GB2486493B - Switching circuits and methods of testing - Google Patents

Switching circuits and methods of testing

Info

Publication number
GB2486493B
GB2486493B GB1021453.4A GB201021453A GB2486493B GB 2486493 B GB2486493 B GB 2486493B GB 201021453 A GB201021453 A GB 201021453A GB 2486493 B GB2486493 B GB 2486493B
Authority
GB
United Kingdom
Prior art keywords
testing
methods
switching circuits
circuits
switching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB1021453.4A
Other versions
GB201021453D0 (en
GB2486493A (en
Inventor
Michael Tyler Peter
Oliver Collins John
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GE Aviation Systems Ltd
Original Assignee
GE Aviation Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GE Aviation Systems Ltd filed Critical GE Aviation Systems Ltd
Priority to GB1021453.4A priority Critical patent/GB2486493B/en
Publication of GB201021453D0 publication Critical patent/GB201021453D0/en
Priority to FR1161734A priority patent/FR2969427B1/en
Priority to CA2762475A priority patent/CA2762475C/en
Priority to BRPI1105402-6A priority patent/BRPI1105402A2/en
Priority to JP2011275229A priority patent/JP6018377B2/en
Priority to DE102011056541.8A priority patent/DE102011056541B4/en
Priority to CN201110463075.XA priority patent/CN102608526B/en
Publication of GB2486493A publication Critical patent/GB2486493A/en
Application granted granted Critical
Publication of GB2486493B publication Critical patent/GB2486493B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
    • G01R31/3278—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches of relays, solenoids or reed switches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors
    • G01R31/2617—Circuits therefor for testing bipolar transistors for measuring switching properties thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/005—Testing of electric installations on transport means
    • G01R31/008—Testing of electric installations on transport means on air- or spacecraft, railway rolling stock or sea-going vessels

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electronic Switches (AREA)
  • Power Conversion In General (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
GB1021453.4A 2010-12-17 2010-12-17 Switching circuits and methods of testing Active GB2486493B (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
GB1021453.4A GB2486493B (en) 2010-12-17 2010-12-17 Switching circuits and methods of testing
FR1161734A FR2969427B1 (en) 2010-12-17 2011-12-15 SWITCHING CIRCUIT AND TEST METHOD
CA2762475A CA2762475C (en) 2010-12-17 2011-12-15 Switching circuits and methods of testing
BRPI1105402-6A BRPI1105402A2 (en) 2010-12-17 2011-12-16 SWITCHING CIRCUIT AND TESTING METHOD OF A SWITCHING CIRCUIT
JP2011275229A JP6018377B2 (en) 2010-12-17 2011-12-16 Switching circuit and test method
DE102011056541.8A DE102011056541B4 (en) 2010-12-17 2011-12-16 circuits and test procedures
CN201110463075.XA CN102608526B (en) 2010-12-17 2011-12-16 The method of on-off circuit and test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1021453.4A GB2486493B (en) 2010-12-17 2010-12-17 Switching circuits and methods of testing

Publications (3)

Publication Number Publication Date
GB201021453D0 GB201021453D0 (en) 2011-02-02
GB2486493A GB2486493A (en) 2012-06-20
GB2486493B true GB2486493B (en) 2016-06-15

Family

ID=43598572

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1021453.4A Active GB2486493B (en) 2010-12-17 2010-12-17 Switching circuits and methods of testing

Country Status (7)

Country Link
JP (1) JP6018377B2 (en)
CN (1) CN102608526B (en)
BR (1) BRPI1105402A2 (en)
CA (1) CA2762475C (en)
DE (1) DE102011056541B4 (en)
FR (1) FR2969427B1 (en)
GB (1) GB2486493B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112255537A (en) * 2020-10-13 2021-01-22 南京大学 Gallium nitride triode switch test circuit and test method

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5983171B2 (en) * 2012-08-10 2016-08-31 株式会社Ｇｓユアサ Switch failure diagnosis device, power storage device
US8891218B2 (en) * 2012-10-12 2014-11-18 The Boeing Company Fault tolerant fail-safe link
CN103310853B (en) * 2013-05-24 2016-02-24 南京航空航天大学 A kind of power switch circuit with built-in self-test
US10886086B2 (en) 2015-12-18 2021-01-05 Pepperl+Fuchs Se Methods and apparatuses for monitoring the functionality of redundantly interconnected contacts
US10270241B2 (en) * 2016-05-16 2019-04-23 Varian Semiconductor Equipment Associates, Inc. Fault current limiter having fault checking system for power electronics and bypass circuit
US10340908B2 (en) * 2016-07-25 2019-07-02 Continental Automotive Systems, Inc. Half-bridge driver fault diagnostic system and method
GB2563069B (en) 2017-06-02 2020-07-01 Ge Aviat Systems Ltd Apparatus to detect a fault in a wire
CN108051737B (en) * 2017-12-04 2019-12-06 华北电力大学 switch device screening system and method
US10749334B2 (en) 2018-07-12 2020-08-18 Ovh Method and power distribution unit for preventing disjunctions
EP3629039B1 (en) * 2018-09-26 2023-04-05 Aptiv Technologies Limited Solid state power switch device
CN109828169A (en) * 2019-02-01 2019-05-31 中国矿业大学(北京) Electric fireproof current-limiting protector electric performance test method, apparatus and system
CN110187269B (en) * 2019-06-21 2024-03-29 江苏伊施德创新科技有限公司 Method and device for reducing energy consumption in relay full-load test
EP3767316B1 (en) * 2019-07-19 2022-03-30 Yazaki Corporation Switch failure detection device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6304189B1 (en) * 1997-08-22 2001-10-16 Robert Bosch Gmbh Method for detecting malfunctions of a first relay
US20030025515A1 (en) * 2001-08-02 2003-02-06 Honeywell International, Inc. Built-in test system for aircraft indication switches
US20040160131A1 (en) * 2001-05-22 2004-08-19 Richard Veil Safety switching module and method for testing the switching-off ability of a switching element in a safety switching module

