HK1204060A1 - Small-angle self-pendulum type large-size multi-layer spiral ct equipment and inspection method ct - Google Patents

Small-angle self-pendulum type large-size multi-layer spiral ct equipment and inspection method ct

Info

Publication number
HK1204060A1
HK1204060A1 HK15104611.4A HK15104611A HK1204060A1 HK 1204060 A1 HK1204060 A1 HK 1204060A1 HK 15104611 A HK15104611 A HK 15104611A HK 1204060 A1 HK1204060 A1 HK 1204060A1
Authority
HK
Hong Kong
Prior art keywords
equipment
small
inspection method
pendulum type
type large
Prior art date
Application number
HK15104611.4A
Other languages
English (en)
Chinese (zh)
Inventor
康克軍陳志强李元景張麗趙自然劉耀紅顧建平李亮邢宇翔
Original Assignee
Univ Tsinghua
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Tsinghua, Nuctech Co Ltd filed Critical Univ Tsinghua
Publication of HK1204060A1 publication Critical patent/HK1204060A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/226—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays using tomography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Radiology & Medical Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Pulmonology (AREA)
  • Engineering & Computer Science (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
HK15104611.4A 2014-08-27 2015-05-15 Small-angle self-pendulum type large-size multi-layer spiral ct equipment and inspection method ct HK1204060A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410427466.XA CN104198506B (zh) 2014-08-27 2014-08-27 小角度自摆式大型多层螺旋ct设备和检查方法

Publications (1)

Publication Number Publication Date
HK1204060A1 true HK1204060A1 (en) 2015-11-06

Family

ID=52083831

Family Applications (1)

Application Number Title Priority Date Filing Date
HK15104611.4A HK1204060A1 (en) 2014-08-27 2015-05-15 Small-angle self-pendulum type large-size multi-layer spiral ct equipment and inspection method ct

Country Status (5)

Country Link
US (2) US20160084775A1 (xx)
EP (1) EP2990834B1 (xx)
CN (1) CN104198506B (xx)
HK (1) HK1204060A1 (xx)
PL (1) PL2990834T3 (xx)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104502382B (zh) * 2015-01-09 2018-05-15 天津三英精密仪器有限公司 一种新型岩心三维ct成像装置及用途
CN108120729B (zh) 2017-12-28 2024-04-02 清华大学 Ct检查系统和ct成像方法
CN108226195B (zh) 2017-12-28 2023-10-13 清华大学 Ct检查系统和ct成像方法
CN110432920A (zh) * 2019-07-09 2019-11-12 苏州雷泰智能科技有限公司 一种放射治疗cbct的成像方法及系统
CN111552002A (zh) * 2020-05-19 2020-08-18 重庆大学 一种三源摆动螺旋安检ct成像装置及方法
EP4036612A1 (en) * 2021-01-29 2022-08-03 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Ct system
US20240102947A1 (en) * 2022-09-27 2024-03-28 Baker Hughes Holdings Llc High resolution computed tomography object scanning

