GB720008A - Improvements in or relating to electron microscopes - Google Patents

Improvements in or relating to electron microscopes

Info

Publication number
GB720008A
GB720008A GB3628/51A GB362851A GB720008A GB 720008 A GB720008 A GB 720008A GB 3628/51 A GB3628/51 A GB 3628/51A GB 362851 A GB362851 A GB 362851A GB 720008 A GB720008 A GB 720008A
Authority
GB
United Kingdom
Prior art keywords
stage
support
objects
holder
holders
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3628/51A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens and Halske AG
Siemens Corp
Original Assignee
Siemens and Halske AG
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens and Halske AG, Siemens Corp filed Critical Siemens and Halske AG
Publication of GB720008A publication Critical patent/GB720008A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Lenses (AREA)
GB3628/51A 1948-10-01 1951-02-14 Improvements in or relating to electron microscopes Expired GB720008A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE720008X 1948-10-01

Publications (1)

Publication Number Publication Date
GB720008A true GB720008A (en) 1954-12-08

Family

ID=6627350

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3628/51A Expired GB720008A (en) 1948-10-01 1951-02-14 Improvements in or relating to electron microscopes

Country Status (3)

Country Link
US (1) US2849619A (enExample)
GB (1) GB720008A (enExample)
NL (1) NL89188C (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1251828B (enExample) * 1957-09-11
US3216310A (en) * 1960-06-27 1965-11-09 Univ California Black body reflectometer
US3073951A (en) * 1960-07-28 1963-01-15 Combustion Eng Vacuum lock
US3120610A (en) * 1961-05-15 1964-02-04 Well Completions Inc Apparatus for producing a high intensity electron stream used to excite characteristic radiation of elements
US3117223A (en) * 1961-06-09 1964-01-07 Atlas Werke Ag Sample insertion vacuum lock for a mass spectrometer
US3185840A (en) * 1963-05-09 1965-05-25 Lemaitre Jacques Multi-purpose stage for electronic probe microanalysis
US3356844A (en) * 1963-07-02 1967-12-05 Centre Nat Rech Metall Rotatable sample changer for an electron probe microanalyzer having means for maintaining a vacuum in the analysis chamber
US3374349A (en) * 1966-11-14 1968-03-19 Victor G. Macres Electron probe having a specific shortfocal length magnetic lens and light microscope
US3679900A (en) * 1968-12-03 1972-07-25 Hitachi Ltd Specimen holder transfer mechanism for an electron microscope
US4033904A (en) * 1974-03-22 1977-07-05 Varian Associates, Inc. Interchangeable specimen trays and apparatus for a vacuum type testing system
US5698856A (en) * 1996-08-05 1997-12-16 Frasca; Peter Specimen holder for electron microscope
US7301157B2 (en) * 2005-09-28 2007-11-27 Fei Company Cluster tool for microscopic processing of samples
EP3661668A4 (en) 2017-07-31 2021-07-07 Monsanto Technology LLC SEED SORTING
UA129697C2 (uk) 2018-03-14 2025-07-09 Монсанто Текнолоджі Елелсі Система отримання зображення насіння (варіанти) та спосіб отримання зображення насіння
MX2020013129A (es) 2018-06-11 2021-02-18 Monsanto Technology Llc Seleccion de semillas.
US11630095B2 (en) * 2019-11-13 2023-04-18 Monsanto Technology Llc X-ray seed imaging system, cabinet x-ray device, and methods of evaluating seeds

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE708778C (de) * 1937-11-20 1942-01-26 Gewerkschaft Mathias Stinnes Vorrichtung zum Einbringen von Objekten in das Elektronenmikroskop
US2256191A (en) * 1938-04-13 1941-09-16 Fides Gmbh Method for examining objects in an air space by means of electron microscopes
BE434135A (enExample) * 1938-05-02
US2410658A (en) * 1943-07-16 1946-11-05 Rca Corp Limiting aperture for electron image devices
DE895636C (de) * 1944-12-06 1953-11-05 Siemens Ag An der Pumpe arbeitender Korpuskularstrahlapparat
DE911061C (de) * 1948-10-01 1956-08-16 Siemens Ag Objekttisch fuer elektronenoptische Untersuchungen
DE902286C (de) * 1948-10-01 1956-04-19 Siemens Ag Objekttisch zum Einsetzen von mehreren Objekten fuer Korpuskularstrahlapparate
US2499019A (en) * 1949-01-29 1950-02-28 Rca Corp Adjustable specimen support for electron-optical instruments

Also Published As

Publication number Publication date
NL89188C (enExample)
US2849619A (en) 1958-08-26

Similar Documents

Publication Publication Date Title
GB720008A (en) Improvements in or relating to electron microscopes
US2424791A (en) Electron microscope apparatus
US2292087A (en) Evacuated electronic apparatus
CN108385110B (zh) 一种利用原位溅射结合离子束刻蚀的抛光装置及抛光方法
US4066905A (en) Particle beam apparatus with zones of different pressure
US4349242A (en) Specimen observation apparatus including an optical microscope and a scanning electron microscope
US3679900A (en) Specimen holder transfer mechanism for an electron microscope
GB1225856A (enExample)
US3596087A (en) Spark source mass spectrometers and sample insertion probe therefor
ITMI940442A1 (it) Impianto di rivestimento sotto vuoto
US2745966A (en) Electron-diffraction apparatus
CN219416920U (zh) 一种应用于透射样品制备的离子减薄装置
GB1193159A (en) Improvements in or relating to Corpuscular Beam Apparatus
US2397207A (en) Lens coating apparatus
GB903906A (en) Electron probe x-ray analyzer
US4705366A (en) High temperature microscope
US3696246A (en) Specimen analysis in an electron microscope
US9318301B2 (en) Sample introduction device and charged particle beam instrument
US3342994A (en) Specimen support for an electron microscope with means to rotate a circular specimen holder
Zworykin An electron microscope for the research laboratory
GB735272A (en) Improvements in or relating to adjustable magnetic electron lenses
US2655601A (en) Electron microscope
Haine The design and construction of a new electron microscope
US2468403A (en) Electron microscope and other electronic apparatus employing electron lenses
US2420561A (en) Electron microscope structure