HK133996A - Adapter for a device for electronic testing of printed circuit boards - Google Patents

Adapter for a device for electronic testing of printed circuit boards

Info

Publication number
HK133996A
HK133996A HK133996A HK133996A HK133996A HK 133996 A HK133996 A HK 133996A HK 133996 A HK133996 A HK 133996A HK 133996 A HK133996 A HK 133996A HK 133996 A HK133996 A HK 133996A
Authority
HK
Hong Kong
Prior art keywords
circuit boards
circuit board
printed circuit
testing
adapter
Prior art date
Application number
HK133996A
Other languages
English (en)
Inventor
Paul Mang
Savvas Arampoglou
Original Assignee
Mania Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mania Gmbh filed Critical Mania Gmbh
Publication of HK133996A publication Critical patent/HK133996A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Measuring Leads Or Probes (AREA)
  • Mounting Of Printed Circuit Boards And The Like (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
HK133996A 1987-11-09 1996-07-25 Adapter for a device for electronic testing of printed circuit boards HK133996A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP87116528A EP0315707B1 (fr) 1987-11-09 1987-11-09 Adaptateur pour un dispositif pour l'essai électronique de cartes de circuits imprimés

Publications (1)

Publication Number Publication Date
HK133996A true HK133996A (en) 1996-08-02

Family

ID=8197434

Family Applications (1)

Application Number Title Priority Date Filing Date
HK133996A HK133996A (en) 1987-11-09 1996-07-25 Adapter for a device for electronic testing of printed circuit boards

Country Status (8)

Country Link
US (1) US4834659A (fr)
EP (1) EP0315707B1 (fr)
JP (1) JPH087249B2 (fr)
AT (1) ATE75319T1 (fr)
CA (1) CA1271565A (fr)
DE (2) DE3778548D1 (fr)
ES (1) ES2030694T3 (fr)
HK (1) HK133996A (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4035978A1 (de) * 1990-02-16 1991-08-22 Luther Erich Verfahren und vorrichtung zum laden eines adapters fuer ein leiterplattenpruefgeraet
DE69212195T2 (de) 1991-04-11 1996-12-19 Methode Electronics Inc Gerät zum elektronischen Testen von gedruckten Leiterplatten oder ähnlichem
EP0544957B1 (fr) * 1991-12-06 1995-05-17 Sigmatech Co. Ltd. Appareil pour inspecter le circuit intérieur d'un dispositif semi-conducteur
DE9401114U1 (de) * 1994-01-24 1995-02-16 Siemens AG, 80333 München Anschlußmodul
US5575076A (en) * 1994-07-13 1996-11-19 Methode Electronics, Inc. Circuit board testing fixture with registration plate
US5898314A (en) * 1996-02-26 1999-04-27 Delaware Capital Formation, Inc. Translator fixture with force applying blind pins
US5939892A (en) * 1996-04-12 1999-08-17 Methode Electronics, Inc. Circuit board testing fixture
DE29616272U1 (de) * 1996-09-18 1998-01-29 atg test systems GmbH, 97877 Wertheim Adapter zum Prüfen von elektrischen Leiterplatten
DE10004974A1 (de) * 2000-02-04 2001-08-09 Atg Test Systems Gmbh Adapter zum Prüfen von Leiterplatten und Nadel für einen solchen Adapter
US9113845B2 (en) * 2009-01-08 2015-08-25 Given Imaging Ltd. Device and method for assembling in vivo sensing devices
DE102009016181A1 (de) * 2009-04-03 2010-10-14 Atg Luther & Maelzer Gmbh Kontaktierungseinheit für eine Testvorrichtung zum Testen von Leiterplatten
KR101845652B1 (ko) * 2017-01-17 2018-04-04 주식회사 텝스 부품 실장된 웨이퍼 테스트를 위한 하이브리드 프로브 카드

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3330522A (en) * 1965-12-10 1967-07-11 Clevite Corp Vibration isolating mount
US3676776A (en) * 1970-01-19 1972-07-11 Siemens Ag Testing probe construction
US3970934A (en) * 1974-08-12 1976-07-20 Akin Aksu Printed circuit board testing means
US4099120A (en) * 1976-04-19 1978-07-04 Akin Aksu Probe head for testing printed circuit boards
DE2933862A1 (de) * 1979-08-21 1981-03-12 Paul Mang Vorrichtung zur elektronischen pruefung von leiterplatten.
US4626776A (en) * 1984-06-07 1986-12-02 O. B. Test Group, Inc. Programmable test fixture
DE3524229A1 (de) * 1984-07-10 1986-01-16 Ingun Prüfmittelbau GmbH & Co KG Elektronik, 7750 Konstanz Vorrichtung zum pruefen von pruefpunkten einer elektronischen leiterplatte od. dgl. als pruefling mittels kontaktstiften
EP0215146B1 (fr) * 1985-09-16 1988-08-03 MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH Dispositif d'essai électronique de circuits imprimés ou analogues
JPS6267469A (ja) * 1985-09-20 1987-03-27 Kyoei Sangyo Kk プリント配線板検査機用アダプタ
DE3539720A1 (de) * 1985-11-08 1987-05-14 Martin Maelzer Adapter fuer ein leiterplattenpruefgeraet
JPS62144078A (ja) * 1985-12-19 1987-06-27 Hitachi Electronics Eng Co Ltd 格子変換器
JPS62162388A (ja) * 1986-01-13 1987-07-18 松下電器産業株式会社 プリント配線板用検査装置
EP0233511A1 (fr) * 1986-01-27 1987-08-26 Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung Dispositif pour tester des pastilles

Also Published As

Publication number Publication date
JPH01143977A (ja) 1989-06-06
ATE75319T1 (de) 1992-05-15
ES2030694T3 (es) 1992-11-16
DE3778548D1 (de) 1992-05-27
JPH087249B2 (ja) 1996-01-29
CA1271565A (fr) 1990-07-10
US4834659A (en) 1989-05-30
EP0315707A1 (fr) 1989-05-17
DE8807847U1 (de) 1988-08-04
EP0315707B1 (fr) 1992-04-22

Similar Documents

Publication Publication Date Title
AU574933B2 (en) Testing printed circuit boards
SE8106000L (sv) Provningsanordning
ATE137338T1 (de) Testanordnung mit filmadaptor fuer leiterplatten
HK133996A (en) Adapter for a device for electronic testing of printed circuit boards
DK0920714T4 (da) Elektrisk eller elektronisk apparat
DE3752227D1 (de) Vorrichtung zum elektronischen Prüfen von Leiterplatten mit Kontaktpunkten in extrem feinem Raster (1/20 bis 1/10 Zoll)
MY111967A (en) Apparatus for interconnecting electrical contacts
DE3466079D1 (en) Contact spring assembly for a computer-controlled printed circuit board testing device
DE3479341D1 (en) Adapter for a printed-circuit board testing device
DE69502276D1 (de) Leiterplattentestanordnung mit testadapter und methode zum ausrichten dessen
DE69018668D1 (de) Elektro-optisches Inspektionsgerät für gedruckte Leiterplatten mit darauf montierten Bauelementen.
HK187695A (en) A device for testing a printed circuit board
DE3779623D1 (de) Vorrichtung zum pruefen von elektrischen leiterplatten.
DE59003478D1 (de) Verfahren zur Kontaktierung von Schirmblechen.
CA1269758C (fr) Dispositif de verification electronique a cassette
SG129234A1 (en) Adapter method and apparatus for interfacing a tester with a device under test
DE3682513D1 (de) Vorrichtung zur selbsttaetigen ueberpruefung von auf flaechen zu montierenden komponenten.
FR2443789A3 (fr) Dispositif de montage a connexion pour appareils electriques
DE69704384D1 (de) Gehäuse für Elektrizitätsmeter
DE69203110D1 (de) Vorrichtung zum Verbinden der Kontaktstifte eines in einem dual-in-line (DIL) Gehäuse montierten integrierten Schaltkreises mit gedruckten Schaltungen auf einer Leiterplatte auf n verschiedene Weisen.
DE3568085D1 (en) Device for testing printed circuit boards with a grid of contact points of elevated density
GB2223354B (en) Semiconductor devices
SE9402155D0 (sv) Adapter för användning vid en apparat för testning av kretskort
DE59600210D1 (de) Vorrichtung zur Masseverbindung einer Flachbaugruppe
SE9404083D0 (sv) Förfarande, anordning och kretskort för test av elektroniska komponenter

Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)