GB951482A - Improved circuit arrangement responsive to loss in dielectric material - Google Patents

Improved circuit arrangement responsive to loss in dielectric material

Info

Publication number
GB951482A
GB951482A GB4150561A GB4150561A GB951482A GB 951482 A GB951482 A GB 951482A GB 4150561 A GB4150561 A GB 4150561A GB 4150561 A GB4150561 A GB 4150561A GB 951482 A GB951482 A GB 951482A
Authority
GB
United Kingdom
Prior art keywords
bridge
specimen
ionisation
corner
loss
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4150561A
Inventor
Mostyn Thomas Richards
Llewelyn Gordon Spencer Routh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Associated Electrical Industries Ltd
Original Assignee
Associated Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Associated Electrical Industries Ltd filed Critical Associated Electrical Industries Ltd
Priority to GB4150561A priority Critical patent/GB951482A/en
Publication of GB951482A publication Critical patent/GB951482A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables

Abstract

951,482. Detecting dielectric losses. ASSOCIATED ELECTRICAL INDUSTRIES Ltd. Nov. 13, 1962 [Nov. 20, 1961], No. 41505/61. Heading G1U. A circuit arrangement for detecting dielectric loss in a specimen O consisting at least partly of dielectric includes an A. C. bridge and a cathode ray tube. The tube has one plate 1 of the pair 1 and 2 connected to the corner 10 of the bridge, between the bridge arm containing the specimen and a bridge arm containing a variable capacitor in parallel with a variable resistor, and the other plate 2 of the pair is connected to the corner 5 of the bridge between the other two arms, which are capacitive. The other pair of deflecting plates 3 and 4 are connected to two points 11 and 12 on a voltage divider which is supplied from the same A.C. source 8,9 as the bridge. The voltage divider P1, P2 may have an intermediary point 13 earthed, and the corner 10 of the bridge may also be earthed. In a second embodiment (Fig. 2, not shown) the voltage divider may be capacitive. In operation the bridge is first balanced at a voltage below the ionisation or internal discharge threshold of the specimen so that the trace appearing on the screen is a straight line. The supply voltage is then increased to a value which causes ionisation; this causes the trace to form a figure in the shape of a parallelogram, the area of which is a measure of the energy discharged per cycle. Thus the balance below the ionisation point permits the determination of the capacitance of the specimen and a "normal" resistive loss while the area of the figure produced after raising the test voltage indicates an additional loss due to ionisation or internal discharge phenomena. Specification 894, 943 is referred to.
GB4150561A 1961-11-20 1961-11-20 Improved circuit arrangement responsive to loss in dielectric material Expired GB951482A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB4150561A GB951482A (en) 1961-11-20 1961-11-20 Improved circuit arrangement responsive to loss in dielectric material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB4150561A GB951482A (en) 1961-11-20 1961-11-20 Improved circuit arrangement responsive to loss in dielectric material

Publications (1)

Publication Number Publication Date
GB951482A true GB951482A (en) 1964-03-04

Family

ID=10420001

Family Applications (1)

Application Number Title Priority Date Filing Date
GB4150561A Expired GB951482A (en) 1961-11-20 1961-11-20 Improved circuit arrangement responsive to loss in dielectric material

Country Status (1)

Country Link
GB (1) GB951482A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3967196A (en) * 1974-10-17 1976-06-29 Westinghouse Electric Corporation Method and apparatus for measuring the void content of a solid dielectric

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3967196A (en) * 1974-10-17 1976-06-29 Westinghouse Electric Corporation Method and apparatus for measuring the void content of a solid dielectric

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