HK1203629A1 - 測試裝置、測試方法及程序 - Google Patents

測試裝置、測試方法及程序

Info

Publication number
HK1203629A1
HK1203629A1 HK15104165.4A HK15104165A HK1203629A1 HK 1203629 A1 HK1203629 A1 HK 1203629A1 HK 15104165 A HK15104165 A HK 15104165A HK 1203629 A1 HK1203629 A1 HK 1203629A1
Authority
HK
Hong Kong
Prior art keywords
test
program
test method
test device
Prior art date
Application number
HK15104165.4A
Other languages
English (en)
Inventor
木股浩之
石坂哲
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of HK1203629A1 publication Critical patent/HK1203629A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2817—Environmental-, stress-, or burn-in tests

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
HK15104165.4A 2012-03-23 2015-04-29 測試裝置、測試方法及程序 HK1203629A1 (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2012/057636 WO2013140630A1 (ja) 2012-03-23 2012-03-23 検査装置、検査方法およびプログラム

Publications (1)

Publication Number Publication Date
HK1203629A1 true HK1203629A1 (zh) 2015-10-30

Family

ID=49222121

Family Applications (1)

Application Number Title Priority Date Filing Date
HK15104165.4A HK1203629A1 (zh) 2012-03-23 2015-04-29 測試裝置、測試方法及程序

Country Status (4)

Country Link
US (1) US9453868B2 (zh)
EP (1) EP2829885B1 (zh)
HK (1) HK1203629A1 (zh)
WO (1) WO2013140630A1 (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109948767A (zh) * 2018-02-01 2019-06-28 华为技术有限公司 存储卡和终端
TWI688938B (zh) 2018-05-22 2020-03-21 元太科技工業股份有限公司 可抑制電磁干擾的顯示裝置及顯示驅動電路
WO2023053246A1 (ja) * 2021-09-29 2023-04-06 三菱電機株式会社 ノイズ検出装置およびｐｌｃシステム
JP2023062736A (ja) * 2021-10-22 2023-05-09 アズールテスト株式会社 半導体デバイス検査装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2790888B2 (ja) * 1990-03-02 1998-08-27 日本電信電話株式会社 環境電磁雑音記録装置
JP2953761B2 (ja) 1990-08-31 1999-09-27 富士通株式会社 電源ノイズ検出回路
US5134366A (en) * 1991-06-21 1992-07-28 Digital Equipment Corporation Magnetic head testing apparatus for detecting occurrences of popcorn noise amid externally generated noise
JPH05209917A (ja) * 1992-01-30 1993-08-20 Fujitsu Ltd 簡易型パルス・ノイズ試験器
DE4224858C2 (de) * 1992-07-28 2000-03-30 Langer Guenter Verfahren zur Bestimmung der Prüflingsstörschwelle und Bewertung von EMV-Maßnahmen am Prüfling
JPH06332748A (ja) 1993-05-18 1994-12-02 Ibiden Co Ltd コンピュータシステムｌｅｄデバッガ
US5668477A (en) * 1995-02-16 1997-09-16 Read-Rite Corporation Noise detecting apparatus for magnetic heads
JP3552722B2 (ja) * 1995-03-27 2004-08-11 日立電子サービス株式会社 ノイズ検知記録装置
US6028423A (en) * 1997-12-11 2000-02-22 Sanchez; Jorge Isolation instrument for electrical testing
KR20000043490A (ko) * 1998-12-29 2000-07-15 윤종용 반도체 칩의 테스트 시스템 및 테스터
US7126356B2 (en) * 2004-04-30 2006-10-24 Intel Corporation Radiation detector for electrostatic discharge
US7151655B2 (en) * 2004-05-17 2006-12-19 Intel Corporation Electrostatic discharge (ESD) detector
JP2008177796A (ja) 2007-01-17 2008-07-31 Fuji Electric Fa Components & Systems Co Ltd 省配線システム、そのマスタ通信装置、そのプログラム、表示制御方法
KR101107932B1 (ko) * 2008-02-20 2012-01-25 베리지 (싱가포르) 피티이. 엘티디. 정전기 방전 이벤트 검출 시스템, 정전기 방전 이벤트 검출 방법 및 컴퓨터 판독가능한 저장 매체

Also Published As

Publication number Publication date
US9453868B2 (en) 2016-09-27
US20150241495A1 (en) 2015-08-27
EP2829885B1 (en) 2020-01-15
EP2829885A4 (en) 2015-12-23
EP2829885A1 (en) 2015-01-28
WO2013140630A1 (ja) 2013-09-26

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