Family Cites Families (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2183387A5 (xx) * 1972-05-05 1973-12-14 Radiologie Cie Gle
JPS5764045A (en) * 1980-10-08 1982-04-17 Tokyo Shibaura Electric Co Method of collecting data of x-ray tomographing device
CN85101211A (zh) * 1985-04-01 1987-01-24 株式会社岛津制作所 正电子计算机断层摄影(ct)设备
US4885761A (en) * 1986-05-15 1989-12-05 Picker International, Inc. Gravity actuated X-ray scanner
US5966422A (en) * 1992-07-20 1999-10-12 Picker Medical Systems, Ltd. Multiple source CT scanner
JP2003522583A (ja) * 2000-02-15 2003-07-29 フィリップス メディカル システムズ テクノロジーズ リミテッド 臨床スクリーニングｃｔシステム
JP2002095655A (ja) * 2000-09-26 2002-04-02 Shimadzu Corp Ｃｔ装置
US6735271B1 (en) * 2000-11-28 2004-05-11 Ge Medical Systems Global Technology Company Llc Electron beam computed tomographic scanner system with helical or tilted target, collimator, and detector components to eliminate cone beam error and to scan continuously moving objects
US6611575B1 (en) * 2001-07-27 2003-08-26 General Electric Company Method and system for high resolution 3D visualization of mammography images
JP4172753B2 (ja) * 2002-04-03 2008-10-29 東芝医用システムエンジニアリング株式会社 Ｘ線画像撮影装置
JP2004177138A (ja) * 2002-11-25 2004-06-24 Hitachi Ltd 危険物探知装置および危険物探知方法
US7315611B2 (en) * 2003-06-03 2008-01-01 Monochromatic X-Ray Technologies, Inc. X-ray reflector exhibiting taper, method of making same, narrow band x-ray filters including same, devices including such filters, multispectral x-ray production via unispectral filter, and multispectral x-ray production via multispectral filter
US20050117700A1 (en) * 2003-08-08 2005-06-02 Peschmann Kristian R. Methods and systems for the rapid detection of concealed objects
JP2007533993A (ja) * 2004-04-21 2007-11-22 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 扇ビーム干渉性散乱コンピュータ断層撮影
WO2005119297A2 (en) * 2004-05-27 2005-12-15 L-3 Communications Security And Detection Systems, Inc. Contraband detection systems using a large-angle cone beam ct system
CN100518651C (zh) * 2004-08-12 2009-07-29 皇家飞利浦电子股份有限公司 具有可调节的旋转速度的计算机x射线层析摄影术扫描仪
CN100541187C (zh) * 2004-11-26 2009-09-16 同方威视技术股份有限公司 一种可ct断层扫描的集装箱检查系统
US7239684B2 (en) * 2005-02-28 2007-07-03 Mitsubishi Heavy Industries, Ltd. Radiotherapy apparatus monitoring therapeutic field in real-time during treatment
DE102005018329B4 (de) * 2005-04-20 2008-10-30 Siemens Ag Detektormodul für Röntgen- oder Gammastrahlung auf Basis von Wellenleitern
EP1762177B1 (en) * 2005-09-08 2014-11-05 Kabushiki Kaisha Toshiba X-ray computed tomographic apparatus
US7332722B1 (en) * 2006-02-21 2008-02-19 Jefferson Science Associates, Llc Simultaneous multi-headed imager geometry calibration method
JP4495109B2 (ja) * 2006-04-06 2010-06-30 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー Ｘ線ｃｔ装置
US7508910B2 (en) * 2006-05-04 2009-03-24 The Boeing Company System and methods for x-ray backscatter reverse engineering of structures
JP5389324B2 (ja) * 2006-12-18 2014-01-15 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー Ｘ線断層撮影装置
US7852979B2 (en) * 2007-04-05 2010-12-14 General Electric Company Dual-focus X-ray tube for resolution enhancement and energy sensitive CT
US8526571B2 (en) * 2008-06-03 2013-09-03 Koninklijke Philips N.V. Air bearing dynamic Z-axis balancing
US8094898B2 (en) * 2008-07-16 2012-01-10 Siemens Medical Solutions Usa, Inc. Functional image quality assessment
CN101683271B (zh) * 2008-09-28 2014-03-12 清华大学 X射线ct设备、图像重建方法和x射线成像方法
CN102421363B (zh) * 2009-05-08 2014-05-07 株式会社岛津制作所 X射线透视摄影台
US8340245B2 (en) * 2009-06-05 2012-12-25 Sentinel Scanning Corporation Transportation container inspection system and method
CN102188779B (zh) * 2011-05-26 2015-01-14 清华大学 用于肿瘤治疗的摆台装置和肿瘤精确靶向治疗设备
CN102853800B (zh) * 2011-06-30 2015-04-29 上海西门子医疗器械有限公司 一种测量ct设备机架摆动的模体、系统和方法
JP5981129B2 (ja) * 2011-12-01 2016-08-31 東芝メディカルシステムズ株式会社 Ｘ線コンピュータ断層撮影装置
EP2793701B1 (en) * 2011-12-20 2017-05-03 Koninklijke Philips N.V. Imaging system gantry
KR20130085630A (ko) * 2012-01-20 2013-07-30 삼성전자주식회사 진동 제어 장치와 진동 제어 방법, 컴퓨터 단층 촬영 장치
US8942348B2 (en) * 2012-02-09 2015-01-27 Elekta, Ltd. Methods and apparatus for providing accessories to a patient during radiation treatment
US9135728B2 (en) * 2012-04-04 2015-09-15 General Electric Company System and method for multi-energy computed tomography imaging
JP6125154B2 (ja) * 2012-05-09 2017-05-10 東芝メディカルシステムズ株式会社 Ｘ線撮影装置及び医用画像処理装置
JP6042095B2 (ja) * 2012-05-09 2016-12-14 東芝メディカルシステムズ株式会社 Ｘ線撮影装置及び医用画像処理装置
JP6042096B2 (ja) * 2012-05-09 2016-12-14 東芝メディカルシステムズ株式会社 Ｘ線撮影装置及び医用画像処理装置
JP6257962B2 (ja) * 2012-09-04 2018-01-10 東芝メディカルシステムズ株式会社 Ｘ線ｃｔ装置
JP5836244B2 (ja) * 2012-10-09 2015-12-24 三菱重工業株式会社 撮影制御装置、撮影システム、撮影制御方法およびプログラム
JP6294055B2 (ja) * 2012-11-27 2018-03-14 キヤノンメディカルシステムズ株式会社 Ｘ線ｃｔ装置及びｘ線ｃｔ装置用のデータ検出システム
JP2014166346A (ja) * 2013-01-31 2014-09-11 Toshiba Corp Ｘ線ｃｔ装置及びそのプログラム
US9974493B2 (en) * 2013-08-27 2018-05-22 Vatech Co., Ltd. Apparatus and method for obtaining computed tomography
JP5815626B2 (ja) * 2013-09-27 2015-11-17 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 放射線断層撮影装置の制御方法及び放射線断層撮影装置並びにプログラム
KR20150088679A (ko) * 2014-01-24 2015-08-03 주식회사바텍 Ct 촬영 장치
US9510793B2 (en) * 2014-01-27 2016-12-06 Epica International, Inc. Radiological imaging device with advanced sensors
CN204064976U (zh) * 2014-08-27 2014-12-31 清华大学 小角度自摆式大型多层螺旋ct设备
US9568441B2 (en) * 2015-01-28 2017-02-14 Morpho Detection, Llc Gantry system for CT imaging system and methods of assembling same

Also Published As

Publication number Publication date
US20160084775A1 (en) 2016-03-24
CN104198506A (zh) 2014-12-10
CN104198506B (zh) 2017-11-07
US20180328866A1 (en) 2018-11-15
US11022569B2 (en) 2021-06-01
EP2990834B1 (en) 2019-09-25
PL2990834T3 (pl) 2020-04-30
EP2990834A1 (en) 2016-03-02

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