GB2009423B - Test apparatus - Google Patents

Test apparatus

Info

Publication number
GB2009423B
GB2009423B GB7833353A GB7833353A GB2009423B GB 2009423 B GB2009423 B GB 2009423B GB 7833353 A GB7833353 A GB 7833353A GB 7833353 A GB7833353 A GB 7833353A GB 2009423 B GB2009423 B GB 2009423B
Authority
GB
United Kingdom
Prior art keywords
test apparatus
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB7833353A
Other languages
English (en)
Other versions
GB2009423A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Everett Charles Inc
Original Assignee
Everett Charles Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/851,847 external-priority patent/US4138186A/en
Application filed by Everett Charles Inc filed Critical Everett Charles Inc
Publication of GB2009423A publication Critical patent/GB2009423A/en
Application granted granted Critical
Publication of GB2009423B publication Critical patent/GB2009423B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measuring Leads Or Probes (AREA)
GB7833353A 1977-11-16 1978-08-15 Test apparatus Expired GB2009423B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/851,847 US4138186A (en) 1977-07-22 1977-11-16 Test apparatus

Publications (2)

Publication Number Publication Date
GB2009423A GB2009423A (en) 1979-06-13
GB2009423B true GB2009423B (en) 1982-06-09

Family

ID=25311854

Family Applications (1)

Application Number Title Priority Date Filing Date
GB7833353A Expired GB2009423B (en) 1977-11-16 1978-08-15 Test apparatus

Country Status (4)

Country Link
JP (1) JPS5827869B2 (fr)
DE (1) DE2836018C2 (fr)
FR (1) FR2409664A1 (fr)
GB (1) GB2009423B (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2921007A1 (de) * 1979-05-23 1980-11-27 Siemens Ag Vorrichtung zum pruefen einer elektrischen leiterplatte
JPS58135974A (ja) * 1982-02-09 1983-08-12 Akira Koga 検出針を用いたプリント基板試験装置
JPS6124674U (ja) * 1984-07-19 1986-02-14 株式会社 三社電機製作所 プリント配線基板の検査装置
JPH0416231Y2 (fr) * 1984-12-17 1992-04-10
JPH051939Y2 (fr) * 1986-10-28 1993-01-19
JP6422376B2 (ja) * 2015-03-06 2018-11-14 三菱電機株式会社 半導体装置検査用治具

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1297377A (fr) * 1969-11-27 1972-11-22
JPS5376874U (fr) * 1976-11-29 1978-06-27

Also Published As

Publication number Publication date
GB2009423A (en) 1979-06-13
FR2409664A1 (fr) 1979-06-15
DE2836018C2 (de) 1984-09-20
FR2409664B1 (fr) 1983-03-18
DE2836018A1 (de) 1979-05-17
JPS5473278A (en) 1979-06-12
JPS5827869B2 (ja) 1983-06-11

Similar Documents

Publication Publication Date Title
GB2067284B (en) Indicating apparatus
GB2000739B (en) Palettising-depalettising apparatus
SG59883G (en) Inspection apparatus
ZA783654B (en) Test device
JPS53135357A (en) Inspecting apparatus
JPS5430882A (en) Measuring apparatus
GB1547143A (en) Bushar apparatus
GB2008755B (en) Nondestructive testing apparatus
GB2008352B (en) Digitzing apparatus
JPS53135360A (en) Measuring apparatus
JPS5422570A (en) Test apparatus
GB2006047B (en) Cookong apparatus
JPS53140057A (en) Measuring apparatus
AU3636478A (en) Ignition testing apparatus
GB2008151B (en) Electrophoertic apparatus
GB1547155A (en) Dressing-undressing apparatus
JPS53125056A (en) Measuring apparatus
GB2006715B (en) Gripping-lifting apparatus
GB2007575B (en) Hair-trimming apparatus
GB2009423B (en) Test apparatus
JPS5390981A (en) Tension testing apparatus
JPS549966A (en) Nonncontact measuring apparatus
JPS53108465A (en) Inspection apparatus
GB2003301B (en) Testing apparatus
JPS5381148A (en) Indicating apparatus

Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee