GB2215470A - Method and apparatus for determining the thickness of a coating on a metal substrate - Google Patents

Method and apparatus for determining the thickness of a coating on a metal substrate Download PDF

Info

Publication number
GB2215470A
GB2215470A GB8902289A GB8902289A GB2215470A GB 2215470 A GB2215470 A GB 2215470A GB 8902289 A GB8902289 A GB 8902289A GB 8902289 A GB8902289 A GB 8902289A GB 2215470 A GB2215470 A GB 2215470A
Authority
GB
United Kingdom
Prior art keywords
probe
coating
determining
thickness
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB8902289A
Other languages
English (en)
Other versions
GB8902289D0 (en
Inventor
John Ruediger Mader Viertl
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of GB8902289D0 publication Critical patent/GB8902289D0/en
Publication of GB2215470A publication Critical patent/GB2215470A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
GB8902289A 1988-02-03 1989-02-02 Method and apparatus for determining the thickness of a coating on a metal substrate Withdrawn GB2215470A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/153,292 US4920319A (en) 1988-02-03 1988-02-03 Method and apparatus for determining the thickness of a coating on a metal substrate

Publications (2)

Publication Number Publication Date
GB8902289D0 GB8902289D0 (en) 1989-03-22
GB2215470A true GB2215470A (en) 1989-09-20

Family

ID=22546570

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8902289A Withdrawn GB2215470A (en) 1988-02-03 1989-02-02 Method and apparatus for determining the thickness of a coating on a metal substrate

Country Status (5)

Country Link
US (1) US4920319A (enExample)
JP (1) JPH01282401A (enExample)
CH (1) CH678762A5 (enExample)
DE (1) DE3902096A1 (enExample)
GB (1) GB2215470A (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994016288A1 (de) * 1993-01-12 1994-07-21 Drm, Dr. Müller Ag Verfahren und vorrichtung zur messung der dicke eines filterkuchens
US5430376A (en) * 1993-06-09 1995-07-04 General Electric Company Combined thermoelectric and eddy-current method and apparatus for nondestructive testing of metallic of semiconductor coated objects
US5544953A (en) * 1994-05-18 1996-08-13 General Electric Co. Rolling-ball thermoelectric potential probe and housing for nondestructive testing of metallic and semiconductor objects
US6242926B1 (en) * 1999-01-12 2001-06-05 Ipec Precision, Inc. Method and apparatus for moving an article relative to and between a pair of thickness measuring probes to develop a thickness map for the article
DE10001516B4 (de) * 2000-01-15 2014-05-08 Alstom Technology Ltd. Zerstörungsfreies Verfahren zur Bestimmung der Schichtdicke einer metallischen Schutzschicht auf einem metallischen Grundmaterial
JP3705736B2 (ja) * 2000-08-29 2005-10-12 株式会社リガク 熱電気測定装置の試料組立体
DE102004021450B4 (de) * 2004-04-30 2006-08-10 Hochschule Magdeburg-Stendal (Fh) Messverfahren und Anordnung zur Bestimmung metallischer Oberflächenschichten auf metallischen Werkstücken
KR100846783B1 (ko) * 2005-11-30 2008-07-16 삼성전자주식회사 불량기판 검출장치 및 방법
US10060830B2 (en) * 2014-06-09 2018-08-28 United Technologies Corporation In-situ system and method of determining coating integrity of turbomachinery components
CN104034250B (zh) * 2014-06-30 2016-08-24 山东中科普锐检测技术有限公司 涂层测厚仪温度补偿测量方法
US9582621B2 (en) * 2015-06-24 2017-02-28 Globalfoundries Inc. Modeling localized temperature changes on an integrated circuit chip using thermal potential theory
DE102019112238A1 (de) * 2019-05-10 2020-11-12 HELLA GmbH & Co. KGaA Verfahren zur Kontrolle der Beschichtung eines elektronischen Bauteils

