HK1134138A1 - Statistical tomographic reconstruction based on measurements of charged particles - Google Patents

Statistical tomographic reconstruction based on measurements of charged particles

Info

Publication number
HK1134138A1
HK1134138A1 HK10101860.3A HK10101860A HK1134138A1 HK 1134138 A1 HK1134138 A1 HK 1134138A1 HK 10101860 A HK10101860 A HK 10101860A HK 1134138 A1 HK1134138 A1 HK 1134138A1
Authority
HK
Hong Kong
Prior art keywords
measurements
charged particles
reconstruction based
tomographic reconstruction
statistical
Prior art date
Application number
HK10101860.3A
Other languages
English (en)
Chinese (zh)
Inventor
Larry Joe Schultz
Alexei V Klimenko
Andrew Mcleod Fraser
Christopher L Morris
Konstantin N Borozdin
John Christopher Orum
Michael James Sossong
Nicolas W Hengartner
Original Assignee
洛斯阿拉莫斯國家安全股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 洛斯阿拉莫斯國家安全股份有限公司 filed Critical 洛斯阿拉莫斯國家安全股份有限公司
Publication of HK1134138A1 publication Critical patent/HK1134138A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/26—Passive interrogation, i.e. by measuring radiation emitted by objects or goods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/18—Complex mathematical operations for evaluating statistical data, e.g. average values, frequency distributions, probability functions, regression analysis

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Data Mining & Analysis (AREA)
  • Mathematical Analysis (AREA)
  • Pure & Applied Mathematics (AREA)
  • Computational Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Optimization (AREA)
  • Mathematical Physics (AREA)
  • Operations Research (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Probability & Statistics with Applications (AREA)
  • Software Systems (AREA)
  • Databases & Information Systems (AREA)
  • Evolutionary Biology (AREA)
  • General Engineering & Computer Science (AREA)
  • Algebra (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
HK10101860.3A 2006-10-27 2010-02-23 Statistical tomographic reconstruction based on measurements of charged particles HK1134138A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US85506406P 2006-10-27 2006-10-27
US11/771,169 US7633062B2 (en) 2006-10-27 2007-06-29 Radiation portal monitor system and method
PCT/US2007/082753 WO2008140560A2 (en) 2006-10-27 2007-10-26 Statistical tomographic reconstruction based on measurements of charged particles

Publications (1)

Publication Number Publication Date
HK1134138A1 true HK1134138A1 (en) 2010-04-16

Family

ID=39685038

Family Applications (2)

Application Number Title Priority Date Filing Date
HK10101862.1A HK1134139A1 (en) 2006-10-27 2010-02-23 Particle detection and applications in security and portal monitoring
HK10101860.3A HK1134138A1 (en) 2006-10-27 2010-02-23 Statistical tomographic reconstruction based on measurements of charged particles

Family Applications Before (1)

Application Number Title Priority Date Filing Date
HK10101862.1A HK1134139A1 (en) 2006-10-27 2010-02-23 Particle detection and applications in security and portal monitoring

Country Status (12)

Country Link
US (7) US7633062B2 (de)
EP (2) EP2087372A4 (de)
JP (5) JP5479904B2 (de)
CN (2) CN101606082B (de)
AU (2) AU2007353392A1 (de)
CA (3) CA2667446C (de)
ES (1) ES2891090T3 (de)
HK (2) HK1134139A1 (de)
IL (2) IL198295A (de)
RU (2) RU2468390C2 (de)
SG (1) SG175686A1 (de)
WO (5) WO2008123892A2 (de)

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WO2008118208A2 (en) 2008-10-02
JP6535067B2 (ja) 2019-06-26
JP5479904B2 (ja) 2014-04-23
IL198406A0 (en) 2010-02-17
WO2008140559A3 (en) 2009-02-26
CN101606083A (zh) 2009-12-16
IL198295A0 (en) 2010-02-17
JP2010508522A (ja) 2010-03-18
WO2008118208A3 (en) 2009-03-12
IL198406A (en) 2015-03-31
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JP6266967B2 (ja) 2018-01-24
WO2008118209A3 (en) 2009-02-26
US7838841B2 (en) 2010-11-23
US7714297B2 (en) 2010-05-11
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US8552370B2 (en) 2013-10-08
JP2010508521A (ja) 2010-03-18
JP5623746B2 (ja) 2014-11-12
EP2087375A4 (de) 2015-03-04
RU2468390C2 (ru) 2012-11-27
RU2468391C2 (ru) 2012-11-27
WO2008123892A3 (en) 2009-02-12
WO2008140560A3 (en) 2009-02-26
CA2667446C (en) 2018-01-23
HK1134139A1 (en) 2010-04-16
WO2008140559A2 (en) 2008-11-20
US20080228418A1 (en) 2008-09-18
EP2087372A4 (de) 2014-09-24
CA2667777A1 (en) 2008-10-02
US20100032564A1 (en) 2010-02-11
WO2008123892A9 (en) 2008-11-27
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JP2016186486A (ja) 2016-10-27
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