for a device for measuring the thickness of thin layers |
GB2397652B (en) * | 2002-11-15 | 2005-12-21 | Immobilienges Helmut Fischer | Measurement probe for measurement of the thickness of thin layers |
DE102005054593B4 (en) * | 2005-11-14 | 2018-04-26 | Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg | Measuring probe for measuring the thickness of thin layers |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2933677A (en) * | 1955-08-26 | 1960-04-19 | Unit Process Assemblies | Probe for a thickness testing gage |
GB1165631A (en) * | 1967-02-14 | 1969-10-01 | Kh I Avtomatiki | Device for Measuring Absolute Vibrations in Rotor-Stator Systems. |
DE2107076C3 (en) * | 1971-02-15 | 1975-01-30 | Elektro-Physik Hans Nix & Dr.-Ing. E. Steingroever Kg, 5000 Koeln | Magnetic layer thickness meter |
FR2222912A5 (en) * | 1973-03-23 | 1974-10-18 | Siderurgie Fse Inst Rech | |
US4005360A (en) * | 1974-12-14 | 1977-01-25 | Albert Ott | Probe with ball bearing ball |
DE2556340A1 (en) * | 1975-12-13 | 1977-06-16 | Fischer Gmbh & Co Helmut | END PIECE FOR PROBE |
US4490913A (en) * | 1983-01-24 | 1985-01-01 | Vis Arthur D | Low contact force position sensing probe |
DE3437253A1 (en) * | 1983-08-31 | 1986-04-17 | Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen | Electromagnetic measurement probe |
DE3331407A1 (en) * | 1983-08-31 | 1985-03-14 | Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen | Electromagnetic measuring probe |
CH667727A5 (en) * | 1985-05-28 | 1988-10-31 | Zellweger Uster Ag | MEASURING HEAD FOR INDUCTIVE MEASUREMENT OF THE THICKNESS OF AN INSULATING LAYER ON AN ELECTRIC CONDUCTOR. |
-
1989
- 1989-01-25 DE DE19893902095 patent/DE3902095C2/en not_active Expired - Lifetime
- 1989-02-27 GB GB8904428A patent/GB2228571B/en not_active Expired - Lifetime
-
1995
- 1995-03-23 HK HK40695A patent/HK40695A/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
GB2228571B (en) | 1994-01-05 |
GB2228571A (en) | 1990-08-29 |
DE3902095A1 (en) | 1990-07-26 |
DE3902095C2 (en) | 1997-01-16 |
GB8904428D0 (en) | 1989-04-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PF | Patent in force | ||
PE | Patent expired |
Effective date: 20090226 |