HK1000188A1 - Method for selecting a spare column in a memory and a circuit therefor - Google Patents

Method for selecting a spare column in a memory and a circuit therefor Download PDF

Info

Publication number
HK1000188A1
HK1000188A1 HK97101703A HK97101703A HK1000188A1 HK 1000188 A1 HK1000188 A1 HK 1000188A1 HK 97101703 A HK97101703 A HK 97101703A HK 97101703 A HK97101703 A HK 97101703A HK 1000188 A1 HK1000188 A1 HK 1000188A1
Authority
HK
Hong Kong
Prior art keywords
spare
pair
output
spare column
line
Prior art date
Application number
HK97101703A
Other languages
English (en)
Chinese (zh)
Other versions
HK1000188B (en
Inventor
Bae Myung-Ho
Original Assignee
Samsung Electronics Co. Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co. Ltd. filed Critical Samsung Electronics Co. Ltd.
Publication of HK1000188A1 publication Critical patent/HK1000188A1/xx
Publication of HK1000188B publication Critical patent/HK1000188B/xx

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
    • G11C29/846—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability by choosing redundant lines at an output stage

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
HK97101703.0A 1988-05-13 1997-09-02 Method for selecting a spare column in a memory and a circuit therefor HK1000188B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1019880005598A KR910003594B1 (ko) 1988-05-13 1988-05-13 스페어컬럼(column)선택방법 및 회로
KR885598 1988-05-13

Publications (2)

Publication Number Publication Date
HK1000188A1 true HK1000188A1 (en) 1998-01-23
HK1000188B HK1000188B (en) 1998-01-23

Family

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Also Published As

Publication number Publication date
KR910003594B1 (ko) 1991-06-07
US5045720A (en) 1991-09-03
NL193547C (nl) 2000-01-04
GB2218547A (en) 1989-11-15
FR2631483B1 (fr) 1994-01-07
DE3903486C2 (cs) 1991-06-27
KR890017704A (ko) 1989-12-16
GB8902434D0 (en) 1989-03-22
FR2631483A1 (fr) 1989-11-17
GB2218547B (en) 1992-10-14
JP2583304B2 (ja) 1997-02-19
NL8900265A (nl) 1989-12-01
DE3903486A1 (de) 1989-11-23
NL193547B (nl) 1999-09-01
JPH0218796A (ja) 1990-01-23

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PE Patent expired

Effective date: 20090202