GB957737A - Improvements relating to spectrometers - Google Patents

Improvements relating to spectrometers

Info

Publication number
GB957737A
GB957737A GB2095361A GB2095361A GB957737A GB 957737 A GB957737 A GB 957737A GB 2095361 A GB2095361 A GB 2095361A GB 2095361 A GB2095361 A GB 2095361A GB 957737 A GB957737 A GB 957737A
Authority
GB
United Kingdom
Prior art keywords
beams
elemental
pairs
polarized
degrees
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2095361A
Inventor
James Dyson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Associated Electrical Industries Ltd
Original Assignee
Associated Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Associated Electrical Industries Ltd filed Critical Associated Electrical Industries Ltd
Priority to GB2095361A priority Critical patent/GB957737A/en
Publication of GB957737A publication Critical patent/GB957737A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/26Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

957,737. Spectrometers. ASSOCIATED ELECTRICAL INDUSTRIES Ltd. June 8, 1962 [June 9, 1961], No. 20953/61. Heading G2J. A spectrometer comprises a beam splitter for dividing a light beam of narrow bandwidth into a plurality of plane polarized elemental beams of the same intensity, a plurality of interferometers for dividing each elemental beam into four pairs of interfering beams and for allowing these pairs to recombine so as to form, for each elemental beam, four interference patterns, and means for measuring the intensity of each interference pattern, the path difference for each pair of interfering beams being selected so that the four patterns are identical but have relative phase differences equal to a quarter of a cycle of the variation of the mean wavelength of the incident light beam. As shown in Fig. 1, a beam 1 is passed through a monochromator 2 and then split into plane polarized elemental beams at 3, each elemental beam passing to an interferometer 4 which divides it into four pairs of interfering beams forming interference patterns, the intensities of which are measured by photo-cells 5 associated with cathode ray tubes for displaying the output. Each interferometer may be, as shown in Fig. 3, a modified Michelson having a split cube with a polarizing interference filter at its interface 9. The reflected and transmitted component beams pass through quarter-wave plates 13, 14 before being reflected back to the cube whereby they are respectively transmitted and reflected, along the same path as two beams which are polarized in orthogonal planes and have a phase difference therebetween. Half of each beam then passes through a quarter-wave plate 15 so as to produce two pairs of beams, the path difference of one pair differing from that of the other. These two pairs of beams then pass through lens 16 to birefringent prism 17 whereby each beam is split into two beams polarized in planes at 90 degrees to each other and at 45 degrees to the plane of polarization of the incident beams. Thus eight beams are formed in four interfering pairs to give rise to four interference patterns. The device 3 of Fig. 1 may be formed from a number of double-image polarizing prisms in cascade. In an alternative the two component beams of which half of each passes through quarterwave plate 15 may be formed by splitting the elemental beam by a double image prism 21, Fig. 4, and passing them through lens 22 so that each strikes a part 23, 24 of a split concave mirror positioned so as to image the prism 21 back on itself. In yet another embodiment, the plane polarized elemental beam passes through a birefringent plate so as to form two component beams which are perpendicularly polarized and have a phase difference proportional to the thickness and birefringence of the plate. The birefringent plate in this embodiment may be replaced by two birefringent plates, relatively rotated through 90 degrees and having a quartz crystal therebetween, this crystal being cut normal to the optic axis and of a thickness such that the plane of polarization of light of the wavelength for which the apparatus is designed is rotated through 90 degrees.
GB2095361A 1961-06-09 1961-06-09 Improvements relating to spectrometers Expired GB957737A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB2095361A GB957737A (en) 1961-06-09 1961-06-09 Improvements relating to spectrometers

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB2095361A GB957737A (en) 1961-06-09 1961-06-09 Improvements relating to spectrometers

Publications (1)

Publication Number Publication Date
GB957737A true GB957737A (en) 1964-05-13

Family

ID=10154622

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2095361A Expired GB957737A (en) 1961-06-09 1961-06-09 Improvements relating to spectrometers

Country Status (1)

Country Link
GB (1) GB957737A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0155142A2 (en) * 1984-03-14 1985-09-18 The Secretary of State for Defence in Her Britannic Majesty's Government of the United Kingdom of Great Britain and Apparatus and method for remote sensing of gases, vapours or aerosols
FR2581190A1 (en) * 1985-04-25 1986-10-31 Elf France INTERFEROMETRIC DETECTOR OF GAS

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0155142A2 (en) * 1984-03-14 1985-09-18 The Secretary of State for Defence in Her Britannic Majesty's Government of the United Kingdom of Great Britain and Apparatus and method for remote sensing of gases, vapours or aerosols
EP0155142A3 (en) * 1984-03-14 1986-06-25 The Secretary Of State For Defence In Her Britannic Majesty's Government Of The United Kingdom Of Great Britain And Apparatus and method for remote sensing of gases, vapours or aerosols
FR2581190A1 (en) * 1985-04-25 1986-10-31 Elf France INTERFEROMETRIC DETECTOR OF GAS
US4732480A (en) * 1985-04-25 1988-03-22 Elf France Interferometric device for detecting gas

Similar Documents

Publication Publication Date Title
US3822942A (en) Method of testing a length, angle, path difference or speed by detecting interference and apparatus therefor
JP2005338076A (en) System using polarization operation retroreflector
US3177761A (en) Polariscope having simultaneously rotatable waveplates
CA1240174A (en) Method of and device for real time measurement of the state of polarization of a quasi-monochromatic light beam
US3434787A (en) Double axes interferometer
US3399591A (en) Interferometer for producing variable spatial frequency fringes
US5517022A (en) Apparatus for measuring an ambient isotropic parameter applied to a highly birefringent sensing fiber using interference pattern detection
JP7340555B2 (en) Methods for imaging or spectroscopy using nonlinear interferometry
US3849001A (en) Polarization interference correlation spectrometer
US9671287B2 (en) Hyperspectral imaging
US3620593A (en) Method of surface interference microscopy
US3737235A (en) Polarization interferometer with beam polarizing compensator
GB957737A (en) Improvements relating to spectrometers
US3520615A (en) Optical phase measuring apparatus
CN111562002B (en) High-flux high-resolution high-contrast polarization interference spectrum imaging device and method
US3664745A (en) Interferometer
GB768727A (en) Optical arrangement for splitting a light beam and for reuniting the (split) light beams
US9778019B2 (en) Differential polarization interferometer
JPH01167603A (en) Interference measuring instrument
JPH05302810A (en) Heterodyne two wave lengths displacement interference meter
SU1543225A1 (en) Laser arrangement for measuring irrigularities of surfaces
JPH04289401A (en) Two wave motion interferometer
SU932219A1 (en) Two-beam interferometer
GB1345204A (en) Interferometer systems for sensing the idsplacement of an object
JPH03245006A (en) Measuring method for phase-shift-interference