GB1564534A - Ray fluorescence spectrometer - Google Patents
Ray fluorescence spectrometer Download PDFInfo
- Publication number
- GB1564534A GB1564534A GB39475/76A GB3947576A GB1564534A GB 1564534 A GB1564534 A GB 1564534A GB 39475/76 A GB39475/76 A GB 39475/76A GB 3947576 A GB3947576 A GB 3947576A GB 1564534 A GB1564534 A GB 1564534A
- Authority
- GB
- United Kingdom
- Prior art keywords
- radiation
- sample
- distance
- source
- exposed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000005855 radiation Effects 0.000 claims description 27
- 238000004876 x-ray fluorescence Methods 0.000 claims description 14
- 238000005286 illumination Methods 0.000 description 12
- 239000013078 crystal Substances 0.000 description 10
- 230000035945 sensitivity Effects 0.000 description 8
- 238000004458 analytical method Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- PQXKHYXIUOZZFA-UHFFFAOYSA-M lithium fluoride Chemical compound [Li+].[F-] PQXKHYXIUOZZFA-UHFFFAOYSA-M 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- CWYNVVGOOAEACU-UHFFFAOYSA-N Fe2+ Chemical compound [Fe+2] CWYNVVGOOAEACU-UHFFFAOYSA-N 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000009851 ferrous metallurgy Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000009856 non-ferrous metallurgy Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000008188 pellet Substances 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Dispersion Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU752174672A SU614367A1 (ru) | 1975-09-26 | 1975-09-26 | Флуоресцентный рентгеновский спектрометр |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1564534A true GB1564534A (en) | 1980-04-10 |
Family
ID=20632495
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB39475/76A Expired GB1564534A (en) | 1975-09-26 | 1976-09-23 | Ray fluorescence spectrometer |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US4091282A (enExample) |
| DE (1) | DE2642637C2 (enExample) |
| FR (1) | FR2325926A1 (enExample) |
| GB (1) | GB1564534A (enExample) |
| NL (1) | NL172594C (enExample) |
| SU (1) | SU614367A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1995034807A1 (fr) * | 1994-06-14 | 1995-12-21 | Anisovich Kliment Vladislavovi | Spectrometre a rayons x par fluorescence |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4417355A (en) * | 1981-01-08 | 1983-11-22 | Leningradskoe Npo "Burevestnik" | X-Ray fluorescence spectrometer |
| NL8300420A (nl) * | 1983-02-04 | 1984-09-03 | Philips Nv | Roentgen analyse apparaat. |
| US4785470A (en) * | 1983-10-31 | 1988-11-15 | Ovonic Synthetic Materials Company, Inc. | Reflectivity and resolution X-ray dispersive and reflective structures for carbon, beryllium and boron analysis |
| NL8700488A (nl) * | 1987-02-27 | 1988-09-16 | Philips Nv | Roentgen analyse apparaat met saggitaal gebogen analyse kristal. |
| GB2214769A (en) * | 1988-03-04 | 1989-09-06 | Le N Proizv Ob Burevestnik | Multichannel x-ray spectrometer |
| DE29517080U1 (de) * | 1995-10-30 | 1997-03-06 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 80636 München | Vorrichtung für die Röntgenfluoreszenzmikroskopie |
| US7899154B2 (en) * | 2007-03-15 | 2011-03-01 | X-Ray Optical Systems, Inc. | Small spot and high energy resolution XRF system for valence state determination |
| JP7418208B2 (ja) | 2016-09-15 | 2024-01-19 | ユニバーシティ オブ ワシントン | Ｘ線分光計及びその使用方法 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2805341A (en) * | 1954-07-12 | 1957-09-03 | Andrew R Lang | Diffractometer |
| US2805343A (en) * | 1954-07-12 | 1957-09-03 | Andrew R Lang | Diffractometer |
| GB1148646A (en) * | 1967-02-16 | 1969-04-16 | Cambridge Instr Co Ltd | X-ray microanalysers |
-
1975
- 1975-09-26 SU SU752174672A patent/SU614367A1/ru active
-
1976
- 1976-09-17 NL NLAANVRAGE7610384,A patent/NL172594C/xx not_active IP Right Cessation
- 1976-09-17 US US05/724,231 patent/US4091282A/en not_active Expired - Lifetime
- 1976-09-22 DE DE2642637A patent/DE2642637C2/de not_active Expired
- 1976-09-23 FR FR7628628A patent/FR2325926A1/fr active Granted
- 1976-09-23 GB GB39475/76A patent/GB1564534A/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1995034807A1 (fr) * | 1994-06-14 | 1995-12-21 | Anisovich Kliment Vladislavovi | Spectrometre a rayons x par fluorescence |
Also Published As
| Publication number | Publication date |
|---|---|
| NL7610384A (nl) | 1977-03-29 |
| FR2325926B1 (enExample) | 1978-11-03 |
| NL172594B (nl) | 1983-04-18 |
| FR2325926A1 (fr) | 1977-04-22 |
| DE2642637A1 (de) | 1977-04-07 |
| US4091282A (en) | 1978-05-23 |
| DE2642637C2 (de) | 1982-02-11 |
| NL172594C (nl) | 1983-09-16 |
| SU614367A1 (ru) | 1978-07-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PS | Patent sealed [section 19, patents act 1949] | ||
| PCNP | Patent ceased through non-payment of renewal fee |