FR2325926B1 - - Google Patents

Info

Publication number
FR2325926B1
FR2325926B1 FR7628628A FR7628628A FR2325926B1 FR 2325926 B1 FR2325926 B1 FR 2325926B1 FR 7628628 A FR7628628 A FR 7628628A FR 7628628 A FR7628628 A FR 7628628A FR 2325926 B1 FR2325926 B1 FR 2325926B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7628628A
Other languages
French (fr)
Other versions
FR2325926A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LENINGRADSKOE PROIZVODSTVENNOE
Original Assignee
LENINGRADSKOE PROIZVODSTVENNOE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LENINGRADSKOE PROIZVODSTVENNOE filed Critical LENINGRADSKOE PROIZVODSTVENNOE
Publication of FR2325926A1 publication Critical patent/FR2325926A1/fr
Application granted granted Critical
Publication of FR2325926B1 publication Critical patent/FR2325926B1/fr
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR7628628A 1975-09-26 1976-09-23 Spectrometre radioscopique a fluorescence Granted FR2325926A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU752174672A SU614367A1 (ru) 1975-09-26 1975-09-26 Флуоресцентный рентгеновский спектрометр

Publications (2)

Publication Number Publication Date
FR2325926A1 FR2325926A1 (fr) 1977-04-22
FR2325926B1 true FR2325926B1 (enExample) 1978-11-03

Family

ID=20632495

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7628628A Granted FR2325926A1 (fr) 1975-09-26 1976-09-23 Spectrometre radioscopique a fluorescence

Country Status (6)

Country Link
US (1) US4091282A (enExample)
DE (1) DE2642637C2 (enExample)
FR (1) FR2325926A1 (enExample)
GB (1) GB1564534A (enExample)
NL (1) NL172594C (enExample)
SU (1) SU614367A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4417355A (en) * 1981-01-08 1983-11-22 Leningradskoe Npo "Burevestnik" X-Ray fluorescence spectrometer
NL8300420A (nl) * 1983-02-04 1984-09-03 Philips Nv Roentgen analyse apparaat.
US4785470A (en) * 1983-10-31 1988-11-15 Ovonic Synthetic Materials Company, Inc. Reflectivity and resolution X-ray dispersive and reflective structures for carbon, beryllium and boron analysis
NL8700488A (nl) * 1987-02-27 1988-09-16 Philips Nv Roentgen analyse apparaat met saggitaal gebogen analyse kristal.
GB2214769A (en) * 1988-03-04 1989-09-06 Le N Proizv Ob Burevestnik Multichannel x-ray spectrometer
RU94022820A (ru) * 1994-06-14 1996-04-10 К.В. Анисович Рентгеновский флюоресцентный спектрометр
DE29517080U1 (de) * 1995-10-30 1997-03-06 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 80636 München Vorrichtung für die Röntgenfluoreszenzmikroskopie
EP2162732A1 (en) * 2007-03-15 2010-03-17 X-ray Optical Systems, INC. Small spot and high energy resolution xrf system for valence state determination
CN109716115B (zh) 2016-09-15 2023-01-06 华盛顿大学 X射线光谱仪及使用方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2805343A (en) * 1954-07-12 1957-09-03 Andrew R Lang Diffractometer
US2805341A (en) * 1954-07-12 1957-09-03 Andrew R Lang Diffractometer
GB1148646A (en) * 1967-02-16 1969-04-16 Cambridge Instr Co Ltd X-ray microanalysers

Also Published As

Publication number Publication date
GB1564534A (en) 1980-04-10
DE2642637A1 (de) 1977-04-07
NL172594B (nl) 1983-04-18
FR2325926A1 (fr) 1977-04-22
SU614367A1 (ru) 1978-07-05
DE2642637C2 (de) 1982-02-11
NL172594C (nl) 1983-09-16
NL7610384A (nl) 1977-03-29
US4091282A (en) 1978-05-23

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Legal Events

Date Code Title Description
ST Notification of lapse