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4752886A (en) 1985-07-22 1988-06-21 General Electric Company Method for on-line testing of load control circuitry and the associated load
JPS6291587U (en) * 1985-11-28 1987-06-11
JP2003274636A (en) * 2002-03-15 2003-09-26 Omron Corp Solid state relay
US7885043B2 (en) * 2007-06-15 2011-02-08 General Electric Company Remote-operable micro-electromechanical system based over-current protection apparatus
US7586725B2 (en) 2007-07-19 2009-09-08 Honeywell International Inc. Method of providing a secondary means of overload protection and leakage current protection in applications using solid state power controllers
US7554222B2 (en) * 2007-11-01 2009-06-30 General Electric Company Micro-electromechanical system based switching
JP5300059B2 (en) * 2009-02-13 2013-09-25 エヌイーシーコンピュータテクノ株式会社 Power supply system, diagnosis method and program thereof
US8350414B2 (en) * 2010-08-11 2013-01-08 Xantrex Technology Inc. Semiconductor assisted DC load break contactor

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6304189B1 (en) * 1997-08-22 2001-10-16 Robert Bosch Gmbh Method for detecting malfunctions of a first relay
US20040160131A1 (en) * 2001-05-22 2004-08-19 Richard Veil Safety switching module and method for testing the switching-off ability of a switching element in a safety switching module
US20030025515A1 (en) * 2001-08-02 2003-02-06 Honeywell International, Inc. Built-in test system for aircraft indication switches

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112255537A (en) * 2020-10-13 2021-01-22 南京大学 Gallium nitride triode switch test circuit and test method

Also Published As

Publication number Publication date
BRPI1105402A2 (en) 2019-03-26
CN102608526A (en) 2012-07-25
GB201021453D0 (en) 2011-02-02
JP6018377B2 (en) 2016-11-02
DE102011056541B4 (en) 2022-07-21
FR2969427B1 (en) 2020-02-28
CN102608526B (en) 2016-05-11
JP2012147655A (en) 2012-08-02
CA2762475A1 (en) 2012-06-17
DE102011056541A1 (en) 2012-06-21
GB2486493A (en) 2012-06-20
CA2762475C (en) 2019-01-08
FR2969427A1 (en) 2012-06-22

Similar Documents

Publication Publication Date Title
GB2486493B (en) Switching circuits and methods of testing
EP2536756A4 (en) Hsa-related compositions and methods of use
EP2482969A4 (en) Sorbent devices and methods of using them
EP2584897A4 (en) Resveratrol-containing compositions and methods of use
EP2539948A4 (en) Electrical components and circuits including said components
EP2588851A4 (en) Ion-sensing charge-accumulation circuits and methods
EP2660254A4 (en) Vinylidene-fluoride-based copolymer and application of said copolymer
EP2571421A4 (en) Detection devices and related methods of use
GB201012175D0 (en) Procedure and mechanisms
EP2593571A4 (en) Sweetener compositions and methods of making same
ZA201206718B (en) Pde10 inhibitors and related compositions and methods
EP2596112A4 (en) Acetycysteine compositions and methods of use thereof
EP2544623A4 (en) Self-closing devices and methods for making and using them
EP2595695A4 (en) Graft devices and methods of use
EP2614529A4 (en) Methods of forming semiconductor contacts and related semiconductor devices
PL2523203T3 (en) Switching device and related switchgear
IL214394A (en) Dissolution test equipment
EP2564223A4 (en) Open circuit detector and method therefore
EP2566530A4 (en) Devices and methods for tissue engineering
ZA201209183B (en) Screening device and method of screening
EP2611791A4 (en) Oligooxopiperazines and methods of making and using them
EP2652515A4 (en) Iddq testing of cmos devices
EP2705576A4 (en) High-voltage resistance and retention of printed flex circuits
HK1201451A1 (en) Compositions and methods
GB201018650D0 (en) Methods and compositions