GB816682A - Improvements in adjusting devices for diaphragms situated in the ray path of corpuscular radiation apparatus especially electron microscopes - Google Patents
Improvements in adjusting devices for diaphragms situated in the ray path of corpuscular radiation apparatus especially electron microscopesInfo
- Publication number
- GB816682A GB816682A GB207456A GB207456A GB816682A GB 816682 A GB816682 A GB 816682A GB 207456 A GB207456 A GB 207456A GB 207456 A GB207456 A GB 207456A GB 816682 A GB816682 A GB 816682A
- Authority
- GB
- United Kingdom
- Prior art keywords
- diaphragm
- diaphragms
- fine adjustment
- electron microscopes
- situated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000005855 radiation Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/09—Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Microscoopes, Condenser (AREA)
Abstract
816,682. Electron microscopes. VEB C. ZEISS JENA. Jan. 20, 1956, No. 2074/56. Class 39(1). An electron microscope with an adjustable diaphragm having at least two apertures of different sizes is provided with a mechanism for effecting a fine adjustment of the diaphragm and a further arrangement which is operable, without affecting the fine adjustment, for resiliently withdrawing the diaphragm sufficiently to insert another aperture into the beam path and which, when released, returns the diaphragm to its original adjusted position so that two images may be readily superimposed on the viewing screen. The fine adjustment mechanism includes a rotatable knob 5 which is screw threaded on a spindle 1 connected to the diaphragm by means of a part 2, and the diaphragm can be withdrawn by pulling out the knob 5 to an extent limited by sets crews 8. The spindle 1 is held in the extended position by means of a stop lever 9 and is returned to its original position, when released, by means of the external atmospheric pressure acting on the rubber diaphragm 6. The microscope may be used as a diffraction instrument. Contrast and diffraction diaphragms may be withdrawn from the beam path while adjusting the object.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DEV8901A DE1033817B (en) | 1955-05-14 | 1955-05-14 | Adjustment device for diaphragms located in the beam path of corpuscular beam apparatus, in particular electron microscopes |
| CH334121D CH334121A (en) | 1956-01-20 | 1955-10-31 | Adjustment device for diaphragms located in the beam path of corpuscular beam apparatus, in particular electron microscopes |
| NL201716A NL110086C (en) | 1956-01-20 | 1955-11-03 | |
| FR1192909D FR1192909A (en) | 1956-01-20 | 1955-11-29 | Device for adjusting diaphragms in the beam path of particle radiation devices, in particular electron microscopes |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB816682A true GB816682A (en) | 1959-07-15 |
Family
ID=1627125
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB207456A Expired GB816682A (en) | 1955-05-14 | 1956-01-20 | Improvements in adjusting devices for diaphragms situated in the ray path of corpuscular radiation apparatus especially electron microscopes |
Country Status (1)
| Country | Link |
|---|---|
| GB (1) | GB816682A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115513020A (en) * | 2022-11-24 | 2022-12-23 | 北京中科科仪股份有限公司 | Centering adjustment tool, electron beam spot detection device and centering adjustment method |
-
1956
- 1956-01-20 GB GB207456A patent/GB816682A/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115513020A (en) * | 2022-11-24 | 2022-12-23 | 北京中科科仪股份有限公司 | Centering adjustment tool, electron beam spot detection device and centering adjustment method |
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