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB768448A (en) * 1954-03-08 1957-02-20 British Non Ferrous Metals Res Method and apparatus for the measurement of the thickness of metallic and other conducting coatings on backings of conducting materials
GB858345A (en) * 1956-04-06 1961-01-11 British Non Ferrous Metals Res Method and apparatus for the measurement of the thickness of metallic and other conducting coatings on backings of conducting materials

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA624746A (en) * 1961-08-01 J. Martin Edward Method and apparatus for thickness measurement
US2972882A (en) * 1952-08-12 1961-02-28 Gen Motors Corp Apparatus for measuring coating thicknesses
US3016732A (en) * 1952-10-01 1962-01-16 Gen Motors Corp Measurement of coating thicknesses by thermal means
US2750791A (en) * 1952-11-06 1956-06-19 Gen Motors Corp Thermoelectric instrument for testing materials
SU110354A1 (ru) * 1957-03-11 1957-11-30 Л.М. Суворов Способ определени толщины гальванического покрыти
US4419416A (en) * 1981-08-05 1983-12-06 United Technologies Corporation Overlay coatings for superalloys

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB768448A (en) * 1954-03-08 1957-02-20 British Non Ferrous Metals Res Method and apparatus for the measurement of the thickness of metallic and other conducting coatings on backings of conducting materials
GB858345A (en) * 1956-04-06 1961-01-11 British Non Ferrous Metals Res Method and apparatus for the measurement of the thickness of metallic and other conducting coatings on backings of conducting materials

Also Published As

Publication number Publication date
GB8902289D0 (en) 1989-03-22
US4920319A (en) 1990-04-24
DE3902096A1 (de) 1989-08-17
CH678762A5 (enExample) 1991-10-31
JPH01282401A (ja) 1989-11-14

Similar Documents

Publication Publication Date Title
US4920319A (en) Method and apparatus for determining the thickness of a coating on a metal substrate
US6084174A (en) Method for detecting temperature gradients in biological tissue using a thermocouple array
Doorly et al. The theory of advanced multi-layer thin film heat transfer gauges
Wang et al. Contributed Review: Instruments for measuring Seebeck coefficient of thin film thermoelectric materials: A mini-review
WO2007115257A2 (en) Thermocouples
KR20120116009A (ko) 열적 측정을 제공하도록 구성된 터빈 구성요소
Xie et al. Fabrication and performances of high-temperature transient response ITO/In2O3 thin-film thermocouples
US5711607A (en) Temperature measurement technique with automatic verification of contact between probe and object
Choi et al. Microfabrication and characterization of metal-embedded thin-film thermomechanical microsensors for applications in hostile manufacturing environments
Wang et al. In situ integration of high-temperature thin-film sensor for precise measurement of heat flux and temperature on superalloy substrate
Stuart Thermoelectric differences used for metal sorting
JPS6150028A (ja) 流体用のソリツドステ−ト形温度測定装置および該温度測定装置を利用する装置
WO1992018860A1 (en) Method and apparatus for determining thermal resistance and structural integrity of coatings on conducting materials by monitoring electrical conductance of the underlying material upon localized heating of the overlying coating
GB2395561A (en) Fluid temperature measurement
CA1238116A (en) Stable high temperature cables and devices made therefrom
CN113176013A (zh) 一种用于热流测试的薄膜热电阻热流计和同轴热电偶的标定方法
JPH11211576A (ja) 界面測定薄膜温度センサおよび耐熱部品
US5544953A (en) Rolling-ball thermoelectric potential probe and housing for nondestructive testing of metallic and semiconductor objects
WO2007130862A2 (en) Thermoelectric properties of ceramic thin film thermocouples
Wei et al. An A. C. Potential System for Crack Length Measurement
Soldatov et al. Hands-on Experience of THERMO FITNESS TESTING Device Use for Thermoelectric Evaluation of Metallic Materials
Powell An instrument for the measurement of the thermal conductivity of liquids at high temperatures
Kreider et al. Calibration of thin-film thermocouples on silicon wafers
Mitchell et al. Development and testing of harsh environment, wireless sensor systems for industrial gas turbines
Goswami et al. Design fabrication and satic calibration of thermocouple and thin film gauges

Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)