HK1077634A1 - Measurement probe and authentication device and method comprising the same - Google Patents

Measurement probe and authentication device and method comprising the same

Info

Publication number
HK1077634A1
HK1077634A1 HK05109410.8A HK05109410A HK1077634A1 HK 1077634 A1 HK1077634 A1 HK 1077634A1 HK 05109410 A HK05109410 A HK 05109410A HK 1077634 A1 HK1077634 A1 HK 1077634A1
Authority
HK
Hong Kong
Prior art keywords
measurement probe
authentication device
same
coil
authentication
Prior art date
Application number
HK05109410.8A
Other languages
English (en)
Inventor
Edgar Mueller
Philipp Egger
Myron Seto
Original Assignee
Sicpa Holding Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sicpa Holding Sa filed Critical Sicpa Holding Sa
Publication of HK1077634A1 publication Critical patent/HK1077634A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
    • G01R33/14—Measuring or plotting hysteresis curves
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D7/00—Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency
    • G07D7/04—Testing magnetic properties of the materials thereof, e.g. by detection of magnetic imprint

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Inspection Of Paper Currency And Valuable Securities (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Slot Machines And Peripheral Devices (AREA)
  • Measuring And Recording Apparatus For Diagnosis (AREA)
  • Burglar Alarm Systems (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Measuring Magnetic Variables (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)
  • Electrophonic Musical Instruments (AREA)
  • Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
  • Measurement Of Radiation (AREA)
  • Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
  • Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
HK05109410.8A 2002-03-04 2005-10-21 Measurement probe and authentication device and method comprising the same HK1077634A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2002/002283 WO2003075030A1 (en) 2002-03-04 2002-03-04 Measurement probe and authentication device comprising the same

Publications (1)

Publication Number Publication Date
HK1077634A1 true HK1077634A1 (en) 2006-02-17

Family

ID=27771814

Family Applications (1)

Application Number Title Priority Date Filing Date
HK05109410.8A HK1077634A1 (en) 2002-03-04 2005-10-21 Measurement probe and authentication device and method comprising the same

Country Status (16)

Country Link
US (1) US7173416B2 (zh)
EP (1) EP1481257B1 (zh)
JP (1) JP2005519287A (zh)
KR (1) KR100849153B1 (zh)
CN (1) CN100504428C (zh)
AT (1) ATE474230T1 (zh)
AU (2) AU2002302380A1 (zh)
BR (1) BRPI0215628B1 (zh)
CA (1) CA2477575C (zh)
DE (1) DE60237042D1 (zh)
ES (1) ES2348907T3 (zh)
HK (1) HK1077634A1 (zh)
IL (1) IL163468A (zh)
MX (1) MXPA04008585A (zh)
UA (1) UA76581C2 (zh)
WO (1) WO2003075030A1 (zh)

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ATE490527T1 (de) * 2004-08-11 2010-12-15 Sensormatic Electronics Corp Deaktivierung für in der elektronischen artikelüberwachung verwendete magnetomechanische marker
JP4483497B2 (ja) * 2004-09-16 2010-06-16 富士ゼロックス株式会社 磁性体検知装置
FR2891917B1 (fr) * 2005-10-07 2008-01-11 Billanco Capteurs de champ magnetique et de courant, procede de commande et noyau magnetique pour ces capteurs
US20130126727A1 (en) * 2009-08-11 2013-05-23 The Regents Of The University Of California Time-of-Flight Electron Energy Analyzer
US8717012B2 (en) * 2011-04-28 2014-05-06 The United States of America as respresented by the United States National Aeronautics and Space Administration Eddy current probe for surface and sub-surface inspection
CN102262794A (zh) * 2011-08-10 2011-11-30 深圳市怡化电脑有限公司 用于钞票检测的智能型磁性传感器模组
CN103106727B (zh) * 2013-01-23 2014-04-09 广州纳龙智能科技有限公司 一种磁传感器及量化鉴定磁码磁滞迴线特征的方法
CN103366438B (zh) * 2013-07-06 2015-09-02 广州纳龙智能科技有限公司 一种磁传感器、量化鉴定磁码磁滞迴线特征的方法及自动柜员机、验钞机
JP6897470B2 (ja) * 2017-10-04 2021-06-30 日本製鉄株式会社 単板磁気特性試験器および単板磁気特性試験システム
KR20200019063A (ko) 2018-08-13 2020-02-21 한국전자통신연구원 시간 영역에서의 교류 전류를 이용한 자성 특성 곡선 획득 방법 및 이를 위한 장치
KR102140170B1 (ko) 2018-11-27 2020-07-31 조선대학교산학협력단 교차 경사형 유도전류를 이용한 비파괴 검사장치용 프로브 및 비파괴 검사장치용 유도코일 제조방법
US20200408633A1 (en) * 2019-06-25 2020-12-31 Machinesense, Llc Systems and methods for measuring structural element deflections

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Also Published As

Publication number Publication date
ES2348907T3 (es) 2010-12-16
AU2008246269A1 (en) 2008-12-11
UA76581C2 (uk) 2006-08-15
CN1623101A (zh) 2005-06-01
US20050225322A1 (en) 2005-10-13
JP2005519287A (ja) 2005-06-30
AU2008246269B2 (en) 2011-06-02
IL163468A (en) 2011-10-31
CN100504428C (zh) 2009-06-24
BRPI0215628B1 (pt) 2016-06-14
CA2477575C (en) 2009-11-24
KR100849153B1 (ko) 2008-07-30
BR0215628A (pt) 2004-12-21
KR20040086852A (ko) 2004-10-12
EP1481257B1 (en) 2010-07-14
DE60237042D1 (de) 2010-08-26
AU2002302380A1 (en) 2003-09-16
US7173416B2 (en) 2007-02-06
EP1481257A1 (en) 2004-12-01
WO2003075030A1 (en) 2003-09-12
ATE474230T1 (de) 2010-07-15
MXPA04008585A (es) 2004-12-06
CA2477575A1 (en) 2003-09-12
ES2348907T8 (es) 2011-03-17

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20170304