GB2215470A - Method and apparatus for determining the thickness of a coating on a metal substrate - Google Patents
Method and apparatus for determining the thickness of a coating on a metal substrate Download PDFInfo
- Publication number
- GB2215470A GB2215470A GB8902289A GB8902289A GB2215470A GB 2215470 A GB2215470 A GB 2215470A GB 8902289 A GB8902289 A GB 8902289A GB 8902289 A GB8902289 A GB 8902289A GB 2215470 A GB2215470 A GB 2215470A
- Authority
- GB
- United Kingdom
- Prior art keywords
- probe
- coating
- determining
- thickness
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/153,292 US4920319A (en) | 1988-02-03 | 1988-02-03 | Method and apparatus for determining the thickness of a coating on a metal substrate |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| GB8902289D0 GB8902289D0 (en) | 1989-03-22 |
| GB2215470A true GB2215470A (en) | 1989-09-20 |
Family
ID=22546570
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB8902289A Withdrawn GB2215470A (en) | 1988-02-03 | 1989-02-02 | Method and apparatus for determining the thickness of a coating on a metal substrate |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4920319A (enExample) |
| JP (1) | JPH01282401A (enExample) |
| CH (1) | CH678762A5 (enExample) |
| DE (1) | DE3902096A1 (enExample) |
| GB (1) | GB2215470A (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1994016288A1 (de) * | 1993-01-12 | 1994-07-21 | Drm, Dr. Müller Ag | Verfahren und vorrichtung zur messung der dicke eines filterkuchens |
| US5430376A (en) * | 1993-06-09 | 1995-07-04 | General Electric Company | Combined thermoelectric and eddy-current method and apparatus for nondestructive testing of metallic of semiconductor coated objects |
| US5544953A (en) * | 1994-05-18 | 1996-08-13 | General Electric Co. | Rolling-ball thermoelectric potential probe and housing for nondestructive testing of metallic and semiconductor objects |
| US6242926B1 (en) * | 1999-01-12 | 2001-06-05 | Ipec Precision, Inc. | Method and apparatus for moving an article relative to and between a pair of thickness measuring probes to develop a thickness map for the article |
| DE10001516B4 (de) * | 2000-01-15 | 2014-05-08 | Alstom Technology Ltd. | Zerstörungsfreies Verfahren zur Bestimmung der Schichtdicke einer metallischen Schutzschicht auf einem metallischen Grundmaterial |
| JP3705736B2 (ja) * | 2000-08-29 | 2005-10-12 | 株式会社リガク | 熱電気測定装置の試料組立体 |
| DE102004021450B4 (de) * | 2004-04-30 | 2006-08-10 | Hochschule Magdeburg-Stendal (Fh) | Messverfahren und Anordnung zur Bestimmung metallischer Oberflächenschichten auf metallischen Werkstücken |
| KR100846783B1 (ko) * | 2005-11-30 | 2008-07-16 | 삼성전자주식회사 | 불량기판 검출장치 및 방법 |
| US10060830B2 (en) * | 2014-06-09 | 2018-08-28 | United Technologies Corporation | In-situ system and method of determining coating integrity of turbomachinery components |
| CN104034250B (zh) * | 2014-06-30 | 2016-08-24 | 山东中科普锐检测技术有限公司 | 涂层测厚仪温度补偿测量方法 |
| US9582621B2 (en) * | 2015-06-24 | 2017-02-28 | Globalfoundries Inc. | Modeling localized temperature changes on an integrated circuit chip using thermal potential theory |
| DE102019112238A1 (de) * | 2019-05-10 | 2020-11-12 | HELLA GmbH & Co. KGaA | Verfahren zur Kontrolle der Beschichtung eines elektronischen Bauteils |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB768448A (en) * | 1954-03-08 | 1957-02-20 | British Non Ferrous Metals Res | Method and apparatus for the measurement of the thickness of metallic and other conducting coatings on backings of conducting materials |
| GB858345A (en) * | 1956-04-06 | 1961-01-11 | British Non Ferrous Metals Res | Method and apparatus for the measurement of the thickness of metallic and other conducting coatings on backings of conducting materials |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA624746A (en) * | 1961-08-01 | J. Martin Edward | Method and apparatus for thickness measurement | |
| US2972882A (en) * | 1952-08-12 | 1961-02-28 | Gen Motors Corp | Apparatus for measuring coating thicknesses |
| US3016732A (en) * | 1952-10-01 | 1962-01-16 | Gen Motors Corp | Measurement of coating thicknesses by thermal means |
