GB8611735D0 - Probe cards - Google Patents

Probe cards

Info

Publication number
GB8611735D0
GB8611735D0 GB868611735A GB8611735A GB8611735D0 GB 8611735 D0 GB8611735 D0 GB 8611735D0 GB 868611735 A GB868611735 A GB 868611735A GB 8611735 A GB8611735 A GB 8611735A GB 8611735 D0 GB8611735 D0 GB 8611735D0
Authority
GB
United Kingdom
Prior art keywords
probe cards
cards
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB868611735A
Other versions
GB2176063A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horgan M F
Original Assignee
Horgan M F
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horgan M F filed Critical Horgan M F
Publication of GB8611735D0 publication Critical patent/GB8611735D0/en
Publication of GB2176063A publication Critical patent/GB2176063A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3405—Edge mounted components, e.g. terminals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
GB08611735A 1985-05-22 1986-05-14 A probe card Withdrawn GB2176063A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB858512916A GB8512916D0 (en) 1985-05-22 1985-05-22 Probe cards

Publications (2)

Publication Number Publication Date
GB8611735D0 true GB8611735D0 (en) 1986-06-25
GB2176063A GB2176063A (en) 1986-12-10

Family

ID=10579507

Family Applications (2)

Application Number Title Priority Date Filing Date
GB858512916A Pending GB8512916D0 (en) 1985-05-22 1985-05-22 Probe cards
GB08611735A Withdrawn GB2176063A (en) 1985-05-22 1986-05-14 A probe card

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB858512916A Pending GB8512916D0 (en) 1985-05-22 1985-05-22 Probe cards

Country Status (1)

Country Link
GB (2) GB8512916D0 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4928062A (en) * 1988-01-20 1990-05-22 Texas Instruments Incorporated Loading and accurate measurement of integrated dynamic parameters at point of contact in automatic device handlers
JP2632136B2 (en) * 1994-10-17 1997-07-23 日本電子材料株式会社 High temperature probe card

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB990023A (en) * 1961-03-13 1965-04-22 Ass Elect Ind Improvements relating to printed electrical circults
US3596228A (en) * 1969-05-29 1971-07-27 Ibm Fluid actuated contactor
GB1521614A (en) * 1977-02-17 1978-08-16 Int Computers Ltd Apparatus for testing circuit elements
DE2739494B2 (en) * 1977-08-30 1980-10-16 Fuba, Hans Kolbe & Co, 3202 Bad Salzuflen Process for manufacturing electrical circuit boards
GB2111312A (en) * 1981-11-04 1983-06-29 Philips Electronic Associated Substrates for electrical circuits
GB2133934B (en) * 1983-01-17 1987-07-29 Plessey Co Plc Improvements relating to thick film circuits
GB2144922B (en) * 1983-08-06 1986-06-18 Plessey Co Plc Substrate for thick-film electrical circuits

Also Published As

Publication number Publication date
GB2176063A (en) 1986-12-10
GB8512916D0 (en) 1985-06-26

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)