HK1254956A1 - 自動化的延遲線對準 - Google Patents

自動化的延遲線對準

Info

Publication number
HK1254956A1
HK1254956A1 HK18114060.6A HK18114060A HK1254956A1 HK 1254956 A1 HK1254956 A1 HK 1254956A1 HK 18114060 A HK18114060 A HK 18114060A HK 1254956 A1 HK1254956 A1 HK 1254956A1
Authority
HK
Hong Kong
Prior art keywords
delay line
line alignment
automated delay
automated
alignment
Prior art date
Application number
HK18114060.6A
Other languages
English (en)
Inventor
A‧索博列夫
N．庫拉金
A．古謝夫
Original Assignee
阿爾特勒法斯特系統公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 阿爾特勒法斯特系統公司 filed Critical 阿爾特勒法斯特系統公司
Publication of HK1254956A1 publication Critical patent/HK1254956A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0289—Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/28—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source
    • G01J1/30—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0291—Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0297—Constructional arrangements for removing other types of optical noise or for performing calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/636—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nonlinear Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
HK18114060.6A 2015-08-21 2018-11-02 自動化的延遲線對準 HK1254956A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201562208546P 2015-08-21 2015-08-21
PCT/US2016/047838 WO2017035005A1 (en) 2015-08-21 2016-08-19 Automated delay line alignment

Publications (1)

Publication Number Publication Date
HK1254956A1 true HK1254956A1 (zh) 2019-08-02

Family

ID=56896769

Family Applications (1)

Application Number Title Priority Date Filing Date
HK18114060.6A HK1254956A1 (zh) 2015-08-21 2018-11-02 自動化的延遲線對準

Country Status (4)

Country Link
US (3) US10209131B2 (zh)
CN (4) CN113834567A (zh)
HK (1) HK1254956A1 (zh)
WO (2) WO2017035005A1 (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI729403B (zh) * 2019-05-31 2021-06-01 致茂電子股份有限公司 光電元件特性測量裝置
CN111780691B (zh) * 2020-07-10 2022-01-28 哈尔滨理工大学 自定心激光角度测量系统
CN113671803A (zh) * 2021-08-13 2021-11-19 暨南大学 一种空间光场振幅及相位复合调制系统、方法及其检测系统

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3855021T2 (de) * 1987-04-13 1996-07-18 Nec Corp Optisches Ausrichtungssystem
LU87003A1 (fr) * 1987-09-29 1989-04-06 Europ Communities Systeme de poursuite d'une cible
US5536916A (en) * 1994-09-30 1996-07-16 Sanyo Machine Works, Ltd. Method for performing automatic alignment-adjustment of laser robot and the device
US6792369B2 (en) * 2002-08-09 2004-09-14 Raytheon Company System and method for automatically calibrating an alignment reference source
US6816535B2 (en) * 2002-09-17 2004-11-09 Northrop Grumman Corporation Co-alignment of time-multiplexed pulsed laser beams to a single reference point
CN1554931A (zh) * 2003-12-26 2004-12-15 北京邮电大学 飞秒级超短光脉冲测量方法及装置
US8049135B2 (en) * 2004-06-18 2011-11-01 Electro Scientific Industries, Inc. Systems and methods for alignment of laser beam(s) for semiconductor link processing
US7182510B2 (en) * 2005-04-04 2007-02-27 David Gerard Cahill Apparatus and method for measuring thermal conductivity
US8724111B2 (en) * 2011-08-16 2014-05-13 Alex Gusev Flash photolysis system
DE102011115944B4 (de) * 2011-10-08 2013-06-06 Jenlab Gmbh Flexibles nichtlineares Laserscanning-Mikroskop zur nicht-invasiven dreidimensionalen Detektion
CN103364090B (zh) * 2013-07-22 2015-10-21 北京工业大学 测量超短脉冲激光在介质中传播相速度的装置及方法
CN104236711B (zh) * 2014-09-29 2016-03-09 哈尔滨工业大学 一种用于分子超快动力学研究的飞秒cars三维光谱探测系统及探测方法

Also Published As

Publication number Publication date
WO2017035005A1 (en) 2017-03-02
CN113108901A (zh) 2021-07-13
US20200173851A1 (en) 2020-06-04
WO2018034725A1 (en) 2018-02-22
US11359964B2 (en) 2022-06-14
CN108351250B (zh) 2021-01-29
US20180245977A1 (en) 2018-08-30
CN108139266A (zh) 2018-06-08
US20200400493A1 (en) 2020-12-24
US10209131B2 (en) 2019-02-19
CN108351250A (zh) 2018-07-31
US10809125B2 (en) 2020-10-20
CN108139266B (zh) 2021-07-06
CN113834567A (zh) 2021-12-24

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