| US2750791A (en) * | 1952-11-06 | 1956-06-19 | Gen Motors Corp | Thermoelectric instrument for testing materials |
| SU110354A1 (ru) * | 1957-03-11 | 1957-11-30 | Л.М. Суворов | Способ определени толщины гальванического покрыти |
| US4419416A (en) * | 1981-08-05 | 1983-12-06 | United Technologies Corporation | Overlay coatings for superalloys |
-
1988
- 1988-02-03 US US07/153,292 patent/US4920319A/en not_active Expired - Fee Related
-
1989
- 1989-01-25 DE DE3902096A patent/DE3902096A1/de not_active Withdrawn
- 1989-01-26 CH CH236/89A patent/CH678762A5/de not_active IP Right Cessation
- 1989-02-02 GB GB8902289A patent/GB2215470A/en not_active Withdrawn
- 1989-02-03 JP JP1024073A patent/JPH01282401A/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB768448A (en) * | 1954-03-08 | 1957-02-20 | British Non Ferrous Metals Res | Method and apparatus for the measurement of the thickness of metallic and other conducting coatings on backings of conducting materials |
| GB858345A (en) * | 1956-04-06 | 1961-01-11 | British Non Ferrous Metals Res | Method and apparatus for the measurement of the thickness of metallic and other conducting coatings on backings of conducting materials |
Also Published As
| Publication number | Publication date |
|---|---|
| GB8902289D0 (en) | 1989-03-22 |
| US4920319A (en) | 1990-04-24 |
| DE3902096A1 (de) | 1989-08-17 |
| CH678762A5 (enExample) | 1991-10-31 |
| JPH01282401A (ja) | 1989-11-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4920319A (en) | Method and apparatus for determining the thickness of a coating on a metal substrate | |
| US6084174A (en) | Method for detecting temperature gradients in biological tissue using a thermocouple array | |
| Doorly et al. | The theory of advanced multi-layer thin film heat transfer gauges | |
| Wang et al. | Contributed Review: Instruments for measuring Seebeck coefficient of thin film thermoelectric materials: A mini-review | |
| WO2007115257A2 (en) | Thermocouples | |
| KR20120116009A (ko) | 열적 측정을 제공하도록 구성된 터빈 구성요소 | |
| Xie et al. | Fabrication and performances of high-temperature transient response ITO/In2O3 thin-film thermocouples | |
| US5711607A (en) | Temperature measurement technique with automatic verification of contact between probe and object | |
| Choi et al. | Microfabrication and characterization of metal-embedded thin-film thermomechanical microsensors for applications in hostile manufacturing environments | |
| Wang et al. | In situ integration of high-temperature thin-film sensor for precise measurement of heat flux and temperature on superalloy substrate | |
| Stuart | Thermoelectric differences used for metal sorting | |
| JPS6150028A (ja) | 流体用のソリツドステ−ト形温度測定装置および該温度測定装置を利用する装置 | |
| WO1992018860A1 (en) | Method and apparatus for determining thermal resistance and structural integrity of coatings on conducting materials by monitoring electrical conductance of the underlying material upon localized heating of the overlying coating | |
| GB2395561A (en) | Fluid temperature measurement | |
| CA1238116A (en) | Stable high temperature cables and devices made therefrom | |
| CN113176013A (zh) | 一种用于热流测试的薄膜热电阻热流计和同轴热电偶的标定方法 | |
| JPH11211576A (ja) | 界面測定薄膜温度センサおよび耐熱部品 | |
| US5544953A (en) | Rolling-ball thermoelectric potential probe and housing for nondestructive testing of metallic and semiconductor objects | |
| WO2007130862A2 (en) | Thermoelectric properties of ceramic thin film thermocouples | |
| Wei et al. | An A. C. Potential System for Crack Length Measurement | |
| Soldatov et al. | Hands-on Experience of THERMO FITNESS TESTING Device Use for Thermoelectric Evaluation of Metallic Materials | |
| Powell | An instrument for the measurement of the thermal conductivity of liquids at high temperatures | |
| Kreider et al. | Calibration of thin-film thermocouples on silicon wafers | |
| Mitchell et al. | Development and testing of harsh environment, wireless sensor systems for industrial gas turbines | |
| Goswami et al. | Design fabrication and satic calibration of thermocouple and thin film gauges |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |