GB2486493B - Switching circuits and methods of testing - Google Patents

Switching circuits and methods of testing

Info

Publication number
GB2486493B
GB2486493B GB1021453.4A GB201021453A GB2486493B GB 2486493 B GB2486493 B GB 2486493B GB 201021453 A GB201021453 A GB 201021453A GB 2486493 B GB2486493 B GB 2486493B
Authority
GB
United Kingdom
Prior art keywords
testing
methods
switching circuits
circuits
switching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB1021453.4A
Other languages
English (en)
Other versions
GB201021453D0 (en
GB2486493A (en
Inventor
Michael Tyler Peter
Oliver Collins John
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GE Aviation Systems Ltd
Original Assignee
GE Aviation Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GE Aviation Systems Ltd filed Critical GE Aviation Systems Ltd
Priority to GB1021453.4A priority Critical patent/GB2486493B/en
Publication of GB201021453D0 publication Critical patent/GB201021453D0/en
Priority to CA2762475A priority patent/CA2762475C/en
Priority to FR1161734A priority patent/FR2969427B1/fr
Priority to BRPI1105402-6A priority patent/BRPI1105402A2/pt
Priority to JP2011275229A priority patent/JP6018377B2/ja
Priority to DE102011056541.8A priority patent/DE102011056541B4/de
Priority to CN201110463075.XA priority patent/CN102608526B/zh
Publication of GB2486493A publication Critical patent/GB2486493A/en
Application granted granted Critical
Publication of GB2486493B publication Critical patent/GB2486493B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
    • G01R31/3278—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches of relays, solenoids or reed switches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors
    • G01R31/2617—Circuits therefor for testing bipolar transistors for measuring switching properties thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/005—Testing of electric installations on transport means
    • G01R31/008—Testing of electric installations on transport means on air- or spacecraft, railway rolling stock or sea-going vessels

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electronic Switches (AREA)
  • Power Conversion In General (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
GB1021453.4A 2010-12-17 2010-12-17 Switching circuits and methods of testing Active GB2486493B (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
GB1021453.4A GB2486493B (en) 2010-12-17 2010-12-17 Switching circuits and methods of testing
CA2762475A CA2762475C (en) 2010-12-17 2011-12-15 Switching circuits and methods of testing
FR1161734A FR2969427B1 (fr) 2010-12-17 2011-12-15 Circuit de commutation et procede d'essai
BRPI1105402-6A BRPI1105402A2 (pt) 2010-12-17 2011-12-16 Circuito de comutação e método de teste de um circuito de comutação
JP2011275229A JP6018377B2 (ja) 2010-12-17 2011-12-16 スイッチング回路および試験方法
DE102011056541.8A DE102011056541B4 (de) 2010-12-17 2011-12-16 Schaltkreise und Testverfahren
CN201110463075.XA CN102608526B (zh) 2010-12-17 2011-12-16 开关电路及测试的方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1021453.4A GB2486493B (en) 2010-12-17 2010-12-17 Switching circuits and methods of testing

Publications (3)

Publication Number Publication Date
GB201021453D0 GB201021453D0 (en) 2011-02-02
GB2486493A GB2486493A (en) 2012-06-20
GB2486493B true GB2486493B (en) 2016-06-15

Family

ID=43598572

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1021453.4A Active GB2486493B (en) 2010-12-17 2010-12-17 Switching circuits and methods of testing

Country Status (7)

Country Link
JP (1) JP6018377B2 (enExample)
CN (1) CN102608526B (enExample)
BR (1) BRPI1105402A2 (enExample)
CA (1) CA2762475C (enExample)
DE (1) DE102011056541B4 (enExample)
FR (1) FR2969427B1 (enExample)
GB (1) GB2486493B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112255537A (zh) * 2020-10-13 2021-01-22 南京大学 一种氮化镓三极管开关测试电路及测试方法

