HK1040286A1 - 用以測量光散射的儀器 - Google Patents

用以測量光散射的儀器

Info

Publication number
HK1040286A1
HK1040286A1 HK02102027.1A HK02102027A HK1040286A1 HK 1040286 A1 HK1040286 A1 HK 1040286A1 HK 02102027 A HK02102027 A HK 02102027A HK 1040286 A1 HK1040286 A1 HK 1040286A1
Authority
HK
Hong Kong
Prior art keywords
instrument
light scattering
measuring light
measuring
scattering
Prior art date
Application number
HK02102027.1A
Other languages
English (en)
Inventor
Akagi Motonobu
Tsutsui Kazunori
Mizuguchi Tsutomu
Sekiwa Mitsunao
Original Assignee
Otsuka Denshi Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Otsuka Denshi Kk filed Critical Otsuka Denshi Kk
Publication of HK1040286A1 publication Critical patent/HK1040286A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/04—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres
    • G02B6/06—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres the relative position of the fibres being the same at both ends, e.g. for transporting images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4726—Detecting scatter at 90°
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N2021/4764—Special kinds of physical applications
    • G01N2021/4769—Fluid samples, e.g. slurries, granulates; Compressible powdery of fibrous samples

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
HK02102027.1A 1998-11-24 2002-03-15 用以測量光散射的儀器 HK1040286A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP33313098 1998-11-24
PCT/JP1999/006376 WO2000031514A1 (fr) 1998-11-24 1999-11-15 Instrument de mesure de la diffusion de la lumiere

Publications (1)

Publication Number Publication Date
HK1040286A1 true HK1040286A1 (zh) 2002-05-31

Family

ID=18262637

Family Applications (1)

Application Number Title Priority Date Filing Date
HK02102027.1A HK1040286A1 (zh) 1998-11-24 2002-03-15 用以測量光散射的儀器

Country Status (6)

Country Link
EP (1) EP1134578A4 (zh)
JP (1) JP4054178B2 (zh)
KR (1) KR100647749B1 (zh)
HK (1) HK1040286A1 (zh)
TW (1) TWM262704U (zh)
WO (1) WO2000031514A1 (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4316818B2 (ja) 2001-03-01 2009-08-19 大塚電子株式会社 光散乱測定プローブ
FR2843197B1 (fr) 2002-08-01 2005-08-05 Usinor Procede et dispositif de mesure en ligne de caracteristiques d'un revetement de surface d'un produit metallurgique.
US8101140B2 (en) 2008-02-26 2012-01-24 Battelle Memorial Institute Structured catalyst bed and method for conversion of feed materials to chemical products and liquid fuels
KR101297246B1 (ko) * 2010-10-01 2013-08-20 주식회사 한비세트론 면역응집 산란광 및 자체발광 형광 바이오칩 측정장치
CN108535673A (zh) * 2018-04-13 2018-09-14 中国计量科学研究院 一种基于磁共振成像的光散射测量装置
CN109142180B (zh) * 2018-07-13 2021-08-13 南京中医药大学 光学纳米结构探针及单细胞胶体渗透压检测平台及制作方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57190254A (en) * 1981-05-20 1982-11-22 Inoue Japax Res Inc Probe for turbidity gauge
US4801203A (en) * 1984-05-18 1989-01-31 Sharp Kabushiki Kaisha Detector of impurities in molten solder
JPS62245944A (ja) * 1986-04-18 1987-10-27 Fuji Photo Film Co Ltd 濃度測定用光源装置
JPS6312939A (ja) * 1986-07-04 1988-01-20 Sumitomo Electric Ind Ltd 空間結合型センサ
GB8705844D0 (en) * 1987-03-12 1987-04-15 Secr Defence Dynamic light scattering apparatus
JPH0658325B2 (ja) * 1988-09-01 1994-08-03 浜松ホトニクス株式会社 横方向光透過測定器
US5155549A (en) * 1990-10-25 1992-10-13 The Research Of State University Of New York Method and apparatus for determining the physical properties of materials using dynamic light scattering techniques
JPH0546880A (ja) * 1991-08-14 1993-02-26 Hochiki Corp 炎検出装置
US5284149A (en) * 1992-01-23 1994-02-08 Dhadwal Harbans S Method and apparatus for determining the physical characteristics of ocular tissue
US5815264A (en) * 1994-09-21 1998-09-29 Laser Sensor Technology, Inc System for acquiring an image of a multi-phase fluid by measuring backscattered light
IL111913A (en) * 1994-12-07 1997-07-13 Phone Or Ltd Sensor and a method for measuring distances to, and/or physical properties of, a medium
JPH08261928A (ja) * 1995-03-17 1996-10-11 Aretsuku Denshi Kk 濁度検出器
US5815611A (en) * 1995-08-11 1998-09-29 The Research Foundation Of State University Of New York Method and apparatus for submicroscopic particle sizing, and probe therefor

Also Published As

Publication number Publication date
WO2000031514A1 (fr) 2000-06-02
EP1134578A4 (en) 2002-04-10
KR20010101024A (ko) 2001-11-14
KR100647749B1 (ko) 2006-11-24
EP1134578A1 (en) 2001-09-19
TWM262704U (en) 2005-04-21
JP4054178B2 (ja) 2008-02-27

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