HK40695A - Device for a measuring probe - Google Patents

Device for a measuring probe

Info

Publication number
HK40695A
HK40695A HK40695A HK40695A HK40695A HK 40695 A HK40695 A HK 40695A HK 40695 A HK40695 A HK 40695A HK 40695 A HK40695 A HK 40695A HK 40695 A HK40695 A HK 40695A
Authority
HK
Hong Kong
Prior art keywords
measuring probe
probe
measuring
Prior art date
Application number
HK40695A
Inventor
Helmut Fischer
Original Assignee
Helmut Fischer Gmbh & Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Helmut Fischer Gmbh & Co filed Critical Helmut Fischer Gmbh & Co
Publication of HK40695A publication Critical patent/HK40695A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
HK40695A 1989-01-25 1995-03-23 Device for a measuring probe HK40695A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19893902095 DE3902095C2 (en) 1989-01-25 1989-01-25 Measuring probe for measuring thin layers

Publications (1)

Publication Number Publication Date
HK40695A true HK40695A (en) 1995-03-31

Family

ID=6372728

Family Applications (1)

Application Number Title Priority Date Filing Date
HK40695A HK40695A (en) 1989-01-25 1995-03-23 Device for a measuring probe

Country Status (3)

Country Link
DE (1) DE3902095C2 (en)
GB (1) GB2228571B (en)
HK (1) HK40695A (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19735433C2 (en) * 1996-09-04 1999-10-07 Nix Steingroeve Elektro Physik Measuring probe for measuring thin layers using a magnetic or eddy current method
US6011391A (en) * 1996-09-04 2000-01-04 Elektro-Physik Hans Nix Probe for measuring thin layers using a magnetic or eddy current process
DE19635855C2 (en) * 1996-09-04 2001-03-08 Elektrophysik Dr Steingroever Method and measuring probe for measuring the thickness of powdery or soft layer materials on a solid base material
DE19649515B4 (en) * 1996-11-29 2005-02-24 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Method and device for measuring the thickness of thin layers and circuit for driving the device
DE19722014C2 (en) * 1997-05-27 1999-11-04 Nix Steingroeve Elektro Physik Measuring probe for measuring the thickness of layers on a substrate
DE10014348B4 (en) * 2000-03-24 2009-03-12 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Device for nondestructive measurement of the thickness of thin layers
DE10348652B4 (en) * 2002-11-15 2015-12-03 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Measuring probe, in particular for a device for measuring the thickness of thin layers
GB2397652B (en) * 2002-11-15 2005-12-21 Immobilienges Helmut Fischer Measurement probe for measurement of the thickness of thin layers
DE102005054593B4 (en) * 2005-11-14 2018-04-26 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Measuring probe for measuring the thickness of thin layers

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2933677A (en) * 1955-08-26 1960-04-19 Unit Process Assemblies Probe for a thickness testing gage
GB1165631A (en) * 1967-02-14 1969-10-01 Kh I Avtomatiki Device for Measuring Absolute Vibrations in Rotor-Stator Systems.
DE2107076C3 (en) * 1971-02-15 1975-01-30 Elektro-Physik Hans Nix & Dr.-Ing. E. Steingroever Kg, 5000 Koeln Magnetic layer thickness meter
FR2222912A5 (en) * 1973-03-23 1974-10-18 Siderurgie Fse Inst Rech
US4005360A (en) * 1974-12-14 1977-01-25 Albert Ott Probe with ball bearing ball
DE2556340A1 (en) * 1975-12-13 1977-06-16 Fischer Gmbh & Co Helmut END PIECE FOR PROBE
US4490913A (en) * 1983-01-24 1985-01-01 Vis Arthur D Low contact force position sensing probe
DE3437253A1 (en) * 1983-08-31 1986-04-17 Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen Electromagnetic measurement probe
DE3331407A1 (en) * 1983-08-31 1985-03-14 Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen Electromagnetic measuring probe
CH667727A5 (en) * 1985-05-28 1988-10-31 Zellweger Uster Ag MEASURING HEAD FOR INDUCTIVE MEASUREMENT OF THE THICKNESS OF AN INSULATING LAYER ON AN ELECTRIC CONDUCTOR.

Also Published As

Publication number Publication date
GB2228571B (en) 1994-01-05
GB2228571A (en) 1990-08-29
DE3902095A1 (en) 1990-07-26
DE3902095C2 (en) 1997-01-16
GB8904428D0 (en) 1989-04-12

Similar Documents

Publication Publication Date Title
EP0390261A3 (en) Device for measuring a relative displacement
GB9010384D0 (en) Distance measuring device
EP0407908A3 (en) Position measuring device
GB2232487B (en) Ultrasonic measuring apparatus including a high-damping probe
EP0416391A3 (en) Device for measuring angles or lengths
EP0344645A3 (en) Device for measuring reflection
GB2228571B (en) Device for a measuring probe
GB8910875D0 (en) Measuring device
GB9005249D0 (en) Apparatus for measuring biopermeability
GB8912643D0 (en) Distance measurement device
GB8816358D0 (en) Probe for use with measuring apparatus
GB2212278B (en) Device for a hardness measuring instrument
SG132694G (en) Device for a measuring probe
GB2211949B (en) Device for a hardness measuring instrument
GB8724176D0 (en) Accuracy testing device
GB8803939D0 (en) Device for measuring height
SU1654655A1 (en) Device for object slope measurement
GB8922386D0 (en) A distance-speed measuring device
GB8815238D0 (en) Measuring device
GB8819296D0 (en) Measuring device
GB8913377D0 (en) Measuring device
PL280495A1 (en) Measuring device
GB8920438D0 (en) Measuring device
GB8927076D0 (en) Measuring device
GB8917513D0 (en) Measuring device

Legal Events

Date Code Title Description
PF Patent in force
PE Patent expired

Effective date: 20090226