HK1196484A1 - 用於傳感器故障檢測的系統及方法 - Google Patents

用於傳感器故障檢測的系統及方法

Info

Publication number
HK1196484A1
HK1196484A1 HK14109624.9A HK14109624A HK1196484A1 HK 1196484 A1 HK1196484 A1 HK 1196484A1 HK 14109624 A HK14109624 A HK 14109624A HK 1196484 A1 HK1196484 A1 HK 1196484A1
Authority
HK
Hong Kong
Prior art keywords
failure detection
sensor failure
sensor
detection
failure
Prior art date
Application number
HK14109624.9A
Other languages
English (en)
Inventor
．約翰遜
．馬蒂努森
Original Assignee
豪威科技股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 豪威科技股份有限公司 filed Critical 豪威科技股份有限公司
Publication of HK1196484A1 publication Critical patent/HK1196484A1/zh

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
HK14109624.9A 2013-02-08 2014-09-25 用於傳感器故障檢測的系統及方法 HK1196484A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/763,562 US8854475B2 (en) 2013-02-08 2013-02-08 System and method for sensor failure detection
US13/763,498 US8736684B1 (en) 2013-02-08 2013-02-08 System and method for sensor failure detection

Publications (1)

Publication Number Publication Date
HK1196484A1 true HK1196484A1 (zh) 2014-12-12

Family

ID=50736492

Family Applications (1)

Application Number Title Priority Date Filing Date
HK14109624.9A HK1196484A1 (zh) 2013-02-08 2014-09-25 用於傳感器故障檢測的系統及方法

Country Status (3)

Country Link
US (2) US8854475B2 (zh)
HK (1) HK1196484A1 (zh)
TW (2) TWI524737B (zh)

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DE102014215860A1 (de) * 2014-08-11 2016-02-11 Robert Bosch Gmbh Verfahren und Vorrichtung zur Prüfung eines Bildsensors und Kraftfahrzeug
FR3027402B1 (fr) 2014-10-21 2016-11-18 Centre Nat Rech Scient Circuit et procede pour le test sur puce d'une matrice de pixels
US9843794B2 (en) * 2015-04-01 2017-12-12 Semiconductor Components Industries, Llc Imaging systems with real-time digital testing capabilities
US10075704B2 (en) 2015-05-20 2018-09-11 Semiconductor Components Industries, Llc Methods and apparatus for generating test and overlay patterns in image sensors
US9843797B2 (en) 2015-06-11 2017-12-12 Semiconductor Components Industries, Llc Imaging systems having column readout circuitry with test data injection capabilities
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US10547803B2 (en) 2016-09-30 2020-01-28 Canon Kabushiki Kaisha Imaging apparatuses, systems, and moving imaging objects
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US9998700B1 (en) 2016-12-05 2018-06-12 Omnivision Technologies, Inc. Image sensor failure detection
WO2018150778A1 (ja) 2017-02-16 2018-08-23 ソニーセミコンダクタソリューションズ株式会社 撮像システムおよび撮像装置
KR102302595B1 (ko) 2017-05-08 2021-09-15 삼성전자주식회사 테스트 회로를 포함하는 이미지 센서
US10955551B2 (en) 2017-10-16 2021-03-23 Sensors Unlimited, Inc. Pixel output processing circuit with laser range finding (LRF) capability
US10520589B2 (en) 2017-10-16 2019-12-31 Sensors Unlimited, Inc. Multimode ROIC pixel with laser range finding (LRF) capability
JP7098346B2 (ja) * 2018-02-13 2022-07-11 ソニーセミコンダクタソリューションズ株式会社 撮像装置および撮像システム
CN117479032A (zh) 2018-03-07 2024-01-30 索尼半导体解决方案公司 成像设备和成像方法
JP2019176334A (ja) * 2018-03-28 2019-10-10 ソニーセミコンダクタソリューションズ株式会社 固体撮像素子、テストシステム、および、固体撮像素子の制御方法
US10863122B2 (en) 2018-06-04 2020-12-08 Apple Inc. Clock feedthrough compensation in image sensor systems
US11109017B2 (en) * 2018-09-12 2021-08-31 Semiconductor Components Industries, Llc Systems and methods for fault detection in image sensor processors
TWI803695B (zh) * 2018-11-07 2023-06-01 日商索尼半導體解決方案公司 攝像裝置及電子機器
JP2021025896A (ja) * 2019-08-06 2021-02-22 日本電産サンキョー株式会社 エンコーダシステム、モータシステム及びロボット
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JP2023532400A (ja) * 2020-05-22 2023-07-28 ブリルニクス シンガポール プライベート リミテッド デジタル画素センサのためのシステム、方法、デバイス、およびデータ構造

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Also Published As

Publication number Publication date
TWI507811B (zh) 2015-11-11
TW201433145A (zh) 2014-08-16
US20140226027A1 (en) 2014-08-14
US8854475B2 (en) 2014-10-07
TWI524737B (zh) 2016-03-01
TW201432366A (zh) 2014-08-16
US8736684B1 (en) 2014-05-27

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