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5983171B2 (ja) * 2012-08-10 2016-08-31 株式会社Ｇｓユアサ スイッチ故障診断装置、蓄電装置
US8891218B2 (en) * 2012-10-12 2014-11-18 The Boeing Company Fault tolerant fail-safe link
CN103310853B (zh) * 2013-05-24 2016-02-24 南京航空航天大学 一种带内建自测试的电源开关电路
US10886086B2 (en) 2015-12-18 2021-01-05 Pepperl+Fuchs Se Methods and apparatuses for monitoring the functionality of redundantly interconnected contacts
US10270241B2 (en) * 2016-05-16 2019-04-23 Varian Semiconductor Equipment Associates, Inc. Fault current limiter having fault checking system for power electronics and bypass circuit
US10340908B2 (en) * 2016-07-25 2019-07-02 Continental Automotive Systems, Inc. Half-bridge driver fault diagnostic system and method
GB2563069B (en) * 2017-06-02 2020-07-01 Ge Aviat Systems Ltd Apparatus to detect a fault in a wire
CN108051737B (zh) * 2017-12-04 2019-12-06 华北电力大学 一种开关器件筛选系统及方法
US11233388B2 (en) 2018-07-12 2022-01-25 Ovh Method and power distribution unit for limiting a total delivered power
EP3629039B1 (en) * 2018-09-26 2023-04-05 Aptiv Technologies Limited Solid state power switch device
CN109828169A (zh) * 2019-02-01 2019-05-31 中国矿业大学(北京) 电气防火限流保护器电气性能测试方法、装置及系统
CN110187269B (zh) * 2019-06-21 2024-03-29 江苏伊施德创新科技有限公司 一种继电器全负载试验降低能耗的方法及装置
EP3767316B1 (en) * 2019-07-19 2022-03-30 Yazaki Corporation Switch failure detection device
US20250020721A1 (en) * 2023-07-10 2025-01-16 Hamilton Sundstrand Corporation Fail open detection

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6304189B1 (en) * 1997-08-22 2001-10-16 Robert Bosch Gmbh Method for detecting malfunctions of a first relay
US20030025515A1 (en) * 2001-08-02 2003-02-06 Honeywell International, Inc. Built-in test system for aircraft indication switches
US20040160131A1 (en) * 2001-05-22 2004-08-19 Richard Veil Safety switching module and method for testing the switching-off ability of a switching element in a safety switching module

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4752886A (en) 1985-07-22 1988-06-21 General Electric Company Method for on-line testing of load control circuitry and the associated load
JPS6291587U (enExample) * 1985-11-28 1987-06-11
JP2003274636A (ja) * 2002-03-15 2003-09-26 Omron Corp ソリッドステートリレー
US7885043B2 (en) * 2007-06-15 2011-02-08 General Electric Company Remote-operable micro-electromechanical system based over-current protection apparatus
US7586725B2 (en) 2007-07-19 2009-09-08 Honeywell International Inc. Method of providing a secondary means of overload protection and leakage current protection in applications using solid state power controllers
US7554222B2 (en) * 2007-11-01 2009-06-30 General Electric Company Micro-electromechanical system based switching
JP5300059B2 (ja) * 2009-02-13 2013-09-25 エヌイーシーコンピュータテクノ株式会社 電源供給システム、その診断方法及びプログラム
US8350414B2 (en) * 2010-08-11 2013-01-08 Xantrex Technology Inc. Semiconductor assisted DC load break contactor

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6304189B1 (en) * 1997-08-22 2001-10-16 Robert Bosch Gmbh Method for detecting malfunctions of a first relay
US20040160131A1 (en) * 2001-05-22 2004-08-19 Richard Veil Safety switching module and method for testing the switching-off ability of a switching element in a safety switching module
US20030025515A1 (en) * 2001-08-02 2003-02-06 Honeywell International, Inc. Built-in test system for aircraft indication switches

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112255537A (zh) * 2020-10-13 2021-01-22 南京大学 一种氮化镓三极管开关测试电路及测试方法

Also Published As

Publication number Publication date
JP2012147655A (ja) 2012-08-02
DE102011056541A1 (de) 2012-06-21
CN102608526B (zh) 2016-05-11
GB201021453D0 (en) 2011-02-02
GB2486493A (en) 2012-06-20
CA2762475C (en) 2019-01-08
BRPI1105402A2 (pt) 2019-03-26
JP6018377B2 (ja) 2016-11-02
CN102608526A (zh) 2012-07-25
FR2969427B1 (fr) 2020-02-28
FR2969427A1 (fr) 2012-06-22
DE102011056541B4 (de) 2022-07-21
CA2762475A1 (en) 2012-06-17

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