GB8626665D0 - Probes - Google Patents

Probes

Info

Publication number
GB8626665D0
GB8626665D0 GB868626665A GB8626665A GB8626665D0 GB 8626665 D0 GB8626665 D0 GB 8626665D0 GB 868626665 A GB868626665 A GB 868626665A GB 8626665 A GB8626665 A GB 8626665A GB 8626665 D0 GB8626665 D0 GB 8626665D0
Authority
GB
United Kingdom
Prior art keywords
probes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB868626665A
Other versions
GB2197081A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Plessey Co Ltd
Original Assignee
Plessey Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Plessey Co Ltd filed Critical Plessey Co Ltd
Priority to GB08626665A priority Critical patent/GB2197081A/en
Publication of GB8626665D0 publication Critical patent/GB8626665D0/en
Publication of GB2197081A publication Critical patent/GB2197081A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
GB08626665A 1986-11-07 1986-11-07 Coplanar waveguide probe Withdrawn GB2197081A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB08626665A GB2197081A (en) 1986-11-07 1986-11-07 Coplanar waveguide probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08626665A GB2197081A (en) 1986-11-07 1986-11-07 Coplanar waveguide probe

Publications (2)

Publication Number Publication Date
GB8626665D0 true GB8626665D0 (en) 1986-12-10
GB2197081A GB2197081A (en) 1988-05-11

Family

ID=10606977

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08626665A Withdrawn GB2197081A (en) 1986-11-07 1986-11-07 Coplanar waveguide probe

Country Status (1)

Country Link
GB (1) GB2197081A (en)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03235403A (en) * 1990-02-09 1991-10-21 Nippon Telegr & Teleph Corp <Ntt> Hybrid type microwave integrated circuit device
US5144228A (en) * 1991-04-23 1992-09-01 International Business Machines Corporation Probe interface assembly
JPH06295949A (en) * 1993-04-09 1994-10-21 Matsushita Electric Ind Co Ltd Inspecting device and method and semiconductor device
US5625299A (en) * 1995-02-03 1997-04-29 Uhling; Thomas F. Multiple lead analog voltage probe with high signal integrity over a wide band width
US5561377A (en) * 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
FR2820825B1 (en) * 2001-02-13 2006-08-04 Agilent Technologies Inc PROBE CARD
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
GB2554847A (en) * 2016-06-06 2018-04-18 Oclaro Tech Ltd Optimised RF Input section

Also Published As

Publication number Publication date
GB2197081A (en) 1988-05